SYSTEMS AND METHODS FOR INTERCONNECTING DIES

    公开(公告)号:US20210217702A1

    公开(公告)日:2021-07-15

    申请号:US17216278

    申请日:2021-03-29

    Applicant: Apple Inc.

    Abstract: Stitched die structures, and methods for interconnecting die are described. In an embodiment, a stitched die structure includes a semiconductor substrate that includes a first die first die area of a first die and a second die area of a second die separate from the first die area. A back-end-of-the-line (BEOL) build-up structure spans over the first die area and the second die area, and includes a first metallic seal directly over a first peripheral area of the first die area, a second metallic seal directly over a second peripheral area of the second die area, and a die-to-die routing extending through the first metallic seal and the second metallic seal to electrically connect the first die to the second die.

    Fully Interconnected Heterogeneous Multi-layer Reconstructed Silicon Device

    公开(公告)号:US20210125967A1

    公开(公告)日:2021-04-29

    申请号:US16869468

    申请日:2020-05-07

    Applicant: Apple Inc.

    Inventor: Jun Zhai

    Abstract: Reconstructed 3DIC structures and methods of manufacture are described. In an embodiment, one or more dies in each package level of a 3DIC are both functional chips and/or stitching devices for two or more dies in an adjacent package level. Thus, each die can function as a communication bridge between two other dies/chiplets in addition to performing a separate chip core function.

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