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公开(公告)号:DE69429915D1
公开(公告)日:2002-03-28
申请号:DE69429915
申请日:1994-07-04
Applicant: ST MICROELECTRONICS SRL , CONS RIC MICROELETTRONICA
Inventor: FERLA GIUSEPPE , FRISINA FERRUCCIO
IPC: H01L21/265 , H01L21/336 , H01L29/06 , H01L29/10 , H01L29/739 , H01L29/78
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公开(公告)号:DE69533134D1
公开(公告)日:2004-07-15
申请号:DE69533134
申请日:1995-10-30
Applicant: ST MICROELECTRONICS SRL , CONS RIC MICROELETTRONICA
Inventor: MAGRI ANGELO , FRISINA FERRUCCIO , FERLA GIUSEPPE
IPC: H01L21/336 , H01L29/06 , H01L29/08 , H01L29/10 , H01L29/78 , H01L29/739
Abstract: A MOS technology power device comprises a plurality of elementary functional units which contribute for respective fractions to an overall current of the power device and which are formed in a semiconductor material layer (2) of a first conductivity type. Each elementary functional unit comprises a body region (3) of a second conductivity type formed in the semiconductor material layer (2), the body region (3) having the form of a body stripe (3) elongated in a longitudinal direction on a surface of the semiconductor material layer (2). Each body stripe (3) includes at least one source portion (60) doped with dopants of the first conductivity type which is intercalated with a body portion (40) of the body stripe (3) wherein no dopants of the first conductivity type are provided.
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公开(公告)号:DE69429913D1
公开(公告)日:2002-03-28
申请号:DE69429913
申请日:1994-06-23
Applicant: ST MICROELECTRONICS SRL , CONS RIC MICROELETTRONICA
Inventor: FERLA GIUSEPPE , FRISINA FERRUCCIO
IPC: H01L29/78 , H01L21/336 , H01L29/10 , H01L29/739
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公开(公告)号:DE69428894D1
公开(公告)日:2001-12-06
申请号:DE69428894
申请日:1994-08-02
Applicant: ST MICROELECTRONICS SRL , CONS RIC MICROELETTRONICA
Inventor: FERLA GIUSEPPE , FRISINA FERRUCCIO
IPC: H01L29/78 , H01L29/739
Abstract: A power device integrated structure comprises a semiconductor substrate (5) of a first conductivity type, a semiconductor layer (3,4) of a second conductivity type superimposed over said substrate (5), a plurality of first doped regions (2) of the first conductivity type formed in the semiconductor layer (3,4), and a respective plurality of second doped regions (11) of the second conductivity type formed inside the first doped regions (2); the power device comprises: a power MOSFET (M) having a first electrode region represented by the second doped regions (11) and a second electrode region represented by the semiconductor layer (3,4); a first bipolar junction transistor (T2) having an emitter, a base and a collector respectively represented by the substrate (5), the semiconductor layer (3,4) and the first doped regions (2); and a second bipolar junction transistor (T1) having an emitter, a base and a collector respectively represented by the second doped regions (11), the first doped regions (2) and the semiconductor layer (3,4); the doping profiles of the semiconductor substrate (5), the semiconductor layer (3,4), the first doped regions (2) and the second doped regions (11) are such that the first and second bipolar junction transistors (T2,T1) have respective first and second common base current gains sufficiently high to cause said bipolar junction transistors to be biased in the high injection region, so that carriers are injected from the substrate (5) into the semiconductor layer (3,4) and from the second doped regions (11), through the first doped regions (2), into the semiconductor layer (3,4), the conductivity of the semiconductor layer (3,4) is thus modulated not only by the injection of minority carriers from the substrate (5), but also by majority carriers injected from the doped regions (11) into the first doped regions (2) and collected by the semiconductor layer (3,4). The first and second common base current gains summed are less than unity to prevent a parasitic thyristor from triggering on. The power device functions as an IGBT, having a reduced on-state voltage.
