Abstract:
PROBLEM TO BE SOLVED: To provide an optical device capable of combining at least the greater part of light emitted from an object to be detected by a detecting optical path combining member without losing the light and guiding the combined light to a propagation direction. SOLUTION: In a detection object illuminating optical device including the illuminating optical path of a light source, the detecting optical path of a detector (5) and a member for combining the detecting optical path and prepared especially for a confocal or double confocal scanning microscope, light emitted from an object (1) to be detected can be combined by a member (detecting optical path combining member) (6) for combining the detecting optical path (4) as to the cross-section of a beam effective for the detector (5), at least the greater part of the combined light is superposed and transmitted in the propagation direction (19) and a member (phase adjusting member) for exerting influence upon the phase of light emitted from the object (1) is arranged at least in the divided optical path (12) of the detecting optical path (4).
Abstract:
PROBLEM TO BE SOLVED: To inspect and operate even a three-dimensional object greater than the depth of focus of a microscopic objective lens of which the spreading along its optical axis is used and to operate the object in all positions of the three- dimensional object. SOLUTION: The apparatus for inspection and operation of the object for the microscope having (a) the microscope (2); (b) at least one first light sources (3 and 4) for regulating an illumination ray path (5) and illuminating the object (1), (c) a detector (6) for regulating a detecting ray path (7) and detecting the return light from the object (1); and (d) a second light source (8) for regulating an operating ray path (9) and operating the object (1) and the method for operating the same are characterized in that the microscope (2) is a confocal scanning type microscope and is disposed with a first ray deflector (12) in the illumination ray path (5) and a second ray deflector (16) in the operating ray path (9), respectively, in which the deflection of the light in the illumination ray path (5) is carried out independently from the deflect of the light in the operating ray path (9).
Abstract:
PROBLEM TO BE SOLVED: To provide an examining method and a scanning electron microscope capable of improving a fading (decoloring) characteristic of a fluorescent colored substance in a test sample, especially a test sample excitable in an ultraviolet spectrum area, for carrying out simultaneous multicolor detection. SOLUTION: This examining method for the test sample having at least two optical excitation lines and optically excitable with light at a first wavelength and light at a second wavelength at least is carried out through the following steps: a step of irradiating the test sample 27 with illuminating light 15 having a wavelength of several-fold of the first wavelength and that of several-fold of the second wavelength at least and focusing the illuminating light 15 on partial areas of the test sample 27, a step of sequentially guiding the illuminating light 15 along a plurality of the partial areas for scanning the test sample 27, a step of detecting detection light 29 arriving from the test sample 27, a step of converting the detection light 29 into a detection signal having an amplitude depending on power or intensity of the detection light 29, a step of arranging the detection signal to a plurality of scanned partial areas, and a step of displaying the detection signal on a display.
Abstract:
PROBLEM TO BE SOLVED: To provide an apparatus for selecting and detecting at least one spectral region of a spectral divergent beam preferably in a beam path of a confocal scanning microscope. SOLUTION: The spectral divergent beam can be focused on a focal line, so that a selected part thereof is not detected duplicately. Since an optical effective part of an optical element becomes larger or smaller along its surface, the spectral region reaching a detector can be defined by an orientation of the optical element related to the focal line and the resulting overlap (part) of the focal line and the optical element.
Abstract:
PROBLEM TO BE SOLVED: To provide a scanning microscope which makes it possible to obtain the (extremely little) resolution necessary for an STED-microscope by regulatable optical means. SOLUTION: The scanning microscope has an illumination optical path, a microscope optical system and at least one light source which forms excitation rays of a first wavelength and emission rays of a second wavelength. The excitation rays are focused in the first focusing region within the first surface in a sample (specimen) and the emission rays are focused within the second focusing region in the second surface; in addition, the excitation rays optically excite the sample in the first focusing region and the emission rays induce the emission derived in the second focusing region and the first and second focusing regions are at least partially superposed on each other. The optical characteristics of the members disposed near the illumination optical path (41) described above are regulated with each other to correct the optical aberration in such a manner that the two focusing regions are position invariably detained with each other without depending upon scanning motion.
