公开(公告)号：US20150293339A1

公开(公告)日：2015-10-15

申请号：US14437508

申请日：2013-10-22

Applicant: LEICA MICROSYSTEMS CMS GMBH

Inventor： Christian Schuman ,  Ralf Krueger ,  Tobias Bauer ,  Arnold Mueller-Rentz ,  Klaus Hermanns ,  Christian Schulz

IPC: G02B21/06 ,  G01N21/31 ,  F21V33/00

CPC classification number: G02B21/06 ,  F21V33/0068 ,  F21Y2103/00 ,  F21Y2105/00 ,  F21Y2115/15 ,  F21Y2115/20 ,  G01N21/31 ,  G01N2201/061 ,  G01N2201/0628 ,  G02B21/088 ,  G02B21/18

Abstract: An illumination device for an optical device, a microscope or a macroscope includes a first illumination source configured to emit light which is directed via an illumination beam path onto an object to be illuminated that is arranged in an object plane. At least one second illumination source is positionable in the illumination beam path, and is transparent or semitransparent as well as self-luminous. The at least one second illumination source is configured to allow light emitted from the first illumination source to pass through at least in part. The object plane having the object to be illuminated is configured to be illuminated both by the first and by the at least one second illumination source.

Abstract translation: 用于光学装置，显微镜或宏观显微镜的照明装置包括：第一照明源，被配置为发射经由照明光束路径引导到被布置在物体平面中的被照射物体上的光。 至少一个第二照明源可定位在照明光束路径中，并且是透明的或半透明的以及自发光的。 至少一个第二照明源被配置为允许从第一照明源发射的光至少部分地通过。 具有被照明物体的物体被配置为由第一照明源和至少一个第二照明光源照亮。

公开(公告)号：US20140247502A1

公开(公告)日：2014-09-04

申请号：US14191557

申请日：2014-02-27

Applicant: Leica Microsystems CMS GmbH

Inventor： Tobias Bauer ,  Christian Schulz

IPC: G02B21/02

CPC classification number: G02B21/02 ,  G02B21/33

Abstract: A microscope immersion objective having a numerical aperture of NA>1.36 includes a front lens group. The front lens group has a first, object-side optical element having a plane parallel plate and a second optical element having a hyper-hemisphere. The plane parallel plate is wrung together with a planar side of the hyper-hemisphere.

Abstract translation: 具有数值孔径NA> 1.36的显微镜浸没物镜包括前透镜组。 前透镜组具有具有平面平行板的第一物体侧光学元件和具有超半球的第二光学元件。 平面平行板与超半球的平面侧一起拧紧。

公开(公告)号：US20130094016A1

公开(公告)日：2013-04-18

申请号：US13650170

申请日：2012-10-12

Applicant: LEICA MICROSYSTEMS CMS GMBH

Inventor： Werner Knebel ,  Tobias Bauer ,  Peter Euteneuer

IPC: G01M11/02

CPC classification number: G01M11/02 ,  G02B21/241

Abstract: A method and apparatus provide identification of a spherical error of a microscope imaging beam path in a context of microscopic imaging of a sample using a microscope having an objective. A coverslip that carries or covers the sample is arranged in the imaging beam path. A measurement beam is guided through the objective onto the sample in a decentered fashion that is outside an optical axis of the objective. The measurement beam is reflected at an interface of the coverslip with the sample and the reflected measurement beam is guided through the objective onto a detector. An intensity profile of the reflected measurement beam is detected with the detector and a presence of a spherical error from the intensity profile is determined qualitatively and/or quantitatively.

Abstract translation: 在使用具有目标的显微镜的样品的显微镜成像的上下文中，方法和装置提供了显微镜成像光束路径的球面误差的识别。 携带或覆盖样品的盖玻片布置在成像光束路径中。 将测量光束以物镜的光轴外的偏心方式引导到物体上。 测量光束在盖玻片与样品的界面处反射，反射的测量光束通过物镜被引导到检测器上。 用检测器检测反射的测量光束的强度分布，并且定性和/或定量地确定来自强度分布的球面误差的存在。