Abstract:
A solid state compact ion gauge includes an electron source, a gate electrode, an electron collector, a gas ionizer, an ion anode, and a detector all formed within a cavity of a semiconductor substrate formed of two halves bonded together and having open sides for receiving a gase sample. A sample of gas having multiple gas constituents flows into the cavity from the side where gas molecules collide with electrons flowing from the source to the collector forming ions. The ions are forced under an electric field to the detector which includes a set of detectors for sensing the constituent ions.
Abstract:
A mass spectrometer gas analyzer includes an ion source for producing ions of a sample gas in a defined ion volume. An ion analyzer collects and analyzes a first portion of the produced ions to determine a partial pressure for a selected gas species within the sample gas. An oppositely disposed ion collector collects a second portion of the ions to determine a total pressure of the contained gas sample. A collecting surface of the ion collector is positioned relative to the incoming ion beam to allow collection of ion current but the surface is configured such that a substantial portion of a plurality of secondary electrons produced by ion bombardment with the ion collector are deflected away from the ionization volume. The partial pressure is thus determined by the ion analyzer without secondary electrons entering the ion analyzer.
Abstract:
A mass spectrometry unit of the present invention includes a mass spectrometry portion that detects ion current values of a gas to be measured according to mass-to-charge ratio, to thereby measure partial pressures of the gas to be measured. The mass spectrometry unit further includes: a control portion for preliminary storing a record of a mass-to-charge ratio of a specific gas that decreases a function of a specific portion of the mass spectrometry unit, in which if an ion current value with the mass-to-charge ratio of the specific gas detected by the mass spectrometry portion is not less than a predetermined value, the control portion outputs a warning signal denoting a functional decrease in the specific portion.
Abstract:
In a quadrupole mass spectrometer which measures partial pressure strength according to a gas type in a vacuum system from ion current intensity, a quadrupole mass spectrometer with a total pressure measurement electrode has a total pressure measurement electrode for examining an ion density disposed in a demarcation space which is comprised of a grid electrode and an ion focusing electrode. And, a vacuum system is provided with only the quadrupole mass spectrometer which measures partial pressure strength according to a gas type in the vacuum system from an ion current intensity and does not have an ionization vacuum gauge other than the quadrupole mass spectrometer.
Abstract:
A method for linearizing the sensitivity of a quadrupole mass spectrometric system to allow the sensor to more accurately report partial pressures of a gas in high pressure areas in which the reported data is effected by a number of loss mechanisms. According to the invention, correction factors can be applied empirically or software in a quadrupole mass analyzer system can be equipped with correcting software to expand the useful range of the mass spectrometer.
Abstract:
This invention relates to a method of operating quadrupole mass spectrometers with only an RF potential applied to the filter rods so that the spectrometer operates to pass all ions above a particular value of m/e. In practice, spectrometers operated in this way usually show a marked loss in transmission efficiency for ions of high m/e when operated with an RF potential low enough to pass ions of m/e
Abstract:
PROBLEM TO BE SOLVED: To provide a quadrupole mass spectrometer capable of performing highly accurate pressure measurement and highly accurate gas analysis simultaneously, and a means dispensing with an ionization vacuum gage by using only the quadrupole mass spectrometer for pressure measurement to be mounted on one vacuum device. SOLUTION: Concerning a quadrupole mass spectrometer Q for measuring a partial pressure intensity classified by the kind of gas in the vacuum device 9 from an ion current intensity, this quadrupole mass spectrometer with a total pressure measuring electrode is provided with the total pressure measuring electrode 1 for surveying an ion density in a demarcated space A formed by a grid electrode 2 and an ion focusing electrode 4. This vacuum device has only the quadrupole mass spectrometer Q mounted thereon for measuring the partial pressure intensity classified by the kind of gas in the vacuum device 9 from the ion current intensity, and does not have the ionization vacuum gage except the quadrupole mass spectrometer. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
A solid state compact ion gauge includes an inlet, a gas ionizer, and a detector all formed within a cavity in a semiconductor substrate. The gas ionizer can be a solid state electron emitter with ion optics provided by electrodes formed in the cavity through which the cavity is evacuated by differential pumping. Preferably, the substrate is formed in two halves. The substrate halves are then bonded together after the components are provided therein.