公开(公告)号：US20050043597A1

公开(公告)日：2005-02-24

申请号：US10723042

申请日：2003-11-26

Applicant: Jinchun Xie

Inventor： Jinchun Xie

IPC: A61B5/00 ,  C12Q20060101 ,  G01N21/65

CPC classification number: A61B5/6826 ,  A61B5/0066 ,  A61B5/14532 ,  A61B5/14546 ,  A61B5/1455 ,  A61B5/6838 ,  G01J3/0243 ,  G01N21/65

Abstract: Method and systems are provided for in vivo, non-invasive detection of blood analytes. A portion of the sterile matrix located beneath a nail is illuminated by passing radiation from an optical source through the nail into the sterile matrix. Scattered, refracted, or reflected radiation emitted within the sampled volume is collected and analyzed to identify and quantify one or more selected analytes.

Abstract translation: 提供了用于体内，非侵入性检测血液分析物的方法和系统。 位于指甲下方的无菌基质的一部分通过从光源通过指甲将辐射通过无菌基质来照射。 收集和分析在采样体积内发射的散射，折射或反射的辐射，以鉴定和量化一种或多种选择的分析物。

公开(公告)号：US20040057049A1

公开(公告)日：2004-03-25

申请号：US10668025

申请日：2003-09-19

Applicant: Applied Photonics Worldwide, Inc.

Inventor： Reinhard Bruch ,  Uwe Fritzsch ,  Thomas Gessner ,  Thomas Otto ,  Volker Stock

IPC: G01J003/28

CPC classification number: G01J3/02 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0243 ,  G01J3/0256 ,  G01J3/0294 ,  G01J3/04 ,  G01J3/18 ,  G01J2003/045

Abstract: The present invention relates to different types of micromirror spectrometers using MEMS (Micro Electro Mechanical Systems) for various applications in the UV, VIS, NIR and MIR wavelength regions. The invention enables a wavelength selection using micro scanning mirror and integrated grating on a much smaller scale than previously encountered conventional diffraction grating monochromators. Especially small designs are obtained via simultaneous usage of collimation optics for both spatial filters, by using entrance and exit slit apertures, which are located very close together. Until now, the spatial filters themselves are not part of the miniaturization. The utilization of the precision from this technology allows for reproducible slits with defined geometries and surface roughness and accurate spatial classification towards the rotation axis of the diffraction grating. Therefore the assembly and adjustment effort of the monochromator is reduced. Due to the option of additional slit apertures, several independent monochromator channels with crossed beam paths can be created; whereas all remaining optical elements (diffraction grating and collimator optic) are utilized together. Such additional channels can serve, for example, as reference measurements of a radiation source, or enable the direct optical control of the grating torsion angle as a monitoring channel. The goal of the invention is to define a simple design and arrangement for monochromators based upon micromechanical elements, which avoids all disadvantages described above.

Abstract translation: 本发明涉及使用MEMS（微机电系统）的不同类型的微镜光谱仪，用于UV，VIS，NIR和MIR波长区域中的各种应用。 本发明使得能够以比先前遇到的常规衍射光栅单色仪小得多的尺寸使用微扫描镜和集成光栅进行波长选择。 通过使用位于非常靠近的入口和出口狭缝孔，通过同时使用用于两个空间滤光器的准直光学器件来获得特别小的设计。 到目前为止，空间滤波器本身不是小型化的一部分。 利用这种技术的精度，允许具有确定的几何形状和表面粗糙度的可重复切割以及对于衍射光栅的旋转轴的准确的空间分类。 因此，单色仪的组装和调整工作减少了。 由于可选择附加的狭缝孔，可以产生具有交叉光束路径的几个独立的单色仪通道; 而所有剩余的光学元件（衍射光栅和准直器光学元件）被一起使用。 这样的附加通道可以例如用作辐射源的参考测量，或者可以将光栅扭转角的直接光学控制作为监视通道。 本发明的目标是基于微机械元件来定义用于单色仪的简单设计和布置，这避免了上述的所有缺点。

