公开(公告)号：EP0469083A1

公开(公告)日：1992-02-05

申请号：EP90907995.0

申请日：1990-04-20

Applicant: LEHIGH UNIVERSITY

Inventor： KIM, Yong, W.

IPC: G01J3 ,  G01N21

CPC classification number: G01J3/1809 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0286 ,  G01J3/0291 ,  G01J3/04 ,  G01J3/28 ,  G01J3/2889 ,  G01J2003/1828 ,  G01N21/718 ,  G01N2021/695

Abstract: Procédé et appareil d'analyse spectroscopique transitoire d'un métal en fusion selon lesquels une sonde (10) contenant un laser pulsé de puissance élevée (14) produisant un rayon laser pulsé ayant une forme d'onde d'impulsion sensiblement triangulaire est immergée dans le métal en fusion et irradie une quantité représentative du métal en fusion. Le rayon laser pulsé vaporise une partie du métal en fusion pour produire une colonne de plasma ayant une composition élémentaire représentative de la composition élémentaire du métal en fusion. Avant que la colonne de plasma n'atteigne l'équilibre thermique peu après la fin de l'impulsion laser, un détecteur spectroscopique (241) dans la sonde (10) détecte des inversions de lignes spectrales pendant une première fenêtre de temps court. Ensuite, lorsque le plasma de post-luminance se trouve en équilibre thermique, un second détecteur spectroscopique (242) également dans la sonde (10) effectue une seconde mesure spectroscopique de durée courte. Un télémètre (22) mesure et commande la distance entre la surface du métal en fusion et le laser pulsé (14).

公开(公告)号：EP0445934A3

公开(公告)日：1992-01-08

申请号：EP91301358.7

申请日：1991-02-20

Applicant: IMO INDUSTRIES INC.

Inventor： Krupa, Robert J. ,  Owen, Calvan R.

IPC: G01J3/28

CPC classification number: G01J3/1809 ,  G01J3/2803 ,  G01J2003/1814 ,  G02B17/0621

Abstract: A double-pass two-dimensional spectrometer utilizes a telescope which contains only reflective optical components and is therefore free of chromatic aberrations. The telescope is so used in combination with dispersing optics (17,18) as to allow double-pass use of the combination. The telescope has a state of correction such that, for example, an image which is diffraction-limited at 800nm is produced over a flat field, corresponding to a wide-angle object coverage. This state of correction is accomplished with only two mirrors (10,11), one of which is a conic (e.g., hyperbolic) surface of revolution, while the other is a reflecting generalized polynomial aspheric corrector; and both mirrors are rotationally symmetric surfaces of revolution, each about its own axis of revolution. The double-pass nature of the system allows for a compact optical system consisting of only two reflecting surfaces, plus the dispersing optics, and there are no internal obscurations, thus avoiding negative effects of diffraction off of internal structures. The invention is shown for its applicability to each of several types of spectrometer-design configurations.

公开(公告)号：EP0445934A2

公开(公告)日：1991-09-11

申请号：EP91301358.7

申请日：1991-02-20

Applicant: IMO INDUSTRIES INC.

Inventor： Krupa, Robert J. ,  Owen, Calvan R.

IPC: G01J3/28

CPC classification number: G01J3/1809 ,  G01J3/2803 ,  G01J2003/1814 ,  G02B17/0621

Abstract: A double-pass two-dimensional spectrometer utilizes a telescope which contains only reflective optical components and is therefore free of chromatic aberrations. The telescope is so used in combination with dispersing optics (17,18) as to allow double-pass use of the combination. The telescope has a state of correction such that, for example, an image which is diffraction-limited at 800nm is produced over a flat field, corresponding to a wide-angle object coverage. This state of correction is accomplished with only two mirrors (10,11), one of which is a conic (e.g., hyperbolic) surface of revolution, while the other is a reflecting generalized polynomial aspheric corrector; and both mirrors are rotationally symmetric surfaces of revolution, each about its own axis of revolution. The double-pass nature of the system allows for a compact optical system consisting of only two reflecting surfaces, plus the dispersing optics, and there are no internal obscurations, thus avoiding negative effects of diffraction off of internal structures. The invention is shown for its applicability to each of several types of spectrometer-design configurations.

