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    METHOD AND DEVICE FOR HIGH RESOLUTION FULL FIELD INTERFERENCE MICROSCOPY
    1.
    发明申请
    METHOD AND DEVICE FOR HIGH RESOLUTION FULL FIELD INTERFERENCE MICROSCOPY 审中-公开
    用于高分辨率全场干涉显微镜的方法和装置

    公开(公告)号：WO2011144632A1

    公开(公告)日：2011-11-24

    申请号：PCT/EP2011/057997

    申请日：2011-05-17

    Applicant: LLTECH MANAGEMENT ,  BOCCARA, Albert Claude ,  HARMS, Fabrice ,  LE CONTE CHRESTIEN DE POLY, Bertrand

    Inventor： BOCCARA, Albert Claude ,  HARMS, Fabrice ,  LE CONTE CHRESTIEN DE POLY, Bertrand

    IPC: G01B9/02 ,  G01B21/00 ,  G01N21/45

    CPC classification number: G01B9/02 ,  G01B9/02068 ,  G01B9/02082 ,  G01B9/02091 ,  G01B9/04 ,  G02B21/0056 ,  G02B26/06

    Abstract: The invention relates to an incoherent light full field interference microscopy device for the imaging of a volumetric scattering sample (106). The device comprises an interference device (100) between a reference wave (401), produced by reflection of an incident wave by a reflective surface (105) of a reference arm of the interference device, and an object wave (402) produced by backscattering of the incident wave by a slice of the sample, an acquisition device (108) for at least a first interference signal and at least a second interference signal resulting from the interference of the reference and object waves, the at least two interference signals having a phase difference, an processing unit (403) for calculating an image of the slice of the sample, based on said interference signals. The interference device also comprises an optical element (404) for modifying the phase of the wavefront, and the microscopy device comprises a control unit (405) for the optical element, linked to the processing unit (403), the optical phase modification element being controlled by optimizing a statistical parameter of at least a part of the image calculated by the processing unit.

    Abstract translation: 本发明涉及一种用于体积散射样品（106）成像的非相干光全场干涉显微镜装置。 该装置包括通过由干涉装置的参考臂的反射表面（105）反射入射波而产生的参考波（401）和由后向散射产生的物体波（402）之间的干涉装置（100） 通过一个采样片的入射波的采样装置（108），用于至少第一干扰信号的采集装置（108）和由参考和对象波的干扰产生的至少第二干扰信号，所述至少两个干扰信号具有 相位差，用于基于所述干扰信号计算样本片的图像的处理单元（403）。 所述干涉装置还包括用于修改所述波前相位的光学元件（404），并且所述显微镜装置包括与所述处理单元（403）连接的用于所述光学元件的控制单元（405），所述光学相位修改元件 通过优化由处理单元计算的图像的至少一部分的统计参数来控制。

    FULL-FIELD OPTICAL COHERENCE TOMOGRAPHY SYSTEM FOR IMAGING AN OBJECT
    2.
    发明申请
    FULL-FIELD OPTICAL COHERENCE TOMOGRAPHY SYSTEM FOR IMAGING AN OBJECT 审中-公开
    用于成像对象的全景光学相干坐标系统

    公开(公告)号：WO2012035148A1

    公开(公告)日：2012-03-22

    申请号：PCT/EP2011/066132

    申请日：2011-09-16

    Applicant: LLTECH MANAGEMENT ,  BOCCARA, Albert ,  LATRIVE, Anne ,  LE CONTE DE POLY, Bertrand ,  HARMS, Fabrice

    Inventor： BOCCARA, Albert ,  LATRIVE, Anne ,  LE CONTE DE POLY, Bertrand ,  HARMS, Fabrice

    IPC: A61B5/00 ,  G01N21/47

    CPC classification number: G01B9/02091 ,  A61B5/0066 ,  A61B5/0084 ,  G01N21/4795

    Abstract: The present invention relates to a full-field optical coherence tomography system (300) for imaging an object (319), comprising a light source (301), a first interferometric device having means for splitting an input light beam and comprising at least a reflecting surface (307), a second interferometric device having means for splitting the spectrally modulated output beam and comprising at least a reflecting surface, a multichannel acquisition device (321), the system (300) being characterized in that at least one of the interferometric devices includes at least a focusing optical element arranged to focus at least one of the input beams or at least one of the output beams onto the corresponding reflecting surface of the corresponding interferometric device.

