公开(公告)号：WO03100445A2

公开(公告)日：2003-12-04

申请号：PCT/US0316322

申请日：2003-05-23

Applicant: CASCADE MICROTECH INC ,  GLEASON K REED

Inventor： LESHER TIM ,  ANDREWS MIKE ,  MARTIN JOHN ,  DUNKLEE JOHN ,  HAYDEN LEONARD ,  SAFWAT AMR M E ,  STRID ERIC

IPC: G01R1/06 ,  G01R1/067 ,  G01R3/00

CPC classification number: G01R1/06772 ,  G01R1/06711 ,  G01R1/06755 ,  G01R1/06777

Abstract: A probe measurement system (40-43, 90, 80, 85, 90, 94) for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.

Abstract translation: 用于测量高频下集成电路或其他微电子器件的电气特性的探针测量系统（40-43,90,80,85,90,94）。

公开(公告)号：AU2003233659A1

公开(公告)日：2003-12-12

申请号：AU2003233659

申请日：2003-05-23

Applicant: CASCADE MICROTECH INC

Inventor： STRID ERIC ,  LESHER TIM ,  ANDREWS MIKE ,  MARTIN JOHN ,  DUNKLEE JOHN ,  HAYDEN LEONARD ,  SAFWAT AMR M E

IPC: G01R1/06 ,  G01R1/067 ,  G01R3/00

Abstract: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.

公开(公告)号：EP1509776A4

公开(公告)日：2010-08-18

申请号：EP03729099

申请日：2003-05-23

Applicant: CASCADE MICROTECH INC

Inventor： LESHER TIM ,  ANDREWS MIKE ,  MARTIN JOHN ,  DUNKLEE JOHN ,  HAYDEN LEONARD ,  SAFWAT AMR M E ,  STRID ERIC

IPC: G01R1/06 ,  G01R1/067 ,  G01R3/00

CPC classification number: G01R1/06772 ,  G01R1/06711 ,  G01R1/06755 ,  G01R1/06777