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公开(公告)号：JPS603609B2
公开(公告)日：1985-01-29
申请号：JP2171676
申请日：1976-02-28
Applicant: NIPPON ELECTRON OPTICS LAB
Inventor： NISHAMA TAICHIRO
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公开(公告)号：JPS6011123A
公开(公告)日：1985-01-21
申请号：JP11990783
申请日：1983-06-30
Applicant: SHIMADZU CORP
Inventor： ICHIMURA KATSUHIKO
Abstract: PURPOSE:To enable exact data sampling by inserting a layer of a medium of which the refractive index varies with wavelength to one side of bisected two optical paths more than into the other optical path and making the two optical path asymmetrical. CONSTITUTION:A medium layer of which the refractive index varies slightly with wavelength is inserted into either of optical paths for two light beams (a), (b) asymetrically from the other. A laser light source N emits a visible light beam which is made incident to an interferometer and is detected by a detector D'. As a movable mirror M2 moves, the quantity of the visible light incident to the detector D' fluctuates periodically and therefore the output from the D' is made by waveform shaping into the sampling pulses to operate a sumple holding circuit SH. The pulses are at the same time counted by an arithmetic control circuit C. The start point for scanning of the mirror M2 is taken at the position of suitable -X and the photometric outputs in the positions x1, x2-xn for the count values 1, 2, 3-n of the sampling pulses are stored in a memory Me. The circuit C reads out the data from the memory Me and calculates power spectra after one time of scanning with the mirror M2.
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公开(公告)号：JPS59164926A
公开(公告)日：1984-09-18
申请号：JP698384
申请日：1984-01-18
Applicant: Nicolet Instrument Corp
Inventor： JIYATSUKU JII KISURINGAA , DEII UOOREN BUIDORIN , DEEBITSUDO AI PURAUTO , DEEBITSUDO ESU KARUHAUN
CPC classification number: G01J3/453
Abstract: Analytical radiation from a source 10 enters a Michelson-type interferometer including a beam splitter 13 and a movable reflecting member 17. Quadrature phase discrimination is employed to provide signals indicative of the position and direction of movement of a portion of member 17 within the analytical radiation path, using a beam from laser 25 directed onto beam splitter 13 and, after reflection by fixed mirror 15 (via retardation plate 27) and movable mirror 17, passed coaxially with beam 11 to detector 28. Multiple quadrature phase discrimination systems may be employed to indicate of the position and direction of movement of three portions of a flat reflecting member. One portion may be within the analytical radiation path. An initial reference indicative of the position of the movable reflecting member independently of the beam splitter and an additional quadrature phase discrimination system may be provided. The reference system may provide redundantly an indication of position and direction of movement of member 17.
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195.发明专利
公开(公告)号：JPS5940221A
公开(公告)日：1984-03-05
申请号：JP10296083
申请日：1983-06-10
Applicant: Ibm
Inventor： ROBAATO JIEEMUZU BERAA , UIRIAMU GUREN GOORUDEN , DEEBITSUDO DOON SABAASUTAIN , ASHIYOTSUKU BUATSUTSU
CPC classification number: G01J3/453
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Patent Agency Ranking
公开(公告)号：JPS53124456A
公开(公告)日：1978-10-30
申请号：JP3916177
申请日：1977-04-06
Applicant: NIPPON ELECTRON OPTICS LAB
Inventor： ENOKIDO EITAROU , ISHIHAMA MASARU
Abstract: PURPOSE:To produce an accurate sampling start signal by performing the detection of interference light in a zero level and forming the sampling start signal through the use of a zero level detection signal and an orginary VA (reference voltage) level signal.
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公开(公告)号：JPS52104981A
公开(公告)日：1977-09-02
申请号：JP2171676
申请日：1976-02-28
Applicant: NIPPON ELECTRON OPTICS LAB
Inventor： NISHIYAMA TAICHIROU
Abstract: PURPOSE:To recognize the density of gas with a simple coherent spectrometer by means of installing reciprocal motion mirror, reference light source and so on on michaelson interference meter thereby measuring the light intensity of principal absorption wavelength of a specified gas.