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公开(公告)号:DE69515876D1
公开(公告)日:2000-04-27
申请号:DE69515876
申请日:1995-11-06
Applicant: ST MICROELECTRONICS SRL , CONS RIC MICROELETTRONICA
Inventor: FRISINA FERRUCCIO , FERLA GIUSEPPE , RINAUDO SALVATORE
IPC: H01L21/336 , H01L29/08 , H01L29/78
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公开(公告)号:DE69418037T2
公开(公告)日:1999-08-26
申请号:DE69418037
申请日:1994-08-02
Applicant: ST MICROELECTRONICS SRL , CONS RIC MICROELETTRONICA
Inventor: FERLA GIUSEPPE , FRISINA FERRUCCIO
IPC: H01L21/768 , H01L23/12 , H01L23/482 , H01L21/60 , H01L23/495 , H01L23/522 , H01L29/417 , H01L29/78 , H01L29/72
Abstract: In a MOS-technology power device chip and package assembly, the MOS-technology power device chip (1) comprises a semiconductor material layer (4,5) in which a plurality of elementary functional units (6) is integrated, each elementary functional unit (6) contributing for a respective fraction to an overall current and comprising a first doped region (7) of a first conductivity type formed in said semiconductor layer (4,5), and a second doped region (10) of a second conductivity type formed inside said first doped region (7); the package (2) comprises a plurality of pins (P1-P10) for the external electrical and mechanical connection; said plurality of elementary functional units (6) is composed of sub-pluralities of elementary functional units (6), the second doped regions (10) of all the elementary functional units (6) of each sub-plurality being contacted by a same respective metal plate (100) electrically insulated from the metal plates (100) contacting the second doped regions (10) of all the elementary functional units (6) of the other sub-pluralities; each of said metal plate (100) is connected, through a respective bonding wire (W1-W5), to a respective pin (P1-P5) of the package (2).
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公开(公告)号:DE69534919T2
公开(公告)日:2007-01-25
申请号:DE69534919
申请日:1995-10-30
Applicant: ST MICROELECTRONICS SRL , CONS RIC MICROELETTRONICA
Inventor: FRISINA FERRUCCIO , MAGRI ANGELO , FERLA GIUSEPPE
IPC: H01L29/06 , H01L29/74 , H01L21/331 , H01L29/08 , H01L29/10 , H01L29/739 , H01L29/749 , H01L29/78
Abstract: A MOS technology power device comprises: a semiconductor material layer (2) of a first conductivity type; a conductive insulated gate layer (7,8,9) covering the semiconductor material layer (2); a plurality of elementary functional units, each elementary functional unit comprising a body region (3) of a second conductivity type formed in the semiconductor material layer (2), the body region (3) having the form of an elongated body stripe, each elementary functional unit further comprising an elongated window (12) in the insulated gate layer (7,8,9) extending above the elongated body stripe (3). Each body stripe (3) includes at least one source portion (60;61;62) doped with dopants of the first conductivity type, intercalated with a body portion (40;41;3') of the body stripe (3) wherein no dopant of the first conductivity type are provided. The conductive insulated gate layer (7,8,9) comprises a first insulating material layer (7) placed above the semiconductor material layer (2), a conductive material layer (8) placed above the first insulating material layer (7), and a second insulating material layer (9) placed above the conductive material layer (8). Insulating material sidewall spacers (13) are provided to seal edges of the elongated window (12) in the insulated gate layer (7,8,9).
