11.
    发明专利
    未知

    公开(公告)号:DE19654244C2

    公开(公告)日:1999-09-02

    申请号:DE19654244

    申请日:1996-12-23

    Inventor: CURBELO RAUL

    Abstract: By considering a transient signal as merely another signal in a linear, shift-invariant system representing a step-scanning Fourier transform spectrometer, the present invention characterizes the transient signal and then compensates for its effect on the measurement by employing various signal processing techniques. Thus, according to one aspect of the present invention, it provides a method for obtaining the spectrum of the desired signal by subtracting the Fourier transform of the transient signal from the Fourier transform of the composite signal output from the detector (i.e., the signal containing both the desired signal and the transient signal). According to another aspect of the present invention, it provides a method for deriving an estimate of the Fourier transform of the transient signal from the Fourier transform of the composite signal.

    STEP SCANNING TECHNIQUE FOR INTERFEROMETER

    公开(公告)号:CA2109510A1

    公开(公告)日:1992-11-23

    申请号:CA2109510

    申请日:1992-05-08

    Abstract: A fast and effective way to step a relative position quantity by a reference interval. Each step in relative position includes open-loop and closed-loop control intervals. An actuator (27) capable of changing the relative position and a closed loop servo (17) that acts on the actuator (27) to keep the relative position centered on the nearest of a series of reference values. The servo (17) has locked the relative position to a particular initial reference value. First, the actuator (27) is caused to change the relative position by an amount approximately equal to the reference interval in a manner that the servo (17) cannot track the change, such as by disabling the servo (17). Servo control is then re-established, at which point the servo (17) operates to keep the relative position centered on the nearest reference value.

    Imaging ATR spectrometer
    17.
    发明专利

    公开(公告)号:GB2329977A

    公开(公告)日:1999-04-07

    申请号:GB9817067

    申请日:1998-08-05

    Abstract: An imaging attenuated total reflection (ATR) spectrometer includes a radiation source 22, an interferometer coupled to the radiation source which produces a spectrally-multiplexed input beam of radiation, an internal reflection element (IRE) 10 engaging a sample-under-test, a focal plane array detector 32, a first optical system 26 adapted and positioned to direct and concentrate the input beam through the rear surface of the IRE towards a contact area of the sample such that an angle of incidence of said input beam at the front surface is equal to or greater than the critical angle for the IRE, and a second optical system 28 adapted and positioned to collect reflected radiation from the contact area and image the same onto the focal plane array detector.

    TRIPLE MODULATION EXPERIMENT FOR A FOURIER TRANSFORM SPECTROMETER

    公开(公告)号:CA2212080A1

    公开(公告)日:1998-03-13

    申请号:CA2212080

    申请日:1997-07-31

    Inventor: CURBELO RAUL

    Abstract: For a step-scanning Fourier transform spectrometer comprising an interferometer, a detector, and a digital signal processor (DSP), a method for measuring a response of a sample to multiple modulations is disclosed. In one embodiment, the method comprises the steps of utilizing the DSP to measure a phase modulation angle and a sample modulation angle; obtain an interferogram that corresponds to a calibrated static sample response by using the measured phase modulation rotation angle; obtain another interferogram which corresponds to the calibrated dynamic sample response by using both the measured phase and sample modulation rotation angles; and computing one or more spectra from the interferograms which indicates the calibrated response of said sample to the multiple modulations.

    Imaging atr spectrometer
    20.
    发明专利

    公开(公告)号:GB2329977B

    公开(公告)日:2001-07-04

    申请号:GB9817067

    申请日:1998-08-05

    Abstract: Method and apparatus for providing an imaging attenuated total reflection (ATR) spectrometer which provides faster measurement speed and better spatial resolution than systems collecting an equivalent amount of data using conventional, non-imaging ATR methods and systems. Apparatus includes a radiation source, an interferometer coupled to the radiation source which produces a spectrally-multiplexed input beam of radiation, an internal reflection element (IRE) engaging a sample-under-test, a focal plane array detector, a first optical system adapted and positioned to direct and concentrate the input beam through the rear surface of the IRE towards a contact area of the sample such that an angle of incidence of said input beam at the front surface is equal to or greater than the critical angle for the IRE, and a second optical system adapted and positioned to collect reflected radiation from the contact area and image the same onto the focal plane array detector.

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