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公开(公告)号：KR102227571B1
公开(公告)日：2021-03-15
申请号：KR1020197012250A
申请日：2017-09-26
Applicant: 아이엑스에이 에이엠씨 오피스 / 아카데미쉬 메디쉬 센트럼
Inventor： 독토르 바키예 임란 아브시
CPC classification number: G01J3/4531 , G01J3/0218 , G01J3/0259 , G02B2006/12159
Abstract: 고해상도 단일 칩 분광계가 기술된다. 본 발명의 실시예는 푸리에 변환 분광기와 유사하지만; 본 발명의 실시예는 어떠한 가동부도 갖지 않는다. 예시적인 실시예는 복수의 네스티드 마하 젠더 간섭계(MZI)를 갖는 분광계로서, 모든 MZI는 그의 샘플 및 기준 암 각각에 있는 적어도 하나의 표면-도파관 부분을 공유한다. 샘플 및 기준 암의 광 신호는 electro-optically-controlled 방향성 커플러를 통해 그들 길이를 따라 일련의 불연속 위치에서 태핑되고, 이들은 각각의 암에 있는 균일한 길이 도파관 부분에 의해 분리되지만, 균일한 길이가 샘플 및 기준 암에서 상이하여 각각의 MZI의 암에 대해서 상이한 경로 길이 차이를 제공한다. 샘플 및 기준 암으로부터의 탭 광은 암의 시간 지연 차의 함수로서 광파워의 분포를 생성하기 위한 저 손실 빔 컴바이너에 재결합된다.
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公开(公告)号：JP6744005B2
公开(公告)日：2020-08-19
申请号：JP2016040357
申请日：2016-03-02
Applicant: 国立大学法人 香川大学
Inventor： 石丸 伊知郎
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公开(公告)号：JP2016142522A
公开(公告)日：2016-08-08
申请号：JP2015015733
申请日：2015-01-29
Applicant: 国立大学法人 香川大学
Inventor： 石丸 伊知郎
Abstract: 【課題】鮮明なインターフェログラムを取得可能な分光特性測定装置を提供する。 【解決手段】分光特性測定装置は、被測定物の複数の測定点からそれぞれ発せられた測定光を第1の測定光及び第2の測定光に分割する分割光学系、第1及び第2の測定光の干渉光を結像面上に形成する結像光学系、第1及び第2の測定光の間に連続的な光路長差分布を与える光路長差付与手段、複数の画素を有する干渉光検出部、干渉光検出部で検出された干渉光の光強度に基づき測定点のインターフェログラムを求め、このインターフェログラムをフーリエ変換することによりスペクトルを取得する処理部、被測定物と分割光学系の間に配置された該分割光学系と共通の共役面を有する共役面結像光学系、共役面に配置された複数の長方形状の開口部を有する振幅型回折格子を備える。 【選択図】図12
Abstract translation: 要解决的问题：提供一种能够获得清晰干涉图的光谱特征测量装置。解决方案：光谱特性测量装置包括：分割光学系统，用于分割从待测物体的多个测量点分别发射的测量光 进入第一测量光和第二测量光; 用于在图像形成表面上形成第一和第二测量光的干涉光的成像光学系统; 光路长度差分布装置，用于在第一和第二测量光之间给出连续的光学长度差; 具有多个像素的干涉光检测部; 基于由干涉光检测部检测出的干涉光的光强度获得干涉图并通过使该干涉图进行傅立叶变换而得到光谱的处理部; 共轭表面成像光学系统，具有安装在被测量物体与分割光学系统之间的分割光学系统共有的共轭面; 以及具有布置在共轭表面上的多个矩形开口部分的振幅型衍射光栅。选择图：图12
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