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1.
公开(公告)号:US20210181090A1
公开(公告)日:2021-06-17
申请号:US17256966
申请日:2019-07-03
Inventor: Yong Jai CHO , Won CHEGAL , Hyun Mo CHO
Abstract: The present invention relates to a normal incidence ellipsometer and a method for measuring the optical properties of a sample by using same. The purpose of the present invention is to provide: a normal incidence ellipsometer in which a wavelength-dependent compensator is replaced with a wavelength-independent linear polarizer such that equipment calibration procedures are simplified while a measurement wavelength range expansion can be easily implemented; and a method for measuring the optical properties of a sample by using same.
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2.
公开(公告)号:US20230168185A1
公开(公告)日:2023-06-01
申请号:US17921706
申请日:2020-09-21
Inventor: Hyun Mo CHO , Dong Hyung KIM , Won CHEGAL , Yong Jai CHO
CPC classification number: G01N21/211 , G01N21/11 , G01N2021/752
Abstract: An embodiment of the present disclosure provides a multi-reflection silicon-based liquid immersion micro-channel measurement device and measurement method capable of improving measurement sensitivity by completely separating, through multi-reflection, first reflective light reflected by a sample detection layer and a second reflective light by a prism-buffer solution interface and by allowing the light to enter multiple times through the multi-reflection. The multi-reflection silicon-based liquid immersion micro-channel measurement device according to the embodiment of the present disclosure includes a micro-channel structure including a support, and one or more micro-channels formed on the support and each having a sample detection layer with a fixed bioadhesive material for detecting a sample, a sample injection unit configured to inject a buffer solution containing the sample into the micro-channel, a prism unit including a prism, and a reflection structure formed by coating a bottom surface of the prism with a mirror reflection material, the polarized light generating unit configured to generate polarized light, and the polarized light detecting unit configured to detect a polarization change of reflected light.
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3.
公开(公告)号:US20180113069A1
公开(公告)日:2018-04-26
申请号:US15557446
申请日:2016-03-08
Inventor: Yong Jai CHO , Won CHEGAL , Hyun Mo CHO
CPC classification number: G01N21/211 , G01B11/0641 , G01B11/24 , G01J4/04 , G01N21/8422
Abstract: The present invention relates to an optical element rotation type ellipsometer, and more particularly, to an ellipsometer used to measure Mueller-matrix components of a sample by measuring and analyzing a change in a polarization state of light reflected or transmitted by the sample.According to the exemplary embodiment of the present invention, it is possible to provide the achromatic rotating-element ellipsometer and the method for measuring Mueller-matrix elements of a sample using the same capable of measuring the Mueller-matrix elements of the anisotropic sample as well as the isotropic sample by using four polarizers.
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4.
公开(公告)号:US20180100795A1
公开(公告)日:2018-04-12
申请号:US15532896
申请日:2016-04-27
Inventor: Hyun Mo CHO , Won CHEGAL , Yong Jai CHO
CPC classification number: G01N21/211 , B01L3/502715 , B01L2300/0654 , B01L2300/08 , B01L2300/0816 , B01L2300/168 , G01B11/06 , G01N21/21 , G01N21/4133 , G01N2021/213
Abstract: An oblique incidence, prism-incident, silicon-based, immersion microchannel-based measurement device related to an example of the present disclosure may include: a microchannel structure which has a support, a substrate which is formed on the support and made of a semiconductor or dielectric material, a cover part which has a prism structure and is installed on the support, and a microchannel which is formed in any one of an upper portion of the support and a lower end of the cover part; a sample injection part which forms an adsorption layer for a sample on a substrate by injecting a buffer solution containing the sample made of a biomaterial into the microchannel; a polarized light generation part which emits polarized incident light through an incident surface of the prism to the adsorption layer at an incident angle that satisfies a p-wave antireflection condition; and a polarized light detection part which first reflective light reflected by at least one of the adsorption layer and the substrate enters through a reflective surface of the prism and which detects a change in polarization of the first reflective light.
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