Electrical sensing circuitry for particle analyzer - has feedback linking power and sensing electrodes to eliminate electrolyte conductivity effects

    公开(公告)号:DE2710800A1

    公开(公告)日:1977-09-22

    申请号:DE2710800

    申请日:1977-03-11

    Abstract: The particle analyser has a microscopic aperture-defined sensing zone separating two bodies of electrolyte and particles in the electrolyte are caused to pass through the sensing zone. A first pair of sensing electrodes and a second pair of power electrodes are positioned with one electrode of each pair being on opposite sides of the aperture. A feedback circuit measures the contstant DC voltage component between the sensing electrodes and feeds same back to the power electrodes, to cause the analyser to be independent of power electrode polarisation. The connections to the sensing electrodes permit only negligible current to flow in them and thereby minimise their polarisation.

    Flowmeter with restricted orifice - is for particle suspension assessment using photocell sensor in orthogonal directions

    公开(公告)号:DE2445148A1

    公开(公告)日:1976-04-01

    申请号:DE2445148

    申请日:1974-09-20

    Abstract: The flowmeter (16) has the fluid suspension introduced into a cylindrical tube (26), which also contains a number of smaller tubes (32) to produce a substantially laminar flow regime. The suspension itself, typically containing flocullar matter (12), is introduced through a small tube (14) coaxial with the main tube. The flowmeter chamber is formed by four boundaries, two of which are flat and two of which are exponential curves (18) converging towards the centre orifice (20). The latter is optically examined by an apparatus including a light source (22), a focussing unit (33) and a photocell (24), which enables fractional light intensities to be measured in both (Y) and (Z) co-ordinate directions, these being orthogonal to the direction of fluid flow (X).

    14.
    发明专利
    未知

    公开(公告)号:DE2449321A1

    公开(公告)日:1975-04-30

    申请号:DE2449321

    申请日:1974-10-16

    Abstract: A method and apparatus for correcting a particle pulse count subject to coincidence error is disclosed wherein particle pulses, developed in response to passage of particles in a particulate system through a sensing zone, are counted for a predetermined period of time. The predetermined period of time is increased or extended in response to each pulse counted by a time increment that is a function of a characteristic of the counted pulse, such as the pulse width, duration, or amplitude. The total additional time period allows the counting of additional particle pulses such that the total count at the end of the extended time period is an error corrected count for the number of particles detected in the predetermined time period.

    17.
    发明专利
    未知

    公开(公告)号:DE2323372A1

    公开(公告)日:1973-11-29

    申请号:DE2323372

    申请日:1973-05-09

    Abstract: To clamp a train of electric pulses in a system having a small signal-to-noise ratio, the point in the circuit to be clamped is arranged such that the d.c. level appears at the output thereof, is filtered therefrom and fed back to the input of the clamped stage, where it is subtracted out. The feedback path is broken if the output exceeds a predetermined value.

    APERTURE TUBES FOR ELECTRONIC PARTICLE STUDY APPARATUS

    公开(公告)号:GB1211980A

    公开(公告)日:1970-11-11

    申请号:GB2123669

    申请日:1969-04-25

    Abstract: 1,211,980. Particle analyzing apparatus. COULTER ELECTRONICS Ltd. April 25, 1969, No. 21236/69. Heading G1N. To reduce shunt capacitance between the electrolyte in a 'Coulter' aperture tube and the surrounding fluid bath an air-space 38 is provided between them as by making the bottom of the tube double walled except in the aperture area. Alternatively (i) the tube may be surrounded by a skirt Fig. 6 (not shown) or (ii) a small portion of electrolyte at aperture level in the bottom of the tube or a well therein may be connected to suction by a polyethylene tube (26 1 ) Figs. 4, 5 (not shown).

    19.
    发明专利
    未知

    公开(公告)号:DK140735B

    公开(公告)日:1979-11-05

    申请号:DK556170

    申请日:1970-11-02

    Abstract: 1281819 Particle analyzing apparatus COULTER ELECTRONICS Ltd 2 Nov 1970 [6 Nov 1969] 52046/70 Heading G1N In particle counting and sizing apparatus of the Coulter type, the aperture wafer includes at least one conical recess 44, Fig.1, or 64 and 66, Fig.5, communicating as shown with the aperture 42 or 62. If only one recess, the unrecessed surface of the wafer faces upstream. The wafer is fused to glass tube 80, Fig. 8, with its surface slightly proud.

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