Counter electrode for electrochromic devices

    公开(公告)号:AU2016294343A1

    公开(公告)日:2018-01-18

    申请号:AU2016294343

    申请日:2016-07-07

    Applicant: VIEW INC

    Abstract: The embodiments herein relate to electrochromic stacks, electrochromic devices, and methods and apparatus for making such stacks and devices. In various embodiments, an anodically coloring layer in an electrochromic stack or device is fabricated to include a heterogeneous structure, for example a heterogeneous composition and/or morphology. Such heterogeneous anodically coloring layers can be used to better tune the properties of a device.

    COUNTER ELECTRODE FOR ELECTROCHROMIC DEVICES

    公开(公告)号:CA2968832A1

    公开(公告)日:2016-06-02

    申请号:CA2968832

    申请日:2015-11-20

    Applicant: VIEW INC

    Abstract: The embodiments herein relate to electrochromic stacks, electrochromic devices, and methods and apparatus for making such stacks and devices. In various embodiments, an anodically coloring layer in an electrochromic stack or device is fabricated to include nickel tungsten tantalum oxide (NiWTaO). This material is particularly beneficial in that it is very transparent in its clear state.

    COUNTER ELECTRODE FOR ELECTROCHROMIC DEVICES
    15.
    发明申请
    COUNTER ELECTRODE FOR ELECTROCHROMIC DEVICES 审中-公开
    电光器件用电极

    公开(公告)号:WO2016036707A3

    公开(公告)日:2016-05-06

    申请号:PCT/US2015047891

    申请日:2015-09-01

    Applicant: VIEW INC

    Abstract: The embodiments herein relate to electrochromic stacks, electrochromic devices, and methods and apparatus for making such stacks and devices. In various embodiments, an anodically coloring layer in an electrochromic stack or device is fabricated to include nickel-tungsten-tin-oxide (NiWSnO). This material is particularly beneficial in that it is very transparent in its clear state.

    Abstract translation: 本文的实施例涉及电致变色堆叠,电致变色装置,以及用于制造这种堆叠和装置的方法和装置。 在各种实施例中,制造电致变色堆叠或器件中的阳极着色层以包括镍 - 钨 - 氧化锡(NiWSnO)。 这种材料是特别有益的,因为它在其明显的状态下是非常透明的。

    DEFECT-MITIGATION LAYERS IN ELECTROCHROMIC DEVICES
    16.
    发明申请
    DEFECT-MITIGATION LAYERS IN ELECTROCHROMIC DEVICES 审中-公开
    电光设备中的缺陷减缓层

    公开(公告)号:WO2014124303A2

    公开(公告)日:2014-08-14

    申请号:PCT/US2014015374

    申请日:2014-02-07

    Applicant: VIEW INC

    Abstract: Electrochromic devices and methods may employ the addition of a defect-mitigating insulating layer which prevents electronically conducting layers and/or electrochromically active layers from contacting layers of the opposite polarity and creating a short circuit in regions where defects form. In some embodiments, an encapsulating layer is provided to encapsulate particles and prevent them from ejecting from the device stack and risking a short circuit when subsequent layers are deposited. The insulating layer may have an electronic resistivity of between about 1 and 108 Ohm-cm. In some embodiments, the insulating layer contains one or more of the following metal oxides: aluminum oxide, zinc oxide, tin oxide, silicon aluminum oxide, cerium oxide, tungsten oxide, nickel tungsten oxide, and oxidized indium tin oxide. Carbides, nitrides, oxynitrides, and oxycarbides may also be used.

    Abstract translation: 电致变色装置和方法可以采用增加缺陷缓解绝缘层,防止电子传导层和/或电致变色层接触相反极性的层,并在缺陷形成的区域中产生短路。 在一些实施例中,提供封装层以封装颗粒并防止它们从器件堆叠中排出,并且在后续层沉积时冒着短路。 绝缘层可具有在约1和108欧姆 - 厘米之间的电阻率。 在一些实施例中,绝缘层包含一种或多种以下金属氧化物:氧化铝,氧化锌,氧化锡,氧化硅铝,氧化铈,氧化钨,氧化镍氧化物和氧化的氧化铟锡氧化物。 也可以使用硬质合金,氮化物,氧氮化物和碳氧化物。

    DEFECT-MITIGATION LAYERS IN ELECTROCHROMIC DEVICES

    公开(公告)号:CA2899607C

    公开(公告)日:2022-07-12

    申请号:CA2899607

    申请日:2014-02-07

    Applicant: VIEW INC

    Abstract: Electrochromic devices and methods may employ the addition of a defect-mitigating insulating layer which prevents electronically conducting layers and/or electrochromically active layers from contacting layers of the opposite polarity and creating a short circuit in regions where defects form. In some embodiments, an encapsulating layer is provided to encapsulate particles and prevent them from ejecting from the device stack and risking a short circuit when subsequent layers are deposited. The insulating layer may have an electronic resistivity of between about 1 and 108 Ohm-cm. In some embodiments, the insulating layer contains one or more of the following metal oxides: aluminum oxide, zinc oxide, tin oxide, silicon aluminum oxide, cerium oxide, tungsten oxide, nickel tungsten oxide, and oxidized indium tin oxide. Carbides, nitrides, oxynitrides, and oxycarbides may also be used.

    Counter electrode for electrochromic devices

    公开(公告)号:AU2016294343B2

    公开(公告)日:2021-06-24

    申请号:AU2016294343

    申请日:2016-07-07

    Applicant: VIEW INC

    Abstract: The embodiments herein relate to electrochromic stacks, electrochromic devices, and methods and apparatus for making such stacks and devices. In various embodiments, an anodically coloring layer in an electrochromic stack or device is fabricated to include a heterogeneous structure, for example a heterogeneous composition and/or morphology. Such heterogeneous anodically coloring layers can be used to better tune the properties of a device.

    Defect-mitigation layers in electrochromic devices

    公开(公告)号:AU2018267645B2

    公开(公告)日:2020-11-05

    申请号:AU2018267645

    申请日:2018-11-22

    Applicant: VIEW INC

    Abstract: DEFECT-MITIGATION LAYERS IN ELECTROCHROMIC DEVICES Abstract Electrochromic devices (401) and methods may employ the addition of a defect mitigating insulating layer (411) which prevents electronically conducting layers and/or electrochromically active layers (106) from contacting layers of the opposite polarity and creating a short circuit in regions where defects form. In some embodiments, an encapsulating layer is provided to encapsulate particles and prevent them from ejecting from the device stack and risking a short circuit when subsequent layers are deposited. The insulating layer (411) may have an electronic resistivity of between about 1 and 108 Ohm-cm. In some embodiments, the insulating layer (411) contains one or more of the following metal oxides: aluminum oxide, zinc oxide, tin oxide, silicon aluminum oxide, cerium oxide, tungsten oxide, nickel tungsten oxide, and oxidized indium tin oxide. Carbides, nitrides, oxynitrides, and oxycarbides may also be used.

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