Abstract:
A protective film (20) of an SiO2 thin film is formed on a front surface of an Si substrate (12), and a part of the protective film (20) is removed to form an etching window (22). A sacrifice layer (23) of polycrystalline Si is formed in the etching window (22). A protective film (24) of SiO2 is formed on the front surface of the Si substrate (12) from the top of the sacrifice layer (23), and a thin film (13) as an element formed of polycrystalline Si is further formed on the protective film (24). A backside etching window (26) is opened in a protective film (21) on the back side of the Si substrate (12). The Si substrate (12) is soaked in TMAH to perform crystal anisotropic etching in the Si substrate (12) through the backside etching window (26) to provide a through-hole (14) in the Si substrate (12).; When the sacrifice layer (23) is exposed to the interior of the through-hole (14), the sacrifice layer (23) is etching-removed to provide a gap (19) between the protective film (24) and the Si substrate (12) and crystal anisotropic etching of the Si substrate (12) is carried out from its front side and backside.
Abstract:
Provided is an acoustic sensor capable of improving an S/N ratio of a sensor without preventing reduction in size of the sensor. A back chamber 45 is vertically opened in a silicon substrate 42. A thin film-like diaphragm 43 to serve as a movable electrode plate is formed on the top surface of the substrate 42 so as to cover the back chamber 45. The back plate 48 is fixed to the top surface of the substrate 42 so as to cover the diaphragm 43, and a fixed electrode plate 49 is provided on the under surface of the back plate 48. Further, the diaphragm 43 is divided into a plurality of areas by the slit 47, and the respective plurally divided diaphragms 43a, 43b and the fixed electrode plate 49 constitute a plurality of parallelly connected capacitors (acoustic sensing sections 60a, 60b).
Abstract:
A vibration electrode plate (34), which performs film vibration upon receiving vibration, is arranged on an upper surface of a silicon substrate (32) including a hollow portion (37). A fixed electrode plate (36) in which a plurality of acoustic perforations (43) passing therethrough in the thickness direction is opened is arranged on an upper side of the vibration electrode plate (34), and the vibration electrode plate (34) and the fixed electrode plate (36) are faced to each other. A vent hole (45) for communicating an air gap (35), which is between the vibration electrode plate (34) and the fixed electrode plate (36), to the hollow portion (37) is arranged between the upper surface of the silicon substrate (32) and the lower surface of the vibration electrode plate (34) at the periphery of the hollow portion (37). An air escape portion (42) in the form of a plurality of through-holes is opened in the vibration electrode plate (34) in the region corresponding to the vent hole (45).
Abstract:
A hollow part (36) such as a through-hole is formed in a silicon substrate (32) so as to pass through the front and the back thereof. A vibration electrode plate (34) is arranged on an upper surface of the silicon substrate (32) to cover the opening on the upper surface side of the hollow part (36). A fixed electrode plate (35) covers the upper side of the vibration electrode plate (34) while maintaining a microscopic gap with the vibration electrode plate (34), where the peripheral part is fixed to the upper surface of the silicon substrate (32). The fixed electrode plate (35) has the portion facing the upper surface of the silicon substrate (32) through a space supported by a side wall portions arranged on an inner edge of the portion fixed to the upper surface of the silicon substrate (32) without interposing a space, and the outer surface of the side wall portion of the fixed electrode plate (35) is covered by a reinforcement film (44) made of metal such as Au, Cr, and Pt.
Abstract:
Provided is an electrostatic capacitive vibrating sensor in which a vibrating electrode plate 34 is formed on the top surface of a silicon substrate 32 having through-holes 37 penetrating from the front surface to the rear surface thereof to cover the through-holes 37, and in which a fixed electrode plate 36 is formed above the vibrating electrode plate 34 and sandwiches an air gap 35 therebetween. Acoustic holes 43b are provided on the outer periphery of the region in the fixed electrode plate 36 opposite to the vibrating electrode plate 34 and have aperture areas smaller than the aperture areas of the acoustic holes 43a provided in the region except for the outer periphery. The acoustic holes 43a, 43b are arranged regularly at constant pitches regardless of the sizes of the aperture areas.