公开(公告)号：KR1020080090208A

公开(公告)日：2008-10-08

申请号：KR1020070033442

申请日：2007-04-04

Applicant: 한국과학기술원

Inventor： 오세백 ,  홍영주 ,  박효준 ,  김수현

IPC: G01N21/00 ,  G01N21/21 ,  G01N21/27

Abstract: An apparatus and a method for simultaneously measuring a critical angle and a surface plasmon resonance angle are provided to simultaneously measure a standard refractive index of a sample and a refractive index of a specific component of the sample. An apparatus for simultaneously measuring a critical angle and a surface plasmon resonance angle comprises a light source(20), an optical device(21), a total-reflection induction medium(40), a metal thin layer(41), and a detector(50). The optical device converts light(7) from the light source into a predetermined angle and polarizing condition according to the measurement range. The total-reflection induction medium causes total-reflection of incident light passing through the optical device. The metal thin layer performs SPR(Surface Plasmon Resonance) by being connected with the measurement sample. The detector detects changes in amount of reflection light through an optical device(51) according to the total-reflection and the SPR due to a refractive index of the metal thin layer.

Abstract translation: 提供用于同时测量临界角和表面等离子体共振角的装置和方法，以同时测量样品的标准折射率和样品的特定组分的折射率。 用于同时测量临界角和表面等离子体共振角的装置包括光源（20），光学装置（21），全反射感应介质（40），金属薄层（41）和检测器 （50）。 光学装置根据测量范围将来自光源的光（7）转换成预定角度和极化状态。 全反射感应介质通过光学装置的入射光全反射。 金属薄层通过与测量样品连接来执行SPR（表面等离子体共振）。 检测器根据由金属薄层的折射率引起的全反射和SPR检测通过光学装置（51）的反射光量的变化。