公开(公告)号：US06667805B2

公开(公告)日：2003-12-23

申请号：US09932548

申请日：2001-08-17

Applicant: Adam E. Norton ,  Kenneth C. Johnson ,  Fred E. Stanke

Inventor： Adam E. Norton ,  Kenneth C. Johnson ,  Fred E. Stanke

IPC: G01J328

CPC classification number: G01N21/31 ,  G01J3/02 ,  G01J3/0224 ,  G01J3/0243 ,  G01J3/28 ,  G01N21/956 ,  G02B5/3083 ,  G02B27/28

Abstract: A small-spot imaging, spectrometry instrument for measuring properties of a sample has a polarization-scrambling element, such as a Lyot depolarizer, incorporated between the polarization-introducing components of the system, such as the beamsplitter, and the microscope objective of the system. The Lyot depolarizer varies polarization with wavelength. Sinusoidal perturbation in the resulting measured spectrum can be removed by data processing techniques or, if the depolarizer is thick or highly birefringent, may be narrower than the wavelength resolution of the instrument.

公开(公告)号：US06534768B1

公开(公告)日：2003-03-18

申请号：US09699702

申请日：2000-10-30

Applicant: Emil W. Ciurczak ,  Kevin C. Bynum

Inventor： Emil W. Ciurczak ,  Kevin C. Bynum

IPC: G01J528

CPC classification number: G01N21/35 ,  G01J1/0455 ,  G01J1/4228 ,  G01J3/0243 ,  G01J3/10 ,  G01J3/12 ,  G01J3/1256 ,  G01J3/2803 ,  G01J2003/123 ,  G01J2003/1243 ,  G01J2003/1828 ,  G01J2003/2866 ,  G01N21/359 ,  G01N21/59

Abstract: A hemispherical detector comprising a plurality of photodetectors arranged in a substantially contiguous array, the array being substantially in the shape of a half-sphere, the half-sphere defining a closed end and an open end, the open end defining a substantially circular face. Also provided is a method for constructing a hemispherical detector comprising the steps of making a press mold of the desired shape of the hemispherical detector, pouring a material into the press mold to form a cast, finishing the cast to remove any defects, coating the cast with a coating material, and attaching a plurality of photodetectors to the cast.

Abstract translation: 一种半球形检测器，包括以基本上邻接的阵列布置的多个光电检测器，所述阵列基本上为半球形，所述半球限定封闭端和开口端，所述开口端限定基本圆形的面。 还提供了一种用于构造半球形检测器的方法，包括以下步骤：制造半球形检测器所需形状的压模，将材料注入压模中以形成铸件，精加工铸件以除去任何缺陷，涂覆铸件 涂覆材料，并将多个光电检测器附接到铸件上。

公开(公告)号：US20020001079A1

公开(公告)日：2002-01-03

申请号：US09871538

申请日：2001-05-31

Inventor： Riccardo Paolinetti ,  Silvano Pieri ,  Andrea Romoli

IPC: G01J003/14 ,  G01J003/28

CPC classification number: G02B17/0888 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/0218 ,  G01J3/0243 ,  G01J3/14 ,  G02B19/0028 ,  G02B19/0085

Abstract: The spectrometer comprises, in combination: a slit (1) for the entry of a light beam; a collimator; a dispersion system (9); focusing means and a detector (13). The collimator comprises at least a first concave spherical mirror (3) and at least a first Schmidt plate (5) in an off-axis arrangement.

