System and method for hyperspectral and polarimetric imaging
    222.
    发明公开
    System and method for hyperspectral and polarimetric imaging 审中-公开
    系统和Verfahren zur hyperspektralen和偏光仪器

    公开(公告)号:EP2416136A2

    公开(公告)日:2012-02-08

    申请号:EP11163920.9

    申请日:2011-04-27

    CPC classification number: G01J3/2823 G01J3/02 G01J3/0224 G01J3/2803 G01J4/04

    Abstract: Embodiments of a system and method for collecting hyperspectral and polarimetric data that are spatially and temporally coincident include a dispersive element configured to receive incident electromagnetic radiation. The dispersive element is configured to disperse a non-zero order of the electromagnetic radiation into its constituent spectra, which is directed to a first focal plane array, and may be read out as hyperspectral data. The dispersive element is also configured to reflect a zero order of the electromagnetic radiation, which is directed through a polarity discriminating element to a second focal plane array, which may be read out as polarimetric data. By synchronously reading out the first and second focal plane arrays, the hyperspectral and polarimetric data may be both spatially and temporally coincident.

    Abstract translation: 用于收集在空间和时间上重合的高光谱和极化数据的系统和方法的实施例包括配置成接收入射电磁辐射的分散元件。 分散元件被配置为将电磁辐射的非零级分散到其组成光谱中,其指向第一焦平面阵列,并且可以作为高光谱数据读出。 分散元件还被配置为将电磁辐射的零级反射,其通过极性鉴别元件被引导到第二焦平面阵列,其可被读出为极化数据。 通过同步读出第一和第二焦平面阵列,高光谱和极化数据可以在空间上和时间上一致。

    METHOD AND SYSTEM FOR ENHANCING POLARIMETRIC AND/OR MULTI-BAND IMAGES
    224.
    发明公开
    METHOD AND SYSTEM FOR ENHANCING POLARIMETRIC AND/OR MULTI-BAND IMAGES 审中-公开
    方法和系统的扩展极化和/或多波段PICTURES

    公开(公告)号:EP2102788A2

    公开(公告)日:2009-09-23

    申请号:EP08713671.9

    申请日:2008-01-09

    CPC classification number: G01J4/04

    Abstract: This invention solves a problem of registration and improves signal-to-noise ratio (SNR) when using division-by-focal-plane array to produce multiple polarization images. This is achieved by processing a sequence of angular-position-dithered frames to generate a high-definition, Nyquist-sampled, integrated image for each of the polarizations. The integration method transforms individually under-sampled, high-resolution image frames into resultant high-resolution frames that meet the Nyquist sampling criterion. During the resampling transformation, each polarization or waveband is resampled to produce precise registration to the other polarizations, since registration offsets are fixed and defined by the arrangement of the polarized pixels in the focal-plane-array. In the most straight-forward implementation, these offsets would be integer pixel shifts in X and Y.

    System and process for analysing a sample
    225.
    发明公开
    System and process for analysing a sample 有权
    系统和Verfahren zur分析einer探头

    公开(公告)号:EP1947445A1

    公开(公告)日:2008-07-23

    申请号:EP07300736.1

    申请日:2007-01-19

    CPC classification number: G01N21/211 G01J3/2823 G01J4/04 G01N2021/213

    Abstract: The present invention concerns a system and a process for analysing a sample (6) comprising an excitation section (1) and an analyse section (7), said excitation section (1) including a light source (2) emitting an incident measurement luminous beam (3), a polarisation state generator (PSG) (4), first optical means (5), and said analyse section (7) comprising a polarisation state analyser (PSA) (8), a detection system (10) and second optical means (9).
    According to the invention, the excitation section (1) comprises an illumination source (12) emitting an incident visualization luminous beam (22), superposition optical means (13) enabling to the incident visualization luminous beam (22) to be send onto the sample surface (21) through an optical path which is identical to the optical path of the incident measurement luminous beam (3) and the analyse section (7) comprises separation optical means (14) enabling to transmit a part of the reflected or transmitted visualization luminous beam (23) and a part of the reflected or transmitted measurement luminous beam towards a visualization direction (25).

    Abstract translation: 本发明涉及一种用于分析包括激励部分(1)和分析部分(7)的样品(6)的系统和方法,所述激励部分(1)包括发射入射测量光束的光源(2) (3),偏振状态发生器(PSG)(4),第一光学装置(5)和包括偏振状态分析器(PSA)(8)的所述分析部分(7),检测系统(10)和第二光学 (9)。 根据本发明,激励部分(1)包括发射入射的可视化发光束(22)的照明源(12),能够将入射的可视化发光束(22)发送到样品上的叠加光学装置(13) 通过与入射测量光束(3)和分析部分(7)的光路相同的光路的表面(21)包括分离光学装置(14),其能够透射部分反射或透射的可视光 光束(23)和反射或透射的测量发光束的一部分朝向可视化方向(25)。

    METHOD AND APPARATUS FOR MEASURING POLARIZATION MODE DISPERSION
    226.
    发明授权
    METHOD AND APPARATUS FOR MEASURING POLARIZATION MODE DISPERSION 有权
    METHOD AND APPARATUS FOR测量偏振模色散

    公开(公告)号:EP1590646B1

    公开(公告)日:2007-10-24

    申请号:EP03700784.6

    申请日:2003-02-06

    Inventor: CYR, Normand

    CPC classification number: G01J4/04 G01M11/331 G01M11/336

    Abstract: Apparatus for measuring polarization mode dispersion (PMD) of adevice, e. g. a waveguide, comprises a broadband light source (10,12) for passing polarized broadband light through the device (14), an interferometer (20) for dividing and recombining light that has passed through the device to form interferograms, a polarization separator (30) for receiving the light from the interferometer and separating such received light along first and second orthogonalFebruary 25, 2003February 25, 2003 polarization states, detectors (32x,32y) for converting the first and second orthogonal polarization states, respectively, into corresponding first and second electrical signals (Px(τ),Py(τ)), and a processor (36) for computing the modulus of the difference and such, respectively, of the first and second electrical signals to produce a cross-correlation envelope (EC(τ)) and an auto-correlation envelope (Ec(τ)), and determining the polarization mode dispersion according to the expression PMD = where and τ is the delay difference between the paths of the interferometer.

