公开(公告)号：DE60030624D1

公开(公告)日：2006-10-26

申请号：DE60030624

申请日：2000-05-26

Applicant: RIKEN WAKO

Inventor： KASE KIWAMU ,  TASHIRO HIDEO

IPC: G01B11/24 ,  G01B21/20 ,  G06F17/50

公开(公告)号：CA2364324A1

公开(公告)日：2002-06-08

申请号：CA2364324

申请日：2001-12-05

Applicant: UNIV WASEDA ,  RIKEN

Inventor： MATSUMOTO KAZUKO ,  TASHIRO HIDEO ,  KONDOH YASUMITSU ,  NOJIMA TAKAHIKO ,  TAKENAKA SHIGEORI

IPC: G01N33/53 ,  C09B57/08 ,  C09B57/10 ,  C12Q1/68 ,  G01N21/75 ,  G01N33/566 ,  G01N33/58 ,  G01N33/533 ,  G01N33/544

Abstract: The present invention provides a novel detecting reagent for double-stranded nucleic acid, and a method of using it to detect double-stranded nucleic acid formed by hybridization with a probe, with absolutely no labeling of the target nucleic acid. The detecting reagent for double-stranded nucleic acid of the invention is characterized by comprising, in the same molecule, a naphthalenediimide group which is intercalatable into double-stranded nucleic acid and a .beta.- diketone group capable of forming a lanthanoid metal complex.

公开(公告)号：EP1431850A4

公开(公告)日：2007-10-31

申请号：EP02760631

申请日：2002-08-14

Applicant: RIKEN

Inventor： OHMORI HITOSHI ,  ANZAI MASAHIRO ,  KASE KIWAMU ,  TASHIRO HIDEO ,  MAKINOUCHI AKITAKE

IPC: G05B19/4069 ,  G05B19/4097

CPC classification number: G05B19/4097 ,  G05B19/4069 ,  G05B2219/36063 ,  Y02P90/265 ,  Y10T409/300896

Abstract: (A) V-CAD data for work (1) is prepared, (B) a machined surface shape after NC-machining is predicted through simulation by using the V-CAD data, (C) the work is NC-machined under a specified NC-program and the machined surface shape after NC-machining is measured on the machine, and (D) machining correction data is determined from the difference between a machined surface shape by simulation and that by on-machine measurement to correct the NC program. Accordingly, ultra-precision machining is possible despite low-rigidity work and tool and their varying deformations.

公开(公告)号：EP1482293A4

公开(公告)日：2006-07-26

申请号：EP03705114

申请日：2003-02-13

Applicant: RIKEN

Inventor： WADA SATOSHI ,  TASHIRO HIDEO ,  MORITA MASATAKA

IPC: G01M11/00 ,  G01N21/63 ,  G02F1/35 ,  G02F1/37 ,  H01S3/00

CPC classification number: G01N21/636 ,  G01M11/00 ,  G02F1/3501 ,  G02F1/37

Abstract: A method of evaluating a non-linear optical crystal used for the non-linear wavelength conversion of laser beams which enables the non-linear optical crystal to be evaluated before the crystal is actually used as a wavelength conversion element in order for the crystal to be constantly used for an extended time with a high conversion efficiency retained and without lowering in output when non-linear optical crystals for various non-linear wavelength conversions such as a CLBO crystal are used to convert laser beams, wherein the non-linear optical crystal is moved to change a laser beam incident position to detect the output of a laser beam emitted from the non-linear optical crystal for each changing position.

公开(公告)号：EP1418479A4

公开(公告)日：2006-07-05

申请号：EP02758845

申请日：2002-08-14

Applicant: RIKEN

Inventor： OHMORI HITOSHI ,  ANZAI MASAHIRO ,  KASE KIWAMU ,  TASHIRO HIDEO ,  MAKINOUCHI AKITAKE

IPC: G05B19/4097 ,  B29C67/00

CPC classification number: G05B19/4097 ,  G05B2219/35097 ,  G05B2219/35098 ,  G05B2219/35145 ,  G05B2219/35167 ,  G05B2219/45204 ,  Y02P90/265

Abstract: External data (12) consisting of the interface data of an object (1) is divided by octtree dividing into rectangular parallelepiped cells (13) having interface planes crossing perpendicularly, and V-CAD data that classify the divided cells into internal cells (13a) located inside the object and interface cells (13b) including interface surfaces is prepared, and die data and die machining data for producing the object (1) are generated from data on reference surfaces at least partially contacting the object (1)and the V-CAD data. Die machining data is used to select a plurality of machining tools (2) in the order of decreasing size according to the sizes of internal cells (13a) in a machining unit to move the machining tools (2) within the planes and the thickness directions of the die to thereby machine the die. Therefore, V-CAD data used can simplify a die-machining NC machining program and significantly reduce a die machining time.