Abstract translation: 光谱仪组合包括用于进入光束的狭缝（1）; 准直器 分散系统（9）; 聚焦装置和检测器（13）。 准直器包括至少第一凹球面镜（3）和至少第一施密特板（5），其处于离轴布置。

公开(公告)号：US20010031107A1

公开(公告)日：2001-10-18

申请号：US09839809

申请日：2001-04-19

Inventor： Scott H. Bradshaw

IPC: G02F001/295 ,  G02F001/13 ,  G02B026/02 ,  G02F001/29 ,  G02B027/44 ,  G02B026/08 ,  G02B005/18

CPC classification number: G01J3/18 ,  G01J3/02 ,  G01J3/021 ,  G01J3/0213 ,  G01J3/0229 ,  G01J3/0243 ,  G02B5/005 ,  G02B6/2931 ,  G02B26/02 ,  G02B27/1086 ,  G02B27/145 ,  G02B27/147 ,  G02B27/4244

Abstract: A multiwavelength selector for use with a high speed performance monitor, that uses a spatial wavelength separator, a configurable spatial filter, a focusing assembly, and a photodetector to select a wavelength or wavelengths from a plurality of incoming wavelengths, for further processing by said high speed performance monitor. The invention is intended for use in a fiber optic network application.

Abstract translation: 一种用于高速性能监视器的多波长选择器，其使用空间波长分离器，可配置空间滤波器，聚焦组件和光电检测器来选择来自多个入射波长的波长或波长，以进一步处理所述高 速度性能监视器。 本发明旨在用于光纤网络应用中。

公开(公告)号：US4979821A

公开(公告)日：1990-12-25

申请号：US388193

申请日：1989-08-01

Applicant: Ernest G. Schutt ,  David L. Greenwood ,  Karin L. Utberg

Inventor： Ernest G. Schutt ,  David L. Greenwood ,  Karin L. Utberg

IPC: G01N33/543 ,  A61B6/08 ,  G01J1/04 ,  G01J3/02 ,  G01N21/21 ,  G01N21/47 ,  G01N21/55 ,  G01N33/553 ,  G01N33/58 ,  G02B17/06 ,  G02B27/20

CPC classification number: G01N21/552 ,  G01N33/553 ,  G01N33/585 ,  G01J3/0216 ,  G01J3/0243 ,  G01J3/0297 ,  G01N21/21 ,  G01N21/47 ,  Y10S436/807

Abstract: A new immunoassay system is provided for the detection of ligands or ligand binding partners in solution in a heterogeneous format. The invention relies upon the detection of back scattered light from an evanescent wave disturbed by the presence of a colloidal gold label brought to the interface by an immunological reaction. The evanescent wave existing at the interface in turn is the result of a totally internally reflected incident light wave. Placement of the detector at a back angle above the critical angle insures a superior signal-to-noise ratio. Apparatus and methods for scanning, detecting and manipulating light including a scattered total internal reflectance immunoassay system are provided.

Abstract translation: 提供了一种新的免疫测定系统，用于以异构方式检测溶液中的配体或配体结合配偶体。 本发明依赖于通过由免疫反应引入到界面的胶体金标记的存在而扰乱的ev逝波的背散射光的检测。 接口中存在的ev逝波依次是全反射入射光波的结果。 在高于临界角的后角处放置检测器确保了优异的信噪比。 提供了用于扫描，检测和操纵包括散射的全内反射免疫测定系统的光的装置和方法。

公开(公告)号：US4844617A

公开(公告)日：1989-07-04

申请号：US146046

申请日：1988-01-20

Applicant: Herman F. Kelderman ,  Michael E. Fein ,  Alan E. Loh ,  Arnold Adams ,  Armand P. Neukermans

Inventor： Herman F. Kelderman ,  Michael E. Fein ,  Alan E. Loh ,  Arnold Adams ,  Armand P. Neukermans

IPC: G01B9/04 ,  G01J3/02 ,  G01J3/18 ,  G01J3/28 ,  G02B21/00

CPC classification number: G01B9/04 ,  G01J3/02 ,  G01J3/0229 ,  G01J3/0243 ,  G01J3/0248 ,  G02B21/006 ,  G01J3/18 ,  G01J3/2803

