OPTICAL DEVICE FOR ILLUMINATING OBJECT TO BE DETECTED

    公开(公告)号:JP2002107634A

    公开(公告)日:2002-04-10

    申请号:JP2001278235

    申请日:2001-09-13

    Abstract: PROBLEM TO BE SOLVED: To provide an optical device capable of combining at least the greater part of light emitted from an object to be detected by a detecting optical path combining member without losing the light and guiding the combined light to a propagation direction. SOLUTION: In a detection object illuminating optical device including the illuminating optical path of a light source, the detecting optical path of a detector (5) and a member for combining the detecting optical path and prepared especially for a confocal or double confocal scanning microscope, light emitted from an object (1) to be detected can be combined by a member (detecting optical path combining member) (6) for combining the detecting optical path (4) as to the cross-section of a beam effective for the detector (5), at least the greater part of the combined light is superposed and transmitted in the propagation direction (19) and a member (phase adjusting member) for exerting influence upon the phase of light emitted from the object (1) is arranged at least in the divided optical path (12) of the detecting optical path (4).

    APPARATUS AND METHOD FOR INSPECTION AND OPERATION OF OBJECT FOR MICROSCOPE

    公开(公告)号:JP2002082287A

    公开(公告)日:2002-03-22

    申请号:JP2001238639

    申请日:2001-08-07

    Abstract: PROBLEM TO BE SOLVED: To inspect and operate even a three-dimensional object greater than the depth of focus of a microscopic objective lens of which the spreading along its optical axis is used and to operate the object in all positions of the three- dimensional object. SOLUTION: The apparatus for inspection and operation of the object for the microscope having (a) the microscope (2); (b) at least one first light sources (3 and 4) for regulating an illumination ray path (5) and illuminating the object (1), (c) a detector (6) for regulating a detecting ray path (7) and detecting the return light from the object (1); and (d) a second light source (8) for regulating an operating ray path (9) and operating the object (1) and the method for operating the same are characterized in that the microscope (2) is a confocal scanning type microscope and is disposed with a first ray deflector (12) in the illumination ray path (5) and a second ray deflector (16) in the operating ray path (9), respectively, in which the deflection of the light in the illumination ray path (5) is carried out independently from the deflect of the light in the operating ray path (9).

    Test sample examining method and scanning electron microscope
    3.
    发明专利
    Test sample examining method and scanning electron microscope 审中-公开
    测试样品检测方法和扫描电子显微镜

    公开(公告)号:JP2003028795A

    公开(公告)日:2003-01-29

    申请号:JP2002125511

    申请日:2002-04-26

    Abstract: PROBLEM TO BE SOLVED: To provide an examining method and a scanning electron microscope capable of improving a fading (decoloring) characteristic of a fluorescent colored substance in a test sample, especially a test sample excitable in an ultraviolet spectrum area, for carrying out simultaneous multicolor detection. SOLUTION: This examining method for the test sample having at least two optical excitation lines and optically excitable with light at a first wavelength and light at a second wavelength at least is carried out through the following steps: a step of irradiating the test sample 27 with illuminating light 15 having a wavelength of several-fold of the first wavelength and that of several-fold of the second wavelength at least and focusing the illuminating light 15 on partial areas of the test sample 27, a step of sequentially guiding the illuminating light 15 along a plurality of the partial areas for scanning the test sample 27, a step of detecting detection light 29 arriving from the test sample 27, a step of converting the detection light 29 into a detection signal having an amplitude depending on power or intensity of the detection light 29, a step of arranging the detection signal to a plurality of scanned partial areas, and a step of displaying the detection signal on a display.

    Abstract translation: 要解决的问题:提供一种能够改善测试样品中的荧光着色物质的褪色(脱色)特性的检查方法和扫描电子显微镜,特别是可在紫外光谱区域激发的测试样品,用于同时进行多色 检测。 解决方案:具有至少两个光学激发线和在第一波长的光可激发的测试样品的测试样品的检查方法至少通过以下步骤进行:将测试样品27照射到 至少将第一波长和第二波长几倍的波长的照明光15聚焦到被测样品27的部分区域上,顺序引导照明光15 沿着用于扫描测试样本27的多个部分区域,检测从测试样本27到达的检测光29的步骤,将检测光29转换成具有取决于功率或强度的幅度的检测信号的步骤 检测光29,将检测信号配置到多个扫描部分区域的步骤,以及在显示器上显示检测信号的步骤。

    SCANNING MICROSCOPE
    5.
    发明专利
    SCANNING MICROSCOPE 审中-公开

    公开(公告)号:JP2002228934A

    公开(公告)日:2002-08-14

    申请号:JP2001386020

    申请日:2001-12-19

    Inventor: HOFMANN JUERGEN

    Abstract: PROBLEM TO BE SOLVED: To provide a scanning microscope which makes it possible to obtain the (extremely little) resolution necessary for an STED-microscope by regulatable optical means. SOLUTION: The scanning microscope has an illumination optical path, a microscope optical system and at least one light source which forms excitation rays of a first wavelength and emission rays of a second wavelength. The excitation rays are focused in the first focusing region within the first surface in a sample (specimen) and the emission rays are focused within the second focusing region in the second surface; in addition, the excitation rays optically excite the sample in the first focusing region and the emission rays induce the emission derived in the second focusing region and the first and second focusing regions are at least partially superposed on each other. The optical characteristics of the members disposed near the illumination optical path (41) described above are regulated with each other to correct the optical aberration in such a manner that the two focusing regions are position invariably detained with each other without depending upon scanning motion.

