Abstract:
The integrated device (100) comprises a PMOS transistor (101) and a voltage selector (1) having an output (6g) connected to the bulk terminal (101d) of the PMOS transistor (101). The voltage selector (1) comprises an input stage (2) supplying (2c) a supply voltage (Vdd) or a programming voltage (Vpp) according to whether the device (100) is in a reading step or in a programming step; a comparator (3) connected to the output (2c) of the input stage (2), receiving a boosted voltage (Vboost), and generating (3g) a first control signal (OC), the state whereof depends upon the comparison of the voltages at the inputs of the comparator (3); a logic circuit (4) connected to the output (3g) of the comparator (3) and generating a second control signal (VDDIS), the state whereof depends upon the state of the first control signal (OC) and of a third-level signal (VTL); and a switching circuit (6) controlled by the first control signal (OC), by the second control signal (VDDIS), and by the third-level signal (VTL) and supplying (6g) each time the highest among the supply voltage (Vdd), the boosted voltage (Vboost), and the programming voltage (Vpp).
Abstract:
The charge pump (1) comprises a phase-generator circuit (6) generating phase signals (A, B) and comprising an oscillator circuit (12.1-12.3) supplying a clock signal (CK), a current-limitation circuit (24.1-24.3) to limit the current flowing in the oscillator circuit, and a control circuit (26') supplying on an output (32a) a control signal (V REF ) supplied to the current-limitation circuit. The control circuit (26') comprises a first current mirror (60) connected to a ground line (22), a second current mirror (62) connected to a supply line (20), a cascode structure (64), arranged between the first and the second current mirrors (60, 62) and connected to the output (32a) of the control circuit (26') to compensate the effects on the control signal (V REF ) caused by sharp relative variations between the potential (V DD ) of the supply line and the potential (V GND ) of the ground line, and a compensation circuit (70) to compensate the effects on the control signal (V REF ) caused by sharp relative variations between the potential (V DD ) of the supply line and the potential (V GND ) of the ground line and by slow variations in temperature.