Abstract translation: 双通二维光谱仪使用仅包含反射光学部件的望远镜，因此没有色差。 望远镜与分散光学元件（17,18）结合使用，以允许组合的双程使用。 望远镜具有校正状态，例如，对应于广角对象覆盖的平坦场产生800nm衍射限制的图像。 这种校正状态仅用两个反射镜（10,11）完成，其中一个反射镜是圆锥曲面（例如双曲面），另一个是反射广义多项式非球面校正器; 并且两个反射镜都是旋转对称的旋转表面，每个都围绕它自己的旋转轴线。 该系统的双重特性允许由只有两个反射表面加上分散光学元件组成的紧凑型光学系统，并且没有内部遮蔽，从而避免了内部结构的衍射的负面影响。 示出了本发明适用于几种类型的光谱仪设计配置中的每一种。

公开(公告)号：EP0442596A2

公开(公告)日：1991-08-21

申请号：EP91250043.6

申请日：1991-02-13

Applicant: BODENSEEWERK PERKIN-ELMER GMBH

Inventor： Florek, Stefan, Dr. ,  Becker-Ross, Helmut, Dr.

IPC: G01J3/12 ,  G01J3/36

CPC classification number: G01J3/1809 ,  G01J2003/1828 ,  G01J2003/1876

Abstract: Die Erfindung betrifft einen Echelle-Polychromator und ist anwendbar in Geräten zur spektralphotometrischen Untersuchung von Strahlungsquellen.
Sie ist dadurch gekennzeichnet, daß dem Polychromator eine dispersive und polychromatische Beleuchtungseinrichtung vorgeschaltet ist, gebildet aus Eintrittsspaltanordnung (3), Kollimatoroptik (4), Prisma (5) und Kameraoptik (6), wobei die Eintrittsspaltanordnungen des Polychromators (7) und der Beleuchtungseinrichtung (3) jeweils aus einem Hauptspalt zur Bündelbegrenzung in Gitter-Dispersionsrichtung und einem Querspalt zur Bündelbegrenzung in Richtung der Dispersion des Prismas (9) im Echelle-Polychromator bestehen. Der gesamte vom Polychromator zu verarbeitende Wellenlängenbereich wird als Spektrum der Beleuchtungseinrichtung mit vernachlässigbarer Aberration vollständig auf den Querspalt (7.2) des Echelle-Polychromators abgebildet.

Abstract translation: 本发明涉及中阶梯多色仪，并且适用于辐射源分光光度分析的装置。 它的特征在于，所述多色色散和多色照明设备连接的上游，从入口间隙组件（3），准直光学器件（4），棱镜（5）形成和照相机透镜（6），所述的多色仪（7）和所述照明装置的入口狭缝的安排（ 3）各由一个主间隙为在光栅色散方向和用于在中阶梯多色仪的棱镜（9）的分散体的方向限制束的横向间隙限制束。 要处理的多色仪的整个波长范围内被用作具有可忽略的象差充分上成像的阶梯多色仪的横向间隙（7.2）的发光装置的光谱。

公开(公告)号：EP0332211A2

公开(公告)日：1989-09-13

申请号：EP89104303.6

申请日：1989-03-10

Applicant: Becker-Ross, Helmut, Dr. ,  Engel, Klaus-Eberhard, Dipl. Phys. ,  Engel, Susanne ,  Florek, Stefan, Dr. ,  Matzke, Wolf Ekkehard, Dipl. Ing. ,  Tischendorf, Reinhard, Dipl. Ing.

Inventor： Becker-Ross, Helmut, Dr., Dipl.-Phys. ,  Florek, Stefan, Dr., Dipl.-Phys. ,  Tischendorf, Reinhard, Dipl.-Ing. ,  Engel, Klaus-Eberhard, Dipl.-Phys. ,  Matzke, Wolf-Ekkehard, Dipl.-Ing. ,  Engel, Susanne