    Abstract translation: 本发明涉及一种用于对物体（319）进行成像的全场光学相干断层摄影系统（300），其包括光源（301），第一干涉设备，其具有用于分割输入光束的装置，并且至少包括反射 表面（307），具有用于分离光谱调制的输出光束并且至少包括反射表面的装置的第二干涉测量装置，多通道采集装置（321），所述系统（300）的特征在于，至少一个干涉装置 至少包括聚焦光学元件，其被布置为将输入光束中的至少一个或至少一个输出光束聚焦到相应的干涉测量装置的对应反射表面上。

    PROCEDE ET SYSTEME D'IMAGERIE PAR MICROSCOPIE INTERFERENTIELLE PLEIN CHAMP
    3.
    发明申请
    PROCEDE ET SYSTEME D'IMAGERIE PAR MICROSCOPIE INTERFERENTIELLE PLEIN CHAMP 审中-公开
    用于全场干涉显微成像的方法和系统

    公开(公告)号：WO2016162521A1

    公开(公告)日：2016-10-13

    申请号：PCT/EP2016/057827

    申请日：2016-04-08

    Applicant: LLTECH MANAGEMENT

    Inventor： BOCCARA, Albert Claude ,  HARMS, Fabrice

    IPC: G02B21/00 ,  G01B9/02 ,  G02B21/14 ,  G01N21/47 ,  G02B21/18

    CPC classification number: G02B21/125 ,  G01B9/02091 ,  G01N21/47 ,  G01N21/4795 ,  G01N2021/4709 ,  G02B21/0004 ,  G02B21/082 ,  G02B21/14 ,  G02B21/18 ,  G06T1/0007 ,  G06T5/50 ,  G06T2207/10101

    Abstract: Système d'imagerie (20) par microscopie interférentielle plein champ d'un échantillon volumique diffusant (206) comprenant : - un dispositif d'interférence (200) comprenant un bras de référence sur lequel est agencée une surface de réflexion (205), le dispositif d'interférence étant adapté pour produire, lorsque l'échantillon est disposé sur un bras objet du dispositif d'interférence, en chaque point d'un champ d'imagerie, une interférence entre une onde de référence obtenue par réflexion d'ondes lumineuses incidentes sur une surface élémentaire de la surface de réflexion (205) correspondant audit point du champ d'imagerie et une onde objet obtenue par rétrodiffusion d'ondes lumineuses incidentes par un voxel d'une tranche de l'échantillon à une profondeur donnée, ledit voxel correspondant audit point du champ d'imagerie, - un dispositif d'acquisition (208) adapté pour acquérir, à différence de marche fixe entre le bras objet et le bras de référence, une succession temporelle de N signaux interférométriques bidimensionnels résultant des interférences produites en chaque point du champ d'imagerie, - une unité de traitement (220) configurée pour calculer une image (IB, IC) représentative de variations temporelles d'intensité entre lesdits N signaux interférométriques bidimensionnels.

    Abstract translation: 本发明涉及用于三维扩散样品（206）的全场干涉显微成像的系统（20）。 所述系统包括： - 干涉装置（200），包括其上布置有反射表面（205）的参考臂，所述干涉装置适于在将样品放置在目标臂上时在成像场的每个点处产生 通过将入射光波反射到对应于成像场的所述点的反射表面（205）的基本表面上获得的参考波之间的干扰以及通过入射光波的后向散射获得的目标波 在给定深度处的样本片的体素的装置，所述体素对应于成像场的所述点; - 适于以目标臂和参考臂之间的固定路径长度差获取由在成像场的每个点产生的干扰产生的N个二维干涉测量信号的时间序列的采集装置（208） 以及 - 被配置为计算表示所述N个二维干涉信号之间的强度的时间变化的图像（IB，IC）的处理单元（220）。

    FULL-FIELD OPTICAL COHERENCE TOMOGRAPHY SYSTEM FOR IMAGING AN OBJECT
    4.
    发明公开
    FULL-FIELD OPTICAL COHERENCE TOMOGRAPHY SYSTEM FOR IMAGING AN OBJECT 审中-公开
    光满场相干断层分析系统用于说明点的

    公开(公告)号：EP2615966A1

    公开(公告)日：2013-07-24

    申请号：EP11755363.6

    申请日：2011-09-16

    Applicant: Lltech Management

    Inventor： BOCCARA, Albert ,  LATRIVE, Anne ,  LE CONTE DE POLY, Bertrand ,  HARMS, Fabrice

    IPC: A61B5/00 ,  G01N21/47

    CPC classification number: G01B9/02091 ,  A61B5/0066 ,  A61B5/0084 ,  G01N21/4795

    Abstract: The present invention relates to a full-field optical coherence tomography system (300) for imaging an object (319), comprising a light source (301), a first interferometric device having means for splitting an input light beam and comprising at least a reflecting surface (307), a second interferometric device having means for splitting the spectrally modulated output beam and comprising at least a reflecting surface, a multichannel acquisition device (321), the system (300) being characterized in that at least one of the interferometric devices includes at least a focusing optical element arranged to focus at least one of the input beams or at least one of the output beams onto the corresponding reflecting surface of the corresponding interferometric device.

