DETERMINING SPECTRAL EMISSION CHARACTERISTICS OF INCIDENT RADIATION
    17.
    发明公开
    DETERMINING SPECTRAL EMISSION CHARACTERISTICS OF INCIDENT RADIATION 审中-公开
    确定事故辐射的光谱辐射特性

    公开(公告)号:EP3191811A1

    公开(公告)日:2017-07-19

    申请号:EP15840035.8

    申请日:2015-09-08

    Abstract: The present disclosure describes optical radiation sensors and detection techniques that facilitate assigning a specific wavelength to a measured photocurrent. The techniques can be used to determine the spectral emission characteristics of a radiation source. In one aspect, a method of determining spectral emission characteristics of incident radiation includes sensing at least some of the incident radiation using a light detector having first and second photosensitive regions whose optical responsivity characteristics differ from one another. The method further includes identifying a wavelength of the incident radiation based on a ratio of a photocurrent from the first region and a photocurrent from the second region.

    Abstract translation: 本公开描述了便于将特定波长分配给测量的光电流的光学辐射传感器和检测技术。 这些技术可用于确定辐射源的光谱发射特性。 在一个方面中,确定入射辐射的光谱发射特性的方法包括使用具有光学响应特性彼此不同的第一和第二光敏区域的光检测器来检测至少一些入射辐射。 该方法还包括基于来自第一区域的光电流与来自第二区域的光电流的比率来识别入射辐射的波长。

    COMPACT, POWER-EFFICIENT STACKED BROADBAND OPTICAL EMITTERS
    18.
    发明公开
    COMPACT, POWER-EFFICIENT STACKED BROADBAND OPTICAL EMITTERS 审中-公开
    紧凑,高效堆叠宽带光学发射器

    公开(公告)号:EP3198689A1

    公开(公告)日:2017-08-02

    申请号:EP15845489.2

    申请日:2015-09-23

    Abstract: The present disclosure describes broadband optical emission sources that include a stack of semiconductor layers, wherein each of the semiconductor layers is operable to emit light of a different respective wavelength; a light source operable to provide optical pumping for stimulated photon emission from the stack; wherein the semiconductor layers are disposed sequentially in the stack such that a first one of the semiconductor layers is closest to the light source and a last one of the semiconductor layers is furthest from the light source, and wherein each particular one of the semiconductor layers is at least partially transparent to the light generated by the other semiconductor layers that are closer to the light source than the particular semiconductor layer. The disclosure also describes various spectrometers that include a broadband optical emission device, and optionally include a tuneable wavelength filter operable to allow a selected wavelength or narrow range of wavelengths to pass through.

    Abstract translation: 本公开描述了包括半导体层堆叠的宽带光发射源,其中每个半导体层可操作以发射不同相应波长的光; 光源,其可操作以提供用于从所述堆叠体激发的光子发射的光学泵浦; 其中所述半导体层顺序地布置在所述堆叠中,使得所述半导体层中的第一半导体层最靠近所述光源,并且所述半导体层中的最后一个半导体层距离所述光源最远,并且其中所述半导体层中的每个特定半导体层是 对于由比特定半导体层更靠近光源的其他半导体层产生的光至少部分透明。 本公开还描述了包括宽带光发射装置的各种光谱仪,并且可选地包括可操作以允许所选波长或窄波长范围通过的可调波长滤波器。

    WAFER-LEVEL FABRICATION OF OPTICAL DEVICES WITH FRONT FOCAL LENGTH CORRECTION
    19.
    发明公开
    WAFER-LEVEL FABRICATION OF OPTICAL DEVICES WITH FRONT FOCAL LENGTH CORRECTION 审中-公开
    HERSTELLUNG VON OPTISCHEN BAUELEMENTEN AUF WAFEREBENE MIT FRONTBRENNWEITENKORREKTUR

    公开(公告)号:EP2748854A1

    公开(公告)日:2014-07-02

    申请号:EP12768696.2

    申请日:2012-08-24

    Abstract: The device (50) comprises an optics member (60) and a spacer member (70), said optics member comprising N≧2 sets of passive optical components (65) comprising one or more passive optical components each. The spacer member (70) comprises N light channels (77), each of said N light channels being associated with one of said N sets of passive optical components. All of said N light channels (77) have an at least substantially identical geometrical length (g), and an optical path length of a first of said N light channels is different from an optical path length of at least one second of said N light channels. Methods for manufacturing such devices are described, too. The invention can allow to mass produce high-precision devices (50) at a high yield.

    Abstract translation: 所述装置(50)包括光学构件(60)和间隔构件(70),所述光学构件包括N≥2组无源光学组件(65),每个无源光学组件包括一个或多个无源光学组件。 隔离构件(70)包括N个光通道(77),所述N个光通道中的每一个与所述N组无源光学部件中的一个相关联。 所有所述N个光通道(77)具有至少基本上相同的几何长度(g),并且所述N个光通道中的第一个光通道的光路长度不同于所述N个光的至少一秒的光路长度 通道。 也描述了制造这种装置的方法。 本发明可以以高产量批量生产高精度装置(50)。

    WAFER-LEVEL FABRICATION OF OPTICAL DEVICES. IN PARTICULAR OF MODULES FOR COMPUTATIONAL CAMERAS
    20.
    发明公开
    WAFER-LEVEL FABRICATION OF OPTICAL DEVICES. IN PARTICULAR OF MODULES FOR COMPUTATIONAL CAMERAS 审中-公开
    光学行业制造设备上的WAFER水平,尤其是MODULE FOR计算摄像机

    公开(公告)号:EP2748853A2

    公开(公告)日:2014-07-02

    申请号:EP12768695.4

    申请日:2012-08-24

    Abstract: The device (50) comprises an optics member (60) and a spacer member (70), said optics member comprising N≧2 sets of passive optical components (65) comprising one or more passive optical components each. The spacer member (70) comprises N light channels (77), each of said N light channels being associated with one of said N sets of passive optical components. All of said N light channels (77) have an at least substantially identical geometrical length (g), and an optical path length of a first of said N light channels is different from an optical path length of at least one second of said N light channels. Methods for manufacturing such devices are described, too. The invention can allow to mass produce high-precision devices (50) at a high yield.

    Abstract translation: 所述装置(50)光学部件(60)和间隔件(70)的包括所述光学构件包含N≧2套无源光学元件(65)的每一个,包括一个或多个无源光学部件。 垫片部件(70)包括N个光通道(77),每个所述N个光通道被与所述N组无源光学元件中的一个相关联。 所有所述N个光信道(77)的具有至少基本上相同的几何长度(G),并且在最初提供的所述N个光信道的光路长度是从在所述N个光的至少一个第二的光路长度不同 通道。 制造设备的搜索方法描述了。 本发明可以允许以高收率大规模生产高精度的设备(50)。

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