Abstract: A confocal measuring microscope including a spectrometer and autofocus system sharing common optical elements in which the intensity of light entering the spectrometer from a particular spot on a workpiece is used to determine a focus condition for the same spot. The microscope includes at least one light source, an illumination field stop, and a microscope objective that images the stop onto a workpiece supported by a movable platform. The objective also forms an image of the illuminated portion of the object. An aperture in a second stop and intersecting the image plane passes light from part of the image to the spectrometer, while viewing optics are used to view the image. In one embodiment, a detector is placed at the zero order position, while in another embodiment a laser is placed at the zero order position. In the later embodiment an integrator circuit connected to the detector array replaces the zero order detector for measuring the total intensity of light entering the spectrometer. A best focus condition occurs when the total intensity is a maximum for a positive confocal configuration, i.e. where source and detector are on opposite sides of their respective field stops from said workpiece, and a minimum for a negative confocal configuration, i.e. where the source and workpiece are on the same side of a reflective illumination field stop with aperture. The movable platform may be scanned axially to achieve and maintain object focus as the object is scanned transversely.

Abstract translation: 共焦测量显微镜包括分光光度计和自动聚焦系统，共享共同的光学元件，其中使用从工件上的特定光点进入光谱仪的光的强度来确定同一光斑的聚焦条件。 显微镜包括至少一个光源，照明场停止器和将停止点图像到由可移动平台支撑的工件上的显微镜物镜。 该目的也形成对象的被照亮部分的图像。 在第二个停止点和与图像平面相交的孔将光从图像的一部分传递到光谱仪，而观察光学元件用于观看图像。 在一个实施例中，检测器被放置在零级位置，而在另一个实施例中，激光被放置在零级位置。 在后面的实施例中，连接到检测器阵列的积分器电路取代了用于测量进入光谱仪的光的总强度的零级检测器。 当总强度为正共焦配置的最大值时，即源和检测器位于其与所述工件相应的场停止位置的相对侧上，并且对于共焦焦配置为最小，即源和 工件位于具有孔径的反射照明场停止的同一侧。 当物体被横向扫描时，可移动平台可被轴向地扫描以实现和维持物体焦点。

公开(公告)号：US4746798A

公开(公告)日：1988-05-24

申请号：US897671

申请日：1986-08-18

Applicant: Max Amon ,  Jefferson E. Odhner

Inventor： Max Amon ,  Jefferson E. Odhner

IPC: G01J3/12 ,  G01J3/36 ,  G01J5/06 ,  G01J5/60 ,  G02B27/10 ,  G01J1/00

CPC classification number: G02B27/143 ,  G01J3/0243 ,  G01J3/12 ,  G02B27/1006 ,  G02B27/148 ,  G01J2003/1213 ,  G01J2005/607 ,  G01J3/36 ,  G01J5/061

Abstract: A wavelength discriminator designed to collect broadband, multiple wavelength input energy, to isolate specific narrow bands of interest, and to image such narrow bands of interest upon closely spaced, separate detectors. This discriminator comprises optical devices (22, 18) for directing incoming radiant energy of a certain quality and involving a wide range of wavelengths through first (26a) and second (26b) wavelength selective reflectors separated by a medium that transmits the wavelengths of interest. The wavelength selective reflectors in accordance with this invention are in a non-parallel configuration and disposed in a double pass geometrical arrangement wherein energy of a certain wavelength reflected from the second wavelength selective reflector (26b) passes back through the first wavelength selective reflector (26a), with the energy from the first and second wavelength reflectors thereafter being directed onto respective detectors (32aand 32b). An embodiment involving a third wavelength selective reflector (26c) grouped with the first and second reflectors may be utilized, wherein energy of a different wavelength reflected from the third wavelength selective reflector passes back through both the second and first wavelength selective reflectors, with the selected wavelengths thereafter falling upon three separate detectors (32a, 32band 32c) of the array.

Abstract translation: 一种波长鉴别器，设计用于收集宽带，多波长输入能量，以分离感兴趣的特定窄带，并在紧密间隔的独立检测器