Abstract:
A flash transition layer designing framework for a flash memory is disclosed. The flash transition layer structure according to an embodiment of the present invention comprises a fist log which processes data; a second log which processes information on mapping; and a third log which processes a second log and information on check points. The first log and the second log can correct errors using the information on check points.
Abstract:
Disclosed is an electromagnetic wave measurement device selectively measuring at least one electromagnetic wave among multiple electromagnetic waves including an electromagnetic wave for wireless communication. The device according to an embodiment includes a wireless communication unit performing wireless communication, an electromagnetic measuring unit measuring at least one electromagnetic wave, and a control unit controlling the electromagnetic measuring unit to measure atl least one electromagnetic wave based on electromagnetic waves for wireless communication. [Reference numerals] (110) Wireless communication unit;(120) Electromagnetic wave measuring unit;(130) Control unit;(131) Wireless communication control unit;(132) Electromagnetic measurement control unit;(133) Wireless communication unit
Abstract:
플래시 메모리 저장 장치에 있어서, 적어도 하나의 플래시 메모리 칩; 상기 적어도 하나의 플래시 메모리 칩을 제어하는 컨트롤러; 상기 적어도 하나의 플래시 메모리 칩과 상기 컨트롤러 사이의 제1 경로를 위한 제1 커넥터; 및 상기 컨트롤러와 상기 플래시 메모리 저장 장치를 테스트하는 테스트 지원 시스템 사이의 제2 경로를 위한 제2 커넥터를 포함하고, 상기 컨트롤러는 상기 제1 경로 또는 상기 제2 경로 중 적어도 하나를 선택적으로 활성화하는 플래시 메모리 저장 장치를 이용하여 플래시 메모리 저장 장치의 신뢰성을 검증하는 기술을 제공한다.
Abstract:
PURPOSE: A flash memory storage device capable of verifying reliability by using a bypass path, a system and a method for verifying the reliability of the flash memory storage device are provided to objectively verify the reliability of a completely developed result. CONSTITUTION: A controller(101) controls a flash memory chip. A first connector(102) is formed for a first path between the flash memory chip and the controller. A second connector(103) is formed for a second path between the controller and a test support system to test a flash memory storage device. The controller selectively activates the first path or the second path. [Reference numerals] (100) Flash memory storage device; (101) Controller; (104) Flash memory chip; (110) Test support system; (130) Host; (140) Host interface;
Abstract:
PURPOSE: A method and a storage system for controlling materialization in a storage medium using mode setting and delimiters are provided to accurately and efficiently implement the materialization by directly transferring materialization order or atomicity control requests to a storage device. CONSTITUTION: A host interface (1310) receives writing commands for writing data from a host system on a storage medium of a storage device; a group starting delimiter for representing the starting of a group inserted between the writing commands; and a group finishing delimiter for representing the finishing of the group. A controller (1330) identifies the group from the writing commands using the group starting and finishing delimiters and determines materialization order or atomicity of the writing commands based on the group. The controller processes the writing commands based on the determined result. A storage device (1350) materializes the writing commands according to the processed result. [Reference numerals] (1310) Host interface; (1330) Controller; (1350) Storage device