    PROCEDE ET SYSTEME D'IMAGERIE PAR MICROSCOPIE INTERFERENTIELLE PLEIN CHAMP
    6.
    发明公开
    PROCEDE ET SYSTEME D'IMAGERIE PAR MICROSCOPIE INTERFERENTIELLE PLEIN CHAMP 审中-公开
    全场干涉显微成像的方法和系统

    公开(公告)号：EP3281053A1

    公开(公告)日：2018-02-14

    申请号：EP16719232.7

    申请日：2016-04-08

    Applicant: LLtech Management

    Inventor： BOCCARA, Albert Claude ,  HARMS, Fabrice

    IPC: G02B21/00 ,  G01B9/02 ,  G02B21/14 ,  G01N21/47 ,  G02B21/18

    CPC classification number: G02B21/125 ,  G01B9/02091 ,  G01N21/47 ,  G01N21/4795 ,  G01N2021/4709 ,  G02B21/0004 ,  G02B21/082 ,  G02B21/14 ,  G02B21/18 ,  G06T1/0007 ,  G06T5/50 ,  G06T2207/10101

    Abstract: The invention relates to a system (20) for full-field interference microscopy imaging of a three-dimensional diffusing sample (206). Said system includes: - an interference device (200) including a reference arm on which a reflective surface (205) is arranged, the interference device being suitable for producing, at each point of an imaging field when the sample is placed on a target arm of the interference device, interference between a reference wave, obtained by reflection of incident light waves onto a basic surface of the reflective surface (205) corresponding to said point of the imaging field, and a target wave obtained by backscattering of incident light waves by means of a voxel of a slice of the sample at a given depth, said voxel corresponding to said point of the imaging field; - an acquisition device (208) suitable for acquiring, at a fixed path length difference between the target arm and the reference arm, a temporal series of N two-dimensional interferometric signals resulting from the interference produced at each point of the imaging field; and - a processing unit (220) configured to calculate an image (IB, IC) representing temporal variations in intensity between said N two-dimensional interferometric signals.

    OPTICAL TISSUE SECTIONING USING FULL FIELD OPTICAL COHERENCE TOMOGRAPHY
    8.
    发明公开
    OPTICAL TISSUE SECTIONING USING FULL FIELD OPTICAL COHERENCE TOMOGRAPHY 有权
    OPTISCHE GEWEBESCHNITTE UNTER VERWENDUNG VON OPTISCHER VOLLFELD-KOHÄRENZTOMOGRAFIE

    公开(公告)号：EP2615967A1

    公开(公告)日：2013-07-24

    申请号：EP11767663.5

    申请日：2011-09-19

    Applicant: LLtech Management

    Inventor： BOCCARA, Albert Claude ,  HARMS, Fabrice ,  LE CONTE CHRESTIEN DE POLY, Bertrand

    IPC: A61B5/00

    CPC classification number: H04N7/18 ,  A61B5/0066 ,  A61B5/0068

    Abstract: According to a first aspect, the invention relates to a multimodal optical sectioning microscope (200, 400, 600) for full-field imaging of a volumic and scattering sample comprising: - a full-field OCT system for providing an image of a first section in depth of the sample comprising an illumination sub-system (201, 401, 601) and a full-field imaging interferometer with a detection sub system (208, 408, 608) and an optical conjugation device for optically conjugating the sample and said detection sub system, wherein said optical conjugation device comprises a microscope objective (203, 403, 603), - a supplementary full-field optical sectioning imaging system for providing a fluorescent image of a second section in depth of said sample comprising a structured illumination microscope with an illumination sub system (623), means (421, 422) for generating at the focal plane of said microscope objective of said full-field imaging interferometer a variable spatial pattern illumination and a detection sub system (624), optically conjugated with said focal plane of the microscope objective.

    Abstract translation: 根据第一方面，本发明涉及一种用于体积和散射样品的全场成像的多峰光学分段显微镜（200,400,600），包括： - 全场OCT系统，用于提供第一部分的图像 包括照明子系统（201,401,601）和具有检测子系统（208,408,608）的全场成像干涉仪的样本的深度以及用于将样本和所述检测光学共轭的光共轭装置 子系统，其中所述光共轭装置包括显微镜物镜（203,403,603）， - 用于提供所述样品深度的第二部分的荧光图像的辅助全场光学分割成像系统，所述辅助全场光学分割成像系统包括具有 照明子系统（623），用于在所述全场成像干涉仪的所述显微镜物镜的焦平面处产生可变空间图案照明的装置（421,422），以及 检测子系统（624），与所述显微镜物镜的所述焦平面光学共轭。

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