Abstract:
A double-sided optical inspection system is presented which may detect and classify particles, pits and scratches on thin film disks or wafers in a single scan of the surface. In one embodiment, the invention uses a pair of orthogonally oriented laser beams, one in the radial and one in the circumferential direction on both surfaces of the wafer or thin film disk. The scattered light from radial and circumferential beams is separated via their polarization or by the use of a dichroic mirror together with two different laser wavelengths.
Abstract:
Angle-resolved reflectometers and reflectometry methods are provided, which comprise a coherent light source, an optical system arranged to scan a test pattern using a spot of coherent light from the light source to yield realizations of the light distribution in the collected pupil, wherein the spot covers a part of the test pattern and the scanning is carried out optically or mechanically according to a scanning pattern, and a processing unit arranged to generate a composite image of the collected pupil distribution by combining the pupil images. Metrology systems and methods are provided, which reduce diffraction errors by estimating, quantitatively, a functional dependency of measurement parameters on aperture sizes and deriving, from identified diffraction components of the functional dependency which relate to the aperture sizes, correction terms for the measurement parameters with respect to the measurement conditions.
Abstract:
A portable biochip scanner that enables multi-channel measurement includes a surface plasmon resonance unit (44) formed in a rotational disk-shape and an optical head (50) projecting light to the surface plasmon resonance unit (44) at an angle within a predetermined range and detecting light totally-reflected from the surface plasmon resonance unit (44). The optical head (50) is movable in a radial direction of the surface plasmon resonance unit (44). Preferably, the surface plasmon resonance unit (44) comprises a prism disk (42) formed in a ring-shape, and a micro-fluidic disk (43) coupled to a bottom of the prism disk (42). The micro-fluidic disk (42) being provided at a top surface with a plurality of micro-fluidic channels. Preferably, the optical head includes a micro-scanning mirror (52) projecting light from a light source (51) via a reflecting mirror (53) to the surface plasmon resonance unit (44).
Abstract:
A multi-spot scanning technique using a spot array having a predetermined gap between spots can advantageously provide scalability to a large number of spots as well as the elimination of cross-talk between channels. The multi-spot scanning technique can select a number of spots for the spot array (1D or 2D), determine a separation between the spots to minimize crosstalk, and perform a scan on a wafer using the spot array and a full field of view (FOV). Performing the scan includes performing a plurality of scan line cycles, wherein each scan line cycle can fill in gaps left by previous scan line cycles. This 'delay and fill' scan allows large spacing between spots, thereby eliminating cross-talk at the detector plane. In one embodiment, the scan is begun and ended outside a desired scan area on the wafer to ensure full scan coverage.
Abstract:
Betrifft ein Datenerfassungsverfahren mit einem Laser Scanner-Gerät zum pixelgenauen Abbilden von auf Objektträgern befindlichen, mit Fluoreszenzfarbstoffen behandelten, fluoreszierenden Proben. Ein solches Laser Scanner-Gerät umfasst einen Probentisch; mindestens einen Laser und ein erstes optisches System zum Bereitstellen mindestens eines Laserstrahls zur Anregung der fluoreszierenden Proben; einen Scanner-Kopf (50) mit einem optischen Umlenkelement zum Abrastern dieser Probe in mindestens einer Bewegungsrichtung (75); ein erstes Objektiv; ein zweites optisches System zum Weiterleiten von durch die Laserstrahlen an der Probe ausgelösten und durch das erste Objektiv und das Umlenkelement umgelenkten Emissionsstrahlenbündeln zu mindestens einem Detektor; einen Weggeber (91), der Weggeber-Signale (92) aussendet, die den momentanen Aufenthaltsort des Scanner-Kopfs (50) in Bezug auf einen Nullpunkt anzeigen; ein elektronisches Element zur Filterung der Detektor-Signale (93) mit einer definierten Zeitkonstante; und einen A/D-Wandler zur Digitalisierung der gefilterten Detektor-Signale (93). Das erfindungsgemässe Datenerfassungsverfahren ist dadurch gekennzeichnet, dass die gefilterten Detektor-Signale (93) des A/D-Wandlers und die Weggeber-Signale (92) unabhängig, parallel und kontinuierlich von einer Rechnereinheit bzw. einer Steuerung (40) erfasst und auf eine gemeinsame Zeitbasis (94) bezogen werden, wobei die A/D-Wandlung so häufig erfolgt, dass jedem Pixel (95) eines Bildes stets mehr als ein Datenpunkt des A/D-Wandlers zugeordnet wird.
Abstract:
Angle-resolved reflectometers and reflectometry methods are provided, which comprise a coherent light source, an optical system arranged to scan a test pattern using a spot of coherent light from the light source to yield realizations of the light distribution in the collected pupil, wherein the spot covers a part of the test pattern and the scanning is carried out optically or mechanically according to a scanning pattern, and a processing unit arranged to generate a composite image of the collected pupil distribution by combining the pupil images. Metrology systems and methods are provided, which reduce diffraction errors by estimating, quantitatively, a functional dependency of measurement parameters on aperture sizes and deriving, from identified diffraction components of the functional dependency which relate to the aperture sizes, correction terms for the measurement parameters with respect to the measurement conditions.
Abstract:
An optical inspection system rapidly evaluates a substrate by illumination of an area of a substrate larger than a diffraction-limited spot using a coherent laser beam by breaking temporal or spatial coherence. Picosecond or femtosecond pulses from a modelocked laser source are split into a plurality of spatially separated beamlets that are temporally and/or frequency dispersed, and then focused onto a plurality of spots on the substrate. Adjacent spots, which can overlap by up to about 60-70 percent, are illuminated at different times, or at different frequencies, and do not produce mutually interfering coherence effects. Bright-field and dark-field detection schemes are used in various combinations in different embodiments of the system.
Abstract:
An optical scanner for use in conjunction with an infrared spectrometer is disclosed. The optical scanner translates a beam of radiation to a stationary spot on a traveling sheet of material so that ample integration time within the spectrometer is achieved. The beam path impinges on the traveling web and the radiation is reflected off the traveling web back through the optical scanner and recombined at an interferometer. The beam of radiation is kept stationary with respect to both the traveling sheet and the carriage which houses the spectrometer.