    LIGHT SOURCE DEVICE FOR ILLUMINATION IN SCANNING MICROSCOPIC INSPECTION AND SCANNING MICROSCOPE

    公开(公告)号:JP2002196252A

    公开(公告)日:2002-07-12

    申请号:JP2001348265

    申请日:2001-11-14

    Abstract: PROBLEM TO BE SOLVED: To provide a light source device for illumination in scanning microscopic inspection which is stable, is easily adjustable and can realizes high resolution at a low cost and a scanning microscope. SOLUTION: The light source device for illumination in scanning microscopic inspection and the scanning microscope a) have an electromagnetic energy source (3) which emits a ray (17) of one wavelength, b) are placed with a means (5) for forming two split rays (19 and 21) by spatially splitting the ray (17) behind the electromagnetic energy source (3) and c) are disposed with an intermediate element (9) for changing the wavelength at least at one split ray (21).

    METHOD FOR PRODUCING THREE-DIMENSIONAL OBJECT

    公开(公告)号:JP2002113786A

    公开(公告)日:2002-04-16

    申请号:JP2001163766

    申请日:2001-05-31

    Abstract: PROBLEM TO BE SOLVED: To provide a method for producing a three-dimensional object based on an original three-dimensional object by which the object can be produced (reproduced) with complete fidelity to a prototype in shape based on the original object through scanning the original object with high resolution and high fidelity. SOLUTION: The method for producing the three-dimensional object based on the original three-dimensional object in such a way that the original object is scanned with a light beam from a light source, the light reflected back from the original object is detected and the original object data are produced, is characterized in that the scanning optical system (7, 8 and 9) is confocally operated.

    Device and method for inspection of and operation on body for microscope
    8.
    发明专利
    Device and method for inspection of and operation on body for microscope 有权
    用于检测和操作微阵列的装置和方法

    公开(公告)号:JP2012141639A

    公开(公告)日:2012-07-26

    申请号:JP2012087054

    申请日:2012-04-06

    Abstract: PROBLEM TO BE SOLVED: To inspect and operate a three-dimensional body which is larger than the depth of focus of a microscope objective whose extent along an optical axis is used (allowing body operation on the three-dimensional body at any position in this case).SOLUTION: There is provided the device and operation method for inspection of and operation on a body for microscope which includes: (a) a microscope (2); (b) at least one first light source (3, 4) which defines an illumination light beam path (5) and is for illuminating a body (1); (c) a detector (6) which defines a detection light beam path (7) and is for detecting return light from the body (1); and (d) a second light source (8) which defines an operation light beam path (9) and is for operating the body (1). The device and operation method are characterized in that the microscope (2) is a confocal scanning type microscope, a first light beam deflector (12) is arranged in the illumination light beam path (5) and a second light beam deflector (16) is arranged in the operation light beam path (9) respectively, and light of the illumination light beam path (5) is deflected independently of light of the operation light beam path (9).

    Abstract translation: 要解决的问题:检查和操作比使用沿着光轴的程度的显微镜物镜的焦深大的三维体(允许身体在任何位置的三维体上的操作 在这种情况下)。 解决方案:提供了用于显微镜主体的检查和操作的装置和操作方法,其包括:(a)显微镜(2); (b)限定照明光束路径(5)并且用于照亮身体(1)的至少一个第一光源(3,4)。 (c)检测器(6),其限定检测光束路径(7)并且用于检测来自所述主体(1)的返回光; 和(d)限定操作光束路径(9)并用于操作主体(1)的第二光源(8)。 该装置和操作方法的特征在于,显微镜(2)是共焦扫描型显微镜,第一光束偏转器(12)布置在照明光束路径(5)中,第二光束偏转器(16) 分别布置在操作光束路径(9)中,并且照明光束路径(5)的光独立于操作光束路径(9)的光被偏转。 版权所有(C)2012,JPO&INPIT

    SCANNING MICROSCOPE AND MODULE FOR SCANNING MICROSCOPE

    公开(公告)号:JP2002287035A

    公开(公告)日:2002-10-03

    申请号:JP2002028417

    申请日:2002-02-05

    Inventor: HOFMANN JUERGEN

    Abstract: PROBLEM TO BE SOLVED: To provide a scanning microscope for optically measuring an observation spot of an observation sample with high spatial resolution which can be realized with ease even by above all addition or exchange of components to the conventional scanning microscopes. SOLUTION: This scanning microscope has a light source for delivering a light beam for excitation compatible for exciting the energy state of the observation sample, at least one detector for detecting the light beam for induction coming from the observation sample and the light beam for induction delivered from the light source for exciting the radiation induced at the observation spot of the observation sample excited by the light beam for excitation and is used to optically observe the observation spot of the observation sample by the high position resolution of the type that the observation sample is irradiated with the light beam for excitation and the light beam for induction in such a manner that the respective intensity distributions of the light beam for excitation and the light beam for induction are at least partly superposed on each other in a focusing region. This scanning microscope is provided with plural optical elements for forming the light beam (9) for induction and the plural optical elements are included in at least one modules (27, 43 and 63) which can be positioned in the optical path of the scanning microscope.

    OPTICAL DEVICE
    10.
    发明专利
    OPTICAL DEVICE 审中-公开

    公开(公告)号:JP2002107636A

    公开(公告)日:2002-04-10

    申请号:JP2001216067

    申请日:2001-07-17

    Abstract: PROBLEM TO BE SOLVED: To constitute an optical device so that the output fluctuation of illuminating light may be easily and almost prevented without causing the difficulty of the optical adjustment of the device. SOLUTION: As for the optical device provided with at least one light source (1) for illuminating an object and at least one glass fiber (3) arranged between the light source (1) and the object, the glass fiber (3) is constituted of a polarizing glass fiber (3) so that the output fluctuation of the illuminating light may be prevented without causing the difficulty of the optical adjustment of the device, as for the optical device provided with the glass fiber which is prepared for carrying the light between the light source (1) and the object along a prescribed section.

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