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公开(公告)号:DE69434268D1
公开(公告)日:2005-03-17
申请号:DE69434268
申请日:1994-07-14
Applicant: ST MICROELECTRONICS SRL , CONS RIC MICROELETTRONICA
Inventor: FERLA GIUSEPPE , FRISINA FERRUCCIO
IPC: H01L29/74 , H01L21/265 , H01L21/336 , H01L29/423 , H01L29/49 , H01L29/739 , H01L29/749 , H01L29/78
Abstract: A high-speed MOS-technology power device integrated structure comprises a plurality of elementary functional units formed in a lightly doped semiconductor layer (1) of a first conductivity type, the elementary functional units comprising channel regions (6) of a second conductivity type covered by a conductive insulated gate layer (8) comprising a polysilicon layer (5); the conductive insulated gate layer (8) also comprises a highly conductive layer (9) superimposed over said polysilicon (5) layer and having a resistivity much lower than the resistivity of the polysilicon layer (5), so that a resistance introduced by the polysilicon layer (5) is shunted with a resistance introduced by said highly conductive layer (9) and the overall resistivity of the conductive insulated gate (8) layer is lowered.
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公开(公告)号:DE69428894T2
公开(公告)日:2002-04-25
申请号:DE69428894
申请日:1994-08-02
Applicant: ST MICROELECTRONICS SRL , CONS RIC MICROELETTRONICA
Inventor: FERLA GIUSEPPE , FRISINA FERRUCCIO
IPC: H01L29/78 , H01L29/739
Abstract: A power device integrated structure comprises a semiconductor substrate (5) of a first conductivity type, a semiconductor layer (3,4) of a second conductivity type superimposed over said substrate (5), a plurality of first doped regions (2) of the first conductivity type formed in the semiconductor layer (3,4), and a respective plurality of second doped regions (11) of the second conductivity type formed inside the first doped regions (2); the power device comprises: a power MOSFET (M) having a first electrode region represented by the second doped regions (11) and a second electrode region represented by the semiconductor layer (3,4); a first bipolar junction transistor (T2) having an emitter, a base and a collector respectively represented by the substrate (5), the semiconductor layer (3,4) and the first doped regions (2); and a second bipolar junction transistor (T1) having an emitter, a base and a collector respectively represented by the second doped regions (11), the first doped regions (2) and the semiconductor layer (3,4); the doping profiles of the semiconductor substrate (5), the semiconductor layer (3,4), the first doped regions (2) and the second doped regions (11) are such that the first and second bipolar junction transistors (T2,T1) have respective first and second common base current gains sufficiently high to cause said bipolar junction transistors to be biased in the high injection region, so that carriers are injected from the substrate (5) into the semiconductor layer (3,4) and from the second doped regions (11), through the first doped regions (2), into the semiconductor layer (3,4), the conductivity of the semiconductor layer (3,4) is thus modulated not only by the injection of minority carriers from the substrate (5), but also by majority carriers injected from the doped regions (11) into the first doped regions (2) and collected by the semiconductor layer (3,4). The first and second common base current gains summed are less than unity to prevent a parasitic thyristor from triggering on. The power device functions as an IGBT, having a reduced on-state voltage.
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公开(公告)号:DE69434268T2
公开(公告)日:2006-01-12
申请号:DE69434268
申请日:1994-07-14
Applicant: ST MICROELECTRONICS SRL , CONS RIC MICROELETTRONICA
Inventor: FERLA GIUSEPPE , FRISINA FERRUCCIO
IPC: H01L29/74 , H01L21/265 , H01L21/336 , H01L29/423 , H01L29/49 , H01L29/739 , H01L29/749 , H01L29/78
Abstract: A high-speed MOS-technology power device integrated structure comprises a plurality of elementary functional units formed in a lightly doped semiconductor layer (1) of a first conductivity type, the elementary functional units comprising channel regions (6) of a second conductivity type covered by a conductive insulated gate layer (8) comprising a polysilicon layer (5); the conductive insulated gate layer (8) also comprises a highly conductive layer (9) superimposed over said polysilicon (5) layer and having a resistivity much lower than the resistivity of the polysilicon layer (5), so that a resistance introduced by the polysilicon layer (5) is shunted with a resistance introduced by said highly conductive layer (9) and the overall resistivity of the conductive insulated gate (8) layer is lowered.
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