公开(公告)号：FI902103A0

公开(公告)日：1990-04-26

申请号：FI902103

申请日：1990-04-26

Applicant: BASF AG

Inventor： HICKEL WERNER ,  KNOLL WOLFGANG

IPC: G02B6/12 ,  G02B5/26 ,  G02B5/30 ,  G02F1/19 ,  G02B

Abstract: The invention relates to a method for optical filtering of polarised light, the polarised light to be filtered impinging on a layer system in which surface plasmons or optical waveguide modes are excited.

公开(公告)号：FI901086A0

公开(公告)日：1990-03-02

申请号：FI901086

申请日：1990-03-02

Applicant: BASF AG

Inventor： FUNHOFF DIRK ,  FUCHS HARALD ,  LICHT ULRIKE ,  SCHREPP WOLFGANG ,  HICKEL WERNER ,  KNOLL WOLFGANG ,  DUDA GISELA ,  WEGNER GERHARD

IPC: G11B7/00 ,  G11B7/005 ,  G11B7/24 ,  G11B7/244 ,  G11B7/245 ,  G11B11/00 ,  G11B

Abstract: The invention relates to a method for reproducing information which is recorded in thin polymer films, information in thin polymer films which have been applied to a metal or semiconductor layer, by means of electromagnetic or particle beams which induce a permanent change in the properties of the polymer films in the irradiated areas, being reproduced by surface plasmons. … …

公开(公告)号：FI98660B

公开(公告)日：1997-04-15

申请号：FI901418

申请日：1990-03-21

Applicant: BASF AG

Inventor： HICKEL WERNER ,  KNOLL WOLFGANG

IPC: G01B11/06 ,  G01N21/41

Abstract: The invention relates to a method for determining the refractive index and layer thickness of ultrathin layers. In order to determine the refractive index and/or thickness of layers having layer thicknesses 1 mu m, layers which are applied to a solid substrate are recorded by means of surface/plasmon microscopy as a function of the angle of incidence of the irradiating laser beam. It is possible in this way to determine layer thicknesses with a vertical resolution >/= 0.1 nm in conjunction with simultaneous lateral resolution >/= 5 mu m.

公开(公告)号：AU619085B2

公开(公告)日：1992-01-16

申请号：AU5059390

申请日：1990-03-01

Applicant: BASF AG

Inventor： FUNHOFF DIRK ,  FUCHS HARALD ,  LICHT ULRIKE ,  SCHREPP WOLFGANG ,  HICKEL WERNER ,  KNOLL WOLFGANG ,  WEGNER GERHARD ,  DUDA GISELA

IPC: G11B7/00 ,  G11B7/005 ,  G11B7/24 ,  G11B7/244 ,  G11B7/245 ,  G11B11/00 ,  G11B9/10 ,  G11B9/00

Abstract: The invention relates to a method for reproducing information which is recorded in thin polymer films, information in thin polymer films which have been applied to a metal or semiconductor layer, by means of electromagnetic or particle beams which induce a permanent change in the properties of the polymer films in the irradiated areas, being reproduced by surface plasmons. … …

公开(公告)号：FI901418A0

公开(公告)日：1990-03-21

申请号：FI901418

申请日：1990-03-21

Applicant: BASF AG

Inventor： HICKEL WERNER ,  KNOLL WOLFGANG

IPC: G01B11/06 ,  G01N21/41 ,  G01B

Abstract: The invention relates to a method for determining the refractive index and layer thickness of ultrathin layers. In order to determine the refractive index and/or thickness of layers having layer thicknesses 1 mu m, layers which are applied to a solid substrate are recorded by means of surface/plasmon microscopy as a function of the angle of incidence of the irradiating laser beam. It is possible in this way to determine layer thicknesses with a vertical resolution >/= 0.1 nm in conjunction with simultaneous lateral resolution >/= 5 mu m.