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公开(公告)号：JP2003098437A
公开(公告)日：2003-04-03
申请号：JP2002212454
申请日：2002-07-22
Applicant: LEICA MICROSYSTEMS
Inventor： ENGELHARDT JOHANN
Abstract: PROBLEM TO BE SOLVED: To provide a scanning microscope which is capable of adapting the image formation of the illumination rays and rotating point of a ray deflector to the axial position of a pupil for various objective lenses and illumination wavelengths and a method for scanning a target. SOLUTION: As the scanning microscope, a device for axially displacing the images of at least one illumination ray and rotating point within the pupil (28) of the objective lens (30) is provided. As a method for operation, the objective lens (30) is taken into a working position and the objective lens (30) defines the pupil (28), the position of the pupil (28) is determined depending upon the taken-in objective lens (30) and the wavelength of the illumination ray (14), the device for axially displacing the images of at least one illumination ray and rotating point is so operated that the images of at least one illumination ray and rotating point exist within the pupil (2).
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公开(公告)号：JP2003066340A
公开(公告)日：2003-03-05
申请号：JP2002219650
申请日：2002-07-29
Inventor： BIRK HOLGER , ENGELHARDT JOHANN
CPC classification number: G02B21/0024 , G02B21/0032 , G02B21/0068 , G02B21/0076
Abstract: PROBLEM TO BE SOLVED: To provide a scanning microscope which is universally usable, provides the advantages of various known scanning microscopes, does not require a position adjusting cost or reduces the position adjusting cost and can be post installed.
SOLUTION: An exchangeable module (66) which separates an irradiation optical path and a detecting optical path so as to form a specific angle with each other and has at least one acousto-optic member (13) is arranged between the irradiation optical path and the detecting optical path.
COPYRIGHT: (C)2003,JPOAbstract translation: 要解决的问题：为了提供普遍可用的扫描显微镜，提供各种已知的扫描显微镜的优点，不需要位置调整成本或降低位置调整成本并且可以后置安装。 解决方案：将照射光路和检测光路分离以形成彼此具有特定角度并且具有至少一个声光部件（13）的可更换模块（66）布置在照射光路和 检测光路。
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公开(公告)号：JP2003028795A
公开(公告)日：2003-01-29
申请号：JP2002125511
申请日：2002-04-26
Inventor： ENGELHARDT JOHANN , HOFMANN JUERGEN
CPC classification number: G01N21/6458 , G01J3/36 , G01N2021/6441 , G02B21/0048 , G02B21/0064 , G02B21/0076 , G02B2207/114
Abstract: PROBLEM TO BE SOLVED: To provide an examining method and a scanning electron microscope capable of improving a fading (decoloring) characteristic of a fluorescent colored substance in a test sample, especially a test sample excitable in an ultraviolet spectrum area, for carrying out simultaneous multicolor detection. SOLUTION: This examining method for the test sample having at least two optical excitation lines and optically excitable with light at a first wavelength and light at a second wavelength at least is carried out through the following steps: a step of irradiating the test sample 27 with illuminating light 15 having a wavelength of several-fold of the first wavelength and that of several-fold of the second wavelength at least and focusing the illuminating light 15 on partial areas of the test sample 27, a step of sequentially guiding the illuminating light 15 along a plurality of the partial areas for scanning the test sample 27, a step of detecting detection light 29 arriving from the test sample 27, a step of converting the detection light 29 into a detection signal having an amplitude depending on power or intensity of the detection light 29, a step of arranging the detection signal to a plurality of scanned partial areas, and a step of displaying the detection signal on a display.
Abstract translation: 要解决的问题：提供一种能够改善测试样品中的荧光着色物质的褪色（脱色）特性的检查方法和扫描电子显微镜，特别是可在紫外光谱区域激发的测试样品，用于同时进行多色 检测。 解决方案：具有至少两个光学激发线和在第一波长的光可激发的测试样品的测试样品的检查方法至少通过以下步骤进行：将测试样品27照射到 至少将第一波长和第二波长几倍的波长的照明光15聚焦到被测样品27的部分区域上，顺序引导照明光15 沿着用于扫描测试样本27的多个部分区域，检测从测试样本27到达的检测光29的步骤，将检测光29转换成具有取决于功率或强度的幅度的检测信号的步骤 检测光29，将检测信号配置到多个扫描部分区域的步骤，以及在显示器上显示检测信号的步骤。
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公开(公告)号：JP2002148522A
公开(公告)日：2002-05-22
申请号：JP2001253112
申请日：2001-08-23
Applicant: LEICA MICROSYSTEMS
Inventor： STORZ RAFAEL , ENGELHARDT JOHANN , BIRK HOLGER
Abstract: PROBLEM TO BE SOLVED: To provide a method capable of sufficiently suppressing adverse interference by shortening the coherence length of a laser beam. SOLUTION: The phase position of a light field in the method of irradiating an object with the light (2) of a laser beam source (3) is changed by a modulating means (4), by which the occurrence of the interference within an optical path is averted within presettable time intervals or the such interference is allowed to occur only within the non-detectable range.