公开(公告)号：EP2267436A4

公开(公告)日：2011-04-20

申请号：EP09725661

申请日：2009-03-25

Applicant: RIKEN

Inventor： ITO YOSHIHIRO ,  TASHIRO HIDEO

IPC: G01N21/76 ,  G01N33/553

CPC classification number: G01N33/553 ,  G01N21/76 ,  Y10T436/143333

公开(公告)号：EP1442869A4

公开(公告)日：2008-12-24

申请号：EP02760630

申请日：2002-08-14

Applicant: RIKEN

Inventor： OHMORI HITOSHI ,  ANZAI MASAHIRO ,  KASE KIWAMU ,  TASHIRO HIDEO ,  MAKINOUCHI AKITAKE

IPC: B29C67/00 ,  G06F17/50

CPC classification number: B29C64/386 ,  B29C64/153 ,  B33Y40/00 ,  B33Y50/00 ,  B33Y50/02 ,  B33Y70/00

Abstract: V-CAD data is prepared by dividing external data 12 consisting of boundary data of an object into rectangular parallelepiped cells 13 having boundary planes orthogonal to each other in accordance with octree division and separating the respective divided cells into internal cells 13a positioned on the inner side of the object and boundary cells 13b including a boundary face, and a modeling unit quantity of a prototyping material 7 is changed in accordance with sizes of the internal cell 13a and the boundary cell 13b of a modeling portion. The prototyping material 7 is a resin, lumber powder, a low-fusing-point metal, metal powder, ceramics powder or a mixture of a binder and one of these materials, and its modeling unit quantity is set in such a manner that the modeling unit quantity is smaller than a capacity of a corresponding cell and does not protrude from the boundary plane of the cell. As a result, by using the V-CAD data, a program for rapid prototyping can be simplified, and a model production time can be greatly reduced.

公开(公告)号：EP1643248A4

公开(公告)日：2008-05-14

申请号：EP04745956

申请日：2004-06-09

Applicant: RIKEN

Inventor： TASHIRO HIDEO ,  KONDOH YASUMITSU ,  KITSUNAI TOKUJI ,  HATAKEYAMA SATORU

IPC: G01N33/53 ,  B01J19/00 ,  B01L3/00 ,  C12M1/00 ,  C12M1/40 ,  C12N15/00 ,  C12N15/09 ,  C12Q1/68 ,  C40B40/06 ,  C40B40/10 ,  G01N21/25 ,  G01N21/64 ,  G01N21/78 ,  G01N33/543 ,  G01N37/00

CPC classification number: G01N21/6452 ,  B01J19/0046 ,  B01J2219/00527 ,  B01J2219/00605 ,  B01J2219/0061 ,  B01J2219/00612 ,  B01J2219/00621 ,  B01J2219/00626 ,  B01J2219/0063 ,  B01J2219/00637 ,  B01J2219/00653 ,  B01J2219/0072 ,  B01J2219/00722 ,  B01J2219/00725 ,  B01L3/5085 ,  C40B40/06 ,  C40B40/10 ,  G01N21/253 ,  G01N21/6428 ,  G01N33/5438 ,  G01N2021/6482

Abstract: A substrate for a biomolecule microarray having one or more spots for biomolecule immobilization. Each spot projects from the surface of the substrate and has a flat surface for a spot at the top, and at least the areas of the substrate around the projecting spots, a projecting spot side surface, and the flat surface are made of a conductive material. Alternatively, each spot projects from the surface of the substrate and has a flat surface for a spot at the top, adjacent projecting spots are jointed with their projecting spot side surfaces, and at least projecting spot side surface and the flat surface are made of a conductive material. A biomolecule interaction acceleration device is also disclosed which has an electrode so disposed as to face the surface of the microarray on which a biomolecule immobilization spot is provided and a power supply for applying an electric field between the microarray and the electrode.