IPC: G01J3/28 ,  G01J3/36

CPC classification number: G01J3/1809 ,  G01J3/2803

Abstract: Die Erfindung betrifft eine Anordnung zur Untersuchung hoch­aufgelöster Teilspektren eines Echelle-Spektrums und ist anwendbar zur gleichzeitigen Bestimmung der Intensität verschiedener Spektralelemente eines Strahlungsspektrums, das durch ein Echelle-Spektrometer erzeugt wird.
Die Anordnung besteht aus einem ortsauflösenden photoelek­trischen Detektor mit mehreren auf einem IC-Chip (0) an­geordneten Photosensoren, wobei die Photosensoren auf der Chipfläche an den Orten vorausgewählter Spektrallinien diskret angeordnet sind und jeder Photosensoren aus einer CCD-Sensorzeile (4; 5; 6) und einer Logikschaltung besteht, die in Abhängigkeit von Aktivierungspegeln das Schalten von Versorgungspotentialen und Taktsignalen sowie die Übergabe von Ausgangssignalen auf eine gemeinsame Ausgangssignalleitung ermöglicht. Die einzelnen Sensor­elemente der CCD-Sensorzeilen sind bezüglich ihrer Flächen an die Spektralelemente des Echelle-Spektrums angepaßt und verlaufen nacheinander in Richtung der Dispersion des Echelle-Gitters. Die Gesamtzahl der Sensorelemente aller CCD-Sensorzeilen (4; 5; 6) auf dem Chip ist vorzugsweise geringer als die Anzahl der Spektralelemente im Echelle-­Spektrum. Eine digitale Logikschaltung erlaubt mittels der von ihr verwalteten Aktivierungspegel die serielle Auslesung der Signale einer wählbaren Teilmenge aus allen CCD-Sensorzeilen (4; 5; 6) in wählbarer Reihen­folge über die gemeinsame Ausgangssignalleitung in Ab­hängigkeit von äußeren Steuersignalen.

Abstract translation: 本发明涉及一种用于检查中阶梯光谱的高分辨率局部光谱的布置中，并且适用于不同的光谱元件，其是由阶梯光栅光谱仪中产生的辐射光谱的强度的同时测定。 该装置包括具有（0）设置光传感器IC芯片上的多个空间分辨光电检测器中，所述的预选的光谱线的位置在芯片表面上的光传感器被离散地配置和CCD传感器线的每个光传感器（4; 5; 6） 和逻辑电路由使电源电位和时钟信号的切换和输出信号的上激活水平的传送到一个共同的输出信号线中的依赖。 CCD传感器线的各个传感器元件相对于匹配到它们的表面到阶梯频谱的频谱单元和在阶梯光栅的分散体的方向连续地延伸。 所有的CCD传感器的行的传感器元件的总数量（4; 5; 6）在芯片上优选比在阶梯频谱的频谱单元的数量少。 可以通过激活水平的管理手段允许的数字逻辑电路，可选择的部分量的来自所有CCD传感器线的信号的串行读出（4; 5; 6）通过在外部的控制信号而共用输出信号线的可选择的顺序排列。

公开(公告)号：EP0184428A2

公开(公告)日：1986-06-11

申请号：EP85308799.7

申请日：1985-12-03

Applicant: Leco Instruments Limited

Inventor： Levy, Gilbert M. ,  Quaglia, Alexander ,  Lazure, Robert E.

IPC: G01J3/18

CPC classification number: G01J3/18 ,  G01J3/02 ,  G01J3/0229 ,  G01J3/1809 ,  G01J3/2803 ,  G01J2003/1278

Abstract: An optical arrangement for use in spectrometry uses a masking device which eliminates unwanted spectral regions prior to optically resolving the unmasked information. The optical arrangement comprises an entrance slit to select incidence spectral energy from an energized source and a concave grating of relatively low dispersion to image the spectrum of the entrance slit onto a stationary mask which simultaneously selects spectral regions of the dispersed incident spectral energy. The selected spectral regions are collimated and recombined and directed onto an Echelle grating to disperse with high resolution the selected spectral regions. A concave mirror focuses the dispersed selected spectral regions into a focal plane of highly resolved spectral energy which can be detected to determine the spectral information coming from the source. The optical arrangement is particularly well suited for use with narrow spectral bandwidth spectral information distributed over a large spectral range. In spectroscopy, desired information very often occupies a tiny fraction of the total spectral information presented to a spectrometer. With this optical arrangement, spectral information can be selected from a much broader band spectral information and collected with high resolution on a small curvilinear portion of the output focal plane. The arrangement is particularly useful for absorption, light scattering or emission spectroscopy. It provides a stable mechanical design making it less sensitive to vibration. Manufacturing mechanical tolerances are also less restrictive.