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公开(公告)号：JP2002131646A
公开(公告)日：2002-05-09
申请号：JP2001223124
申请日：2001-07-24
Applicant: LEICA MICROSYSTEMS
Inventor： ENGELHARDT JOHANN
Abstract: PROBLEM TO BE SOLVED: To propose plural realizable means capable of easily correcting the time lag between a position signal and a detection signal to users. SOLUTION: This method includes steps of: forming the position signal from the position of a beam deflector (7); and forming the detection signal associated with the position signal from light (17) coming from a sample (15). The position signal and the detection signal are transmitted to a processor (23). The correction values are determined in the processor (23). The correction values are transmitted to a computer (34) in order to compensate the time lag between the position signal and the detection signal.
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Patent Agency Ranking16.发明专利
公开(公告)号：JP2002072098A
公开(公告)日：2002-03-12
申请号：JP2001203637
申请日：2001-07-04
Applicant: LEICA MICROSYSTEMS
Inventor： ENGELHARDT JOHANN
Abstract: PROBLEM TO BE SOLVED: To provide a device in which the change in the power and/or wavelength of a laser beam source does not affect the power of the light coupled to an optical assembly and a confocal scanning microscope as the device for coupling the light of at least one wavelength of the laser beam source the optical assembly and the confocal scanning microscope. SOLUTION: This invention relates to the device for optically coupling the light (1) of at least one wavelength of the laser beam source (2) to the optical assembly (3), more specifically the confocal scanning microscope, having an optically active element (4) acting to select the wavelength and to set the power of the coupling light (5). This device is characterized in that the element (4) acts as a regulating element of a control system (11) to affect the coupling light (5) in order to assure that the change in the power and/or wavelength of the laser beam source does not affect the power of the light (5) coupled to an optical assembly.
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公开(公告)号：JP2002048979A
公开(公告)日：2002-02-15
申请号：JP2001183693
申请日：2001-06-18
Applicant: LEICA MICROSYSTEMS
Inventor： STORZ RAFAEL , ENGELHARDT JOHANN
Abstract: PROBLEM TO BE SOLVED: To provide an instrument capable of transmitting ultraviolet rays and rays having other wavelengths to a scanning microscope sufficiently, without loss, or without damage. SOLUTION: An optical inducing element consists of many minute optical structure elements having at least two different optical densities.
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公开(公告)号：JP2002023059A
公开(公告)日：2002-01-23
申请号：JP2001168267
申请日：2001-06-04
Applicant: LEICA MICROSYSTEMS
Inventor： ENGELHARDT JOHANN
Abstract: PROBLEM TO BE SOLVED: To provide a microscope assembly with which a sample can be surely observed in real time while using the means of simple design. SOLUTION: The microscope assembly has a light source (1), in particular, a laser light source for generating a light beam (2) for irradiating a sample (6) which is an examination object, a means (3) for widening the light beam (2) into practically linear irradiation light beam, an objective lens (5) for guiding the irradiation light beam to the sample (6) and a device for relatively moving the irradiation light beam and the sample (6). The above microscope assembly, in particular, a confocal laser scan type microscope is made concrete for surely observing the sample (6) in real time in simple design, and the device of the assembly is constituted in a manner that the irradiation light beam can be rotated inside the pupil of the objective lens by the device or that the sample (6) can be one-dimensionally moved by the device at least.
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19.发明专利
公开(公告)号：JP2001272275A
公开(公告)日：2001-10-05
申请号：JP2001039146
申请日：2001-02-15
Applicant: LEICA MICROSYSTEMS
Inventor： ENGELHARDT JOHANN , HAY WILLIAM C , HOFMANN JUERGEN
Abstract: PROBLEM TO BE SOLVED: To provide an apparatus for selecting and detecting at least one spectral region of a spectral divergent beam preferably in a beam path of a confocal scanning microscope. SOLUTION: The spectral divergent beam can be focused on a focal line, so that a selected part thereof is not detected duplicately. Since an optical effective part of an optical element becomes larger or smaller along its surface, the spectral region reaching a detector can be defined by an orientation of the optical element related to the focal line and the resulting overlap (part) of the focal line and the optical element.
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公开(公告)号：JP2001235684A
公开(公告)日：2001-08-31
申请号：JP2001020141
申请日：2001-01-29
Applicant: LEICA MICROSYSTEMS
Inventor： ENGELHARDT JOHANN , ULRICH HEINRICH
Abstract: PROBLEM TO BE SOLVED: To provide the characteristic of a confocal scanning type microscope design in which a high signal output and a high ratio between a signal and a noise are realized with a simple means. SOLUTION: In a microscope design for a confocal scanning type microscope having a light source 1 to irradiate an object 6 which is an inspection object specially by using exciting light 2 and at least two detection channels 8 and 9 indicating formed detection light, at least two detection channels are optically superposed by superposing devices 11, 12, 13, 15, 17 and 18 with respect to the high signal output and the high ratio between the signal and the noise.
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