Abstract:
PROBLEM TO BE SOLVED: To provide a light source device for illumination in scanning microscopic inspection which is stable, is easily adjustable and can realizes high resolution at a low cost and a scanning microscope. SOLUTION: The light source device for illumination in scanning microscopic inspection and the scanning microscope a) have an electromagnetic energy source (3) which emits a ray (17) of one wavelength, b) are placed with a means (5) for forming two split rays (19 and 21) by spatially splitting the ray (17) behind the electromagnetic energy source (3) and c) are disposed with an intermediate element (9) for changing the wavelength at least at one split ray (21).
Abstract:
PROBLEM TO BE SOLVED: To provide a method for producing a three-dimensional object based on an original three-dimensional object by which the object can be produced (reproduced) with complete fidelity to a prototype in shape based on the original object through scanning the original object with high resolution and high fidelity. SOLUTION: The method for producing the three-dimensional object based on the original three-dimensional object in such a way that the original object is scanned with a light beam from a light source, the light reflected back from the original object is detected and the original object data are produced, is characterized in that the scanning optical system (7, 8 and 9) is confocally operated.
Abstract:
PROBLEM TO BE SOLVED: To inspect and operate a three-dimensional body which is larger than the depth of focus of a microscope objective whose extent along an optical axis is used (allowing body operation on the three-dimensional body at any position in this case).SOLUTION: There is provided the device and operation method for inspection of and operation on a body for microscope which includes: (a) a microscope (2); (b) at least one first light source (3, 4) which defines an illumination light beam path (5) and is for illuminating a body (1); (c) a detector (6) which defines a detection light beam path (7) and is for detecting return light from the body (1); and (d) a second light source (8) which defines an operation light beam path (9) and is for operating the body (1). The device and operation method are characterized in that the microscope (2) is a confocal scanning type microscope, a first light beam deflector (12) is arranged in the illumination light beam path (5) and a second light beam deflector (16) is arranged in the operation light beam path (9) respectively, and light of the illumination light beam path (5) is deflected independently of light of the operation light beam path (9).
Abstract:
PROBLEM TO BE SOLVED: To provide a scanning microscope for optically measuring an observation spot of an observation sample with high spatial resolution which can be realized with ease even by above all addition or exchange of components to the conventional scanning microscopes. SOLUTION: This scanning microscope has a light source for delivering a light beam for excitation compatible for exciting the energy state of the observation sample, at least one detector for detecting the light beam for induction coming from the observation sample and the light beam for induction delivered from the light source for exciting the radiation induced at the observation spot of the observation sample excited by the light beam for excitation and is used to optically observe the observation spot of the observation sample by the high position resolution of the type that the observation sample is irradiated with the light beam for excitation and the light beam for induction in such a manner that the respective intensity distributions of the light beam for excitation and the light beam for induction are at least partly superposed on each other in a focusing region. This scanning microscope is provided with plural optical elements for forming the light beam (9) for induction and the plural optical elements are included in at least one modules (27, 43 and 63) which can be positioned in the optical path of the scanning microscope.
Abstract:
PROBLEM TO BE SOLVED: To constitute an optical device so that the output fluctuation of illuminating light may be easily and almost prevented without causing the difficulty of the optical adjustment of the device. SOLUTION: As for the optical device provided with at least one light source (1) for illuminating an object and at least one glass fiber (3) arranged between the light source (1) and the object, the glass fiber (3) is constituted of a polarizing glass fiber (3) so that the output fluctuation of the illuminating light may be prevented without causing the difficulty of the optical adjustment of the device, as for the optical device provided with the glass fiber which is prepared for carrying the light between the light source (1) and the object along a prescribed section.