公开(公告)号：ZA9002481B

公开(公告)日：1991-01-30

申请号：ZA9002481

申请日：1990-03-30

Applicant: UNIV LEHIGH

Inventor： KIM YONG W ,  YONG W KIM

IPC: G01J3/443 ,  G01J3/02 ,  G01J3/04 ,  G01J3/18 ,  G01J3/28 ,  G01N21/17 ,  G01N21/69 ,  G01N21/71 ,  G01N21/73 ,  G01J

CPC classification number: G01J3/1809 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0286 ,  G01J3/0291 ,  G01J3/04 ,  G01J3/28 ,  G01J3/2889 ,  G01J2003/1828 ,  G01N21/718 ,  G01N2021/695

公开(公告)号：EP3403061A1

公开(公告)日：2018-11-21

申请号：EP16825730.1

申请日：2016-12-20

Applicant: Analytik Jena AG

Inventor： MÜNCH, Stefan ,  OKRUSS, Michael

IPC: G01J3/14 ,  G01J3/18 ,  G01J3/02 ,  G01J3/28

CPC classification number: G01J3/0208 ,  G01J3/14 ,  G01J3/1809 ,  G01J3/2803 ,  G01J2003/1828

Abstract: A spectrometer assembly (10) with a two-dimensional spectrum comprising a first dispersing element (31) for the spectral decomposition of radiation in a main dispersion direction, an imaging optical system (17) for imaging in an image plane the radiation penetrating through an inlet gap (15) in the spectrometer arrangement (10) and enabling a two-dimensional spectrum to be produced, and a surface detector (39) with a two-dimensional arrangement of a plurality of detector elements in the image plane. Said spectrometer assembly is characterized in that a reflector, a refractor, a lens array or another optical element is arranged in the beam path at a point where the dispersed, monochromatic bundles are present in a separated manner, and the reflector, the refractor, the lens array or the other optical element have a surface in the form of a free-form surface wherein the surface occupied by the selected images of the inlet gap at different wavelengths in the image plane is optimised over a selected spectral range of the two-dimensional spectrum.

公开(公告)号：EP3161435A1

公开(公告)日：2017-05-03

申请号：EP15812427.1

申请日：2015-05-26

Applicant: Intel Corporation

Inventor： HUTCHISON, David, N. ,  KIM, Kyu Hyun ,  RONG, Haisheng ,  HECK, John ,  XU, Shengbo

IPC: G01J3/18 ,  G02B6/122 ,  G01N21/27

CPC classification number: G02B6/4295 ,  G01J3/0218 ,  G01J3/0237 ,  G01J3/0259 ,  G01J3/0297 ,  G01J3/1809 ,  G01J3/1895 ,  G01J3/20 ,  G01J3/32 ,  G02B6/00 ,  G02B6/12033

Abstract: Techniques and mechanisms for a monolithic photonic integrated circuit (PIC) to provide spectrometry functionality. In an embodiment, the PIC comprises a photonic device, a first waveguide and a second waveguide, wherein one of the first waveguide and the second waveguide includes a released portion which is free to move relative to a substrate of the PIC. During a metering cycle to evaluate a material under test, control logic operates an actuator to successively configure a plurality of positions of the released portion relative to the photonic device. In another embodiment, light from the first waveguide is variously diffracted by a grating of the photonic device during the metering cycle, where portions of the light are directed into the second waveguide. Different wavelengths of light diffracted into the second waveguide may be successively detected, for different positions of the released portion, to determine spectrometric measurements over a range of wavelength.

Abstract translation: 单片光子集成电路（PIC）提供光谱测量功能的技术和机制。 在一个实施例中，PIC包括光子器件，第一波导和第二波导，其中第一波导和第二波导中的一个包括相对于PIC的衬底自由移动的释放部分。 在计量循环期间，为了评估待测材料，控制逻辑操作致动器以相继配置释放部分相对于光子器件的多个位置。 在另一个实施例中，来自第一波导的光在计量周期期间被光子器件的光栅不同地衍射，其中部分光被引导到第二波导中。 衍射到第二波导中的不同波长的光可被连续检测，用于释放部分的不同位置，以确定波长范围内的光谱测量。

公开(公告)号：EP2384424B1

公开(公告)日：2015-05-06

申请号：EP10701357.5

申请日：2010-01-25

Applicant: Leibniz - Institut Für Analytische Wissenschaften

Inventor： BECKER-ROSS, Helmut ,  FLOREK, Stefan ,  OKRUSS, Michael

IPC: G01J3/18 ,  G01J3/28 ,  G01J3/02

CPC classification number: G01J3/1809 ,  G01J3/02 ,  G01J3/0213 ,  G01J3/2803 ,  G01J2003/1828