Atomic magnetometer and operating method of the same

    公开(公告)号:US09927501B2

    公开(公告)日:2018-03-27

    申请号:US14573718

    申请日:2014-12-17

    CPC classification number: G01R33/26 G01R33/032

    Abstract: Provided are an atomic magnetometer and an operating method of the same. The atomic magnetometer includes a vapor cell receiving a circularly polarized pump beam and a linearly polarized probe beam and containing an alkali metal vapor, a detector adapted to receive the probe beam passing through the vapor cell to measure magneto-optical rotation of the probe beam, a feedback coil to establish a negative feedback magnetic field signal orthogonal to a first plane defined by traveling directions of the probe beam and the pump beam and provide the negative feedback magnetic field signal to the vapor cell, and a feedback amplifier adapted to provide feedback current to the feedback coil such that the negative feedback magnetic field proportional to a measurement magnetic field is established. The measurement magnetic field of a measurement target provides magneto-optical rotation of the probe beam in the vapor cell.

    MAGNETIC FIELD SENSOR AND APPARATUS FOR MEASURING MAGNETIC FIELD

    公开(公告)号:US20170371003A1

    公开(公告)日:2017-12-28

    申请号:US15534861

    申请日:2015-11-18

    Abstract: A magnetic field sensor of the present invention includes a first electrode including a magnetic material, a second electrode including a non-magnetic material, a common electrode disposed between the first electrode and the second electrode and connected to a ground terminal, a power supplier of which one end is connected to the first electrode and the second electrode and of which another end is connected to the common electrode to supply power of a frequency band required, a variable resistor configured to control at least one of a resistance value between the first electrode and the power supplier or a resistance value between the second electrode and the power supplier, and a differential amplifier connected to the first electrode through a positive terminal and connected to the second electrode through a negative terminal to output a difference value between a first capacitance generated by the first electrode and a second capacitance generated by the second electrode in response to external application of a magnetic field.

    Apparatus for dipping substrate
    235.
    发明授权

    公开(公告)号:US09795982B2

    公开(公告)日:2017-10-24

    申请号:US14892900

    申请日:2015-05-19

    Inventor: Eun-Ah You

    CPC classification number: B05C3/02 B05C3/04 B05C13/02 C25D17/00

    Abstract: An apparatus for dipping a substrate includes: a body having an internal plate formed therein, and including a backing plate provided over the internal plate; a crucible accommodating an aqueous solution therein and provided over the backing plate; a crucible driving unit provided in the body and connected to the crucible to move the crucible in a horizontal direction or a vertical direction of the body; a support having a lower end to which a substrate is fixed; a support driving unit provided to an upper side of the body and connected to the support to drive the support in a length direction of the support or rotate the support in the vertical direction of the body; and a controlling unit connected to the crucible driving unit and the support driving unit to control driving of the crucible driving unit and the support driving unit.

    SENSOR
    238.
    发明申请
    SENSOR 审中-公开

    公开(公告)号:US20170184557A1

    公开(公告)日:2017-06-29

    申请号:US15300514

    申请日:2015-03-17

    CPC classification number: G01N33/005 G01N27/125 G01N27/127

    Abstract: The present invention relates to a sensor for sensing hydrogen. The sensor of the present invention comprises: a core which reacts with hydrogen to change a resistance value; at least two electrodes connected to the core; and a variable resistor which is connected to at least one of the two electrodes and of which the resistance value changes in response to a control signal, wherein the core includes palladium having a thin film shape, and graphene which is applied on the palladium and has a thin film shape.

    HEAD-INTEGRATED ATOMIC FORCE MICROSCOPE AND COMPOSITE MICROSCOPE INCLUDING SAME

    公开(公告)号:US20170138983A1

    公开(公告)日:2017-05-18

    申请号:US15323078

    申请日:2015-12-23

    CPC classification number: G01Q60/32 G01Q20/02 G01Q30/02 G01Q30/18 G01Q60/38

    Abstract: An object of the application is to provide a head-integrated for an atomic force microscope capable of realizing minimization of a weight and a volume and improvement of structural stability by optimizing a head structure of the atomic force microscope. Another object of the application is to provide a head-integrated atomic force microscope capable of being utilized for imaging a large-area sample by enabling high-rate head scan due to dynamic characteristics improved by mounting the integrated-head described above. Still another object of the application is to provide a composite microscope including a head-integrated atomic force microscope, capable of performing high-rate position search and imaging and performing precise observation of a three-dimensional shape up to an atomic image level in a region of interest by combining the head-integrated atomic force microscope having the improved dynamic characteristics as described above and an electron microscope or an optical microscope with each other.

    APPARATUS FOR DIPPING SUBSTRATE
    240.
    发明申请

    公开(公告)号:US20170106394A1

    公开(公告)日:2017-04-20

    申请号:US14892900

    申请日:2015-05-19

    Inventor: Eun-Ah YOU

    CPC classification number: B05C3/02 B05C3/04 B05C13/02 C25D17/00

    Abstract: An apparatus for dipping a substrate includes: a body having an internal plate formed therein, and including a backing plate 120 provided over the internal plate; a crucible accommodating an aqueous solution therein and provided over the backing plate; a crucible driving unit provided in the body and connected to the crucible so as to move the crucible in a horizontal direction or a vertical direction of the body; a support having a lower end to which a substrate is fixed; a support driving unit provided to an upper side of the body and connected to the support so as to drive the support in a length direction of the support or rotate the support in the vertical direction of the body; and a controlling unit connected to the crucible driving unit and the support driving unit to control driving of the crucible driving unit and the support driving unit.

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