11.
    发明专利
    未知

    公开(公告)号:SE0101111L

    公开(公告)日:2002-09-29

    申请号:SE0101111

    申请日:2001-03-28

    Applicant: SECO TOOLS AB

    Abstract: The present invention relates to a cutting tool insert comprising a substrate and a coating including at least one layer of TiB2. The TiB2-layer has a fibrous microstructure where the grains are 5-50 nm, preferably 10-30 nm, in diameter and a length more than 250 nm, preferably more than 400 nm long, with a length to diameter ratio, 1/d > 2, preferably > 5, and oriented essentially perpendicularly to the surface of the substrate.

    15.
    发明专利
    未知

    公开(公告)号:DE602004003547D1

    公开(公告)日:2007-01-18

    申请号:DE602004003547

    申请日:2004-12-21

    Applicant: SECO TOOLS AB

    Inventor: KARLSSON LENNART

    Abstract: The present invention relates to a method of depositing using reactive magnetron sputtering a nitride based wear resistant layer on a cutting tool for machining by chip removal. According to the method the deposition rate, td, is higher than 2 nm/s a positive bias voltage, Vs between +1 V and +60 V is applied to the substrate, in respect to ground potential the substrate current density, Is/As, is larger than 10 mA/cm the target surface area, At, is larger than 0,7 times the substrate surface area, As, i.e. R= At/As>0,7 and the distance between the target surface and the substrate surface, dt, is

    20.
    发明专利
    未知

    公开(公告)号:DE602004003547T2

    公开(公告)日:2007-09-27

    申请号:DE602004003547

    申请日:2004-12-21

    Applicant: SECO TOOLS AB

    Inventor: KARLSSON LENNART

    Abstract: The present invention relates to a method of depositing using reactive magnetron sputtering a nitride based wear resistant layer on a cutting tool for machining by chip removal. According to the method the deposition rate, td, is higher than 2 nm/s a positive bias voltage, Vs between +1 V and +60 V is applied to the substrate, in respect to ground potential the substrate current density, Is/As, is larger than 10 mA/cm the target surface area, At, is larger than 0,7 times the substrate surface area, As, i.e. R= At/As>0,7 and the distance between the target surface and the substrate surface, dt, is

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