    MULTISPECTRAL, MULTIFUSION, LASER-POLARIMETRIC OPTICAL IMAGING SYSTEM
    227.
    发明公开
    MULTISPECTRAL, MULTIFUSION, LASER-POLARIMETRIC OPTICAL IMAGING SYSTEM 审中-公开
    多个频谱,多种融合激光旋光LIGHT图象系统

    公开(公告)号:EP1636556A4

    公开(公告)日:2007-09-12

    申请号:EP04809374

    申请日:2004-05-13

    Applicant: UNIV AKRON

    Inventor: GIAKOS GEORGE C

    Abstract: A multi-energy polarization imaging method consisting of a multi-fusion, dual-rotating retarder / multiple-energy complete Mueller matrix-based polarimeter and dual-energy capabilities The system includes a light source (14) for illuminating a target (18) with a first quantity of light having a first wavelength and a second quantity of light having a second wavelength, the first and second wavelength being different. A polarization-state generator (22) generates a polarization state for each of the first and second quantities of light, and includes a first polarizer (26) through which the first and second quantities of light are transmitted before entering a first waveplate (32). A polarization-state receiver (44) evaluates a resulting polarization state of the first and second quantities of light following illumination of the target (18), the polarization-state receiver (44) including a second waveplate (48) through which the first and second quantities of light are transmitted before entering a second polarizer (51). An optical image-capture device captures a first image of the target illuminated by the first quantity of light and a second image of the target illuminated by the second quantity of light. A processing unit assigns a weighting factor to at least one of the first and second images and evaluates a weighted difference between the first and second images to generate a multi-energy image of the target (18).

    Spectroscopic polarimetry
    229.
    发明公开
    Spectroscopic polarimetry 有权
    Spektroskopische Polarimetrie

    公开(公告)号:EP1707929A1

    公开(公告)日:2006-10-04

    申请号:EP06005739.5

    申请日:2006-03-21

    CPC classification number: G01J4/04 G01J3/447

    Abstract: In the channeled spectroscopic polarimetry, a measurement error of a parameter showing a spectropolarization characteristic of a sample is effectively removed, the error being generated by various variations in retardation of a retarder depending upon the state of the sample.
    With attention being focused on that the retardation of the retarder may be kept constant by stabilization of an incident direction of light that transmits through the retarder, the retarder (R1, R2, 117, 118, 207, 208) was arranged on the light source (7, 202) side with respect to the sample (D, 50,400) so as to effectively remove an influence relative to a measurement error, such as variations in direction of a light ray due to the sample (D, 50, 400).

    Abstract translation: 在通道光谱偏振法中,有效地消除了示出样品的分光偏振特性的参数的测量误差,该误差是由取决于样品的状态的延迟器的延迟的各种变化而产生的。 注意力集中在通过使通过延迟器透射的光的入射方向的稳定化可以使延迟器的延迟保持恒定,将延迟器(R1,R2,117,187,208,208)设置在光源 (D,50,400)的相对于样品(D,50,400)的光线方向的变化的测量误差的影响(D,50,400)。

    Exposure apparatus and method, measuring apparatus, and device manufacturing method
    230.
    发明公开
    Exposure apparatus and method, measuring apparatus, and device manufacturing method 审中-公开
    Belichtungsgerätund Belichtungsverfahren,Messgerätund Herstellungsverfahren einer Vorrichtung

    公开(公告)号:EP1698939A2

    公开(公告)日:2006-09-06

    申请号:EP06004225.6

    申请日:2006-03-02

    Abstract: An exposure apparatus includes an illumination optical (IO) system for illuminating the reticle (MK) using the ultraviolet light from the light source, and a polarization measuring unit (1) measuring the polarization state of the ultraviolet light, the polarization measuring unit including an optical unit for providing at least three different phase differences to the ultraviolet light that has passed at least part of the illumination optical system, a polarization element for providing a different transmittance in accordance with a polarization state of the ultraviolet light that has passed the optical unit, and an image pickup device (22) for detecting a light intensity of the ultraviolet light that has passed the polarization element, the polarization measuring unit measuring the polarization state of the ultraviolet light that has passed the at least part of the illumination optical system based on a detection result of the image pickup device.

    Abstract translation: 曝光装置包括使用来自光源的紫外光照射掩模版(MK)的照明光学(IO)系统和测量紫外光的偏振状态的偏振光测量单元(1),所述偏振光测量单元包括: 光学单元,用于对通过至少部分照明光学系统的紫外光提供至少三个不同的相位差;偏振元件,用于根据已经通过光学单元的紫外光的偏振状态提供不同的透射率 以及用于检测已经通过偏振元件的紫外光的光强度的图像拾取装置(22),所述偏振测量单元测量已经通过所述照明光学系统的至少一部分的紫外光的偏振状态 根据图像拾取装置的检测结果。

Patent Agency Ranking