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公开(公告)号:WO03100445A2
公开(公告)日:2003-12-04
申请号:PCT/US0316322
申请日:2003-05-23
Applicant: CASCADE MICROTECH INC , GLEASON K REED
Inventor: LESHER TIM , ANDREWS MIKE , MARTIN JOHN , DUNKLEE JOHN , HAYDEN LEONARD , SAFWAT AMR M E , STRID ERIC
CPC classification number: G01R1/06772 , G01R1/06711 , G01R1/06755 , G01R1/06777
Abstract: A probe measurement system (40-43, 90, 80, 85, 90, 94) for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
Abstract translation: 用于测量高频下集成电路或其他微电子器件的电气特性的探针测量系统(40-43,90,80,85,90,94)。
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公开(公告)号:AU2003286669A1
公开(公告)日:2004-06-18
申请号:AU2003286669
申请日:2003-10-24
Applicant: CASCADE MICROTECH INC
Inventor: DUNKLEE JOHN , COWAN CLARENCE E
IPC: G01R31/28
Abstract: A probe assembly suitable for high-current measurements of an electrical device.
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公开(公告)号:DE10143175A1
公开(公告)日:2002-04-18
申请号:DE10143175
申请日:2001-09-04
Applicant: CASCADE MICROTECH INC
Inventor: DUNKLEE JOHN
Abstract: A chuck for a probe station.
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公开(公告)号:AU2003285022A1
公开(公告)日:2004-07-09
申请号:AU2003285022
申请日:2003-10-27
Applicant: CASCADE MICROTECH INC
Inventor: DUNKLEE JOHN , NORGDEN GREG , COWAN CLARENCE E
Abstract: A probe station with an improved guarding structure.
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公开(公告)号:AU2003233659A1
公开(公告)日:2003-12-12
申请号:AU2003233659
申请日:2003-05-23
Applicant: CASCADE MICROTECH INC
Inventor: STRID ERIC , LESHER TIM , ANDREWS MIKE , MARTIN JOHN , DUNKLEE JOHN , HAYDEN LEONARD , SAFWAT AMR M E
Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
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16.PROBE STATION WITH LOW INDUCTANCE PATH 有权
Title translation: SONDENSTATION MITNIEDERINDUKTIVITÄTSWEG公开(公告)号:EP1567871A4
公开(公告)日:2006-05-17
申请号:EP03777879
申请日:2003-10-24
Applicant: CASCADE MICROTECH INC
Inventor: DUNKLEE JOHN , COWAN CLARENCE E
CPC classification number: G01R31/2851 , G01R31/2886 , G01R31/2887
Abstract: A probe assembly suitable for high-current measurements of an electrical device.
Abstract translation: 适用于电气设备的高电流测量的探头组件。
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公开(公告)号:EP1509776A4
公开(公告)日:2010-08-18
申请号:EP03729099
申请日:2003-05-23
Applicant: CASCADE MICROTECH INC
Inventor: LESHER TIM , ANDREWS MIKE , MARTIN JOHN , DUNKLEE JOHN , HAYDEN LEONARD , SAFWAT AMR M E , STRID ERIC
CPC classification number: G01R1/06772 , G01R1/06711 , G01R1/06755 , G01R1/06777
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公开(公告)号:EP1570279A4
公开(公告)日:2006-11-08
申请号:EP03779339
申请日:2003-10-27
Applicant: CASCADE MICROTECH INC
Inventor: DUNKLEE JOHN , NORGDEN GREG , COWAN CLARENCE E
CPC classification number: G01R31/2862 , G01R1/18 , G01R31/2865 , G01R31/2886
Abstract: A probe station with an improved guarding structure.
Abstract translation: 具有改进的防护结构(130)的探测台(110)。
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