Abstract:
PROBLEM TO BE SOLVED: To attain improved beam emission efficiency, i.e. beam strength per unit electric power employed, of a semiconductor chip. SOLUTION: A trench defines, on the reverse side of a thin-film layer, only a single partial region which substantially does not have overlap with a front-surface contact structure, wherein on the reverse side, an electrical reverse-side contact is formed exclusively in the partial region and the trench has inner walls, slanted with respect to the principal surface of the thin-film layer serving to deflect an electromagnetic beam. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To make directly formable an electric contact area on an n-conductive AlGaInP based or AlGaInAs based semiconductor layer. SOLUTION: A method includes: adjusting by epitaxial growth semiconductor layers having the n-conductive AlGaInP based or AlGaInAs based outer layers and an active zone that emits electromagnetic radiation; making an electric contact material having Au and at least one doping substance adhered to the outer layer; and tempering the outer layer. The doping substance used in the step of making the electric contact material adhered to the outer layer contains at least one element selected from the group consisting of Ge, Si, Sn, and Te. COPYRIGHT: (C)2004,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a light emitting diode chip having an epitaxial semiconductor layer row equipped with an activity layer which emits electromagnetic radiation, and an electric contact structure which contains a radiation transparent and electric current extension layer comprising ZnO, and an electric connection layer, in which the loss by absorption in an electric connection region is reduced. SOLUTION: The current extension layer has a window where the connection layer is deposited on a covering layer of the semiconductor layer row. The connection layer is connected electrically with the current extension layer. The joint part of the connection layer and the covering layer is not connected electrically or is in bad conductive connection status during operation of the light emitting diode chip. All currents or almost all currents flow in the semiconductor layer row through the current extension layer. COPYRIGHT: (C)2004,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a radiation emission element which can actualize relatively high luminance in a desired spatial direction, in a desired polarization direction or at a desired wavelength. SOLUTION: The radiation emission element according to the present invention is based on a semiconductor material and comprises a layer stack having an active layer sequence for producing a radiation emission element and a filter element placed at a rear side of the active layer sequence as seen from a radiation direction, and is configured in such a manner that the filter element emits a first emission component and reflects a second emission component within the layer stack, the second reflection component, after being reflected at the filter element, is subjected to deflection process or absorption emission process, and the radiation deflected or emitted is supposed to come into the filter element again. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To easily and economically manufacture a semiconductor substrate having a semiconductor layer row provided with active zones suitable for a lateral principal extending direction, a principal surface, and the generation of radiation, and a radiant emission semiconductor chip provided with an electrical connection element disposed on the principal surface that can be pulse-operated in a reduced modulation time. SOLUTION: The principal surface has an injection region 7 and an isolation region 8, the injection region is conductively connected to a connection element, A carrier is injected into a semiconductor substrate through the injection region only while the semiconductor chip is in operation relative to the isolation region and the injection region, and the connection element is overlapped on the injection region or the isolation region, or is disposed adjacent to the injection region in a lateral direction. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a semiconductor chip structure which enables radiation emission to be adjusted and set to a target range during the manufacturing period of the semiconductor chip. SOLUTION: The brightness of a radiation emission semiconductor chip is adjusted and set in the manufacturing period of the semiconductor chip after measuring the radiation emission property of a wafer's radiation emission semiconductor layer row (3), by providing to the wafer's radiation outputting bonded surface (10) one or a plurality of absorbing and/or partially insulating brightness adjusting and setting layers (12, 6, and 9). COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To protect a contact layer including ZnO of a photo-electric element from external influences such as humidity. SOLUTION: The photo-electric element 10 comprises stacked epitaxial semiconductor layers having an active zone 3 that radiates electromagnetic beams and at least one electrical contact region 7. The electrical contact region has at least one beam-transmitting electrical contact that includes ZnO and is conductively connected to an external semiconductor layer. The contact layer is provided by using a watertight material 8 so as to be sufficiently protected from humidity. COPYRIGHT: (C)2004,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a semiconductor light emitting device which is reduced in light absorption and improved in luminous efficiency. SOLUTION: A semiconductor light emitting device is equipped with a thin film laminate (12) which is provided with regions (40) which emit photons into active layers (22) and a front surface (16), and a rear surface (14) and connectors (26) and (32) formed on the front and rear of the thin film laminate (12) respectively so as to feed a current into the active layers (22). The regions (40) emitting photons are arranged as they are spatially separated from the connectors (26) and (32). By this setup, radiation absorbed by the connectors (26) and (32) can be reduced to an irreducible minimum. COPYRIGHT: (C)2003,JPO
Abstract:
PROBLEM TO BE SOLVED: To improve external effects of a semiconductor device by further reducing the absorption of light. SOLUTION: A thin film staple includes a light generation region and a light output coupling region. Photons are generated by recombination of charge carriers in the light generation region. In the light output coupling region, the light is coupled and then outputted from the semiconductor device. In this case, the light generation region and the light output coupling region are at least partially separated from each other on the surface of the thin film staple. COPYRIGHT: (C)2004,JPO
Abstract:
PROBLEM TO BE SOLVED: To provide a light-emitting semiconductor device where the thermal coupling of a semiconductor body to a heat absorption support is improved. SOLUTION: In the light-emitting semiconductor device, the side of the semiconductor body facing the support has a recess, and, in the recess, one portion of a conductive adhesive enters between the semiconductor body and the support. COPYRIGHT: (C)2003,JPO