公开(公告)号：DE102005007580A1

公开(公告)日：2006-08-31

申请号：DE102005007580

申请日：2005-02-18

Applicant: INFINEON TECHNOLOGIES AG

Inventor： OSTENDORF HANS-CHRISTOPH ,  OHLHOFF CARSTEN ,  GOLLMER STEFAN

IPC: G01R31/319 ,  G11C29/56

Abstract: The device has a testing system for inputting test signals to an integrated circuit unit and evaluating response signals that are output by the unit based on input test signals. A tester circuit connects the unit to the system, and a connecting unit (104) arranged in the unit connects the circuit to circuit subunits. One of the subunits has a compression/decompression unit to exchange test and response signals between the subunits. An independent claim is also included for a method of testing an integrated circuit unit.

公开(公告)号：DE10122081A1

公开(公告)日：2002-12-12

申请号：DE10122081

申请日：2001-05-07

Applicant: INFINEON TECHNOLOGIES AG

Inventor： OSTENDORF HANS-CHRISTOPH

IPC: G01R31/319 ,  G11C29/56 ,  G01R35/00 ,  G11C29/00 ,  G01R31/3183

Abstract: A method and an apparatus provides for calibrating a test system for an integrated semiconductor circuit, a pattern generator of the test system generating a test signal in the form of a pattern of successive rising and falling edges, which is composed of superposed sub-patterns formed via different internal paths of the pattern generator. The pattern generator provides an information signal for a measuring device of the test system, which identifies the edges of at least one sub-pattern of the test signal with regard to their origin from one of the internal paths. The calibration is carried out for the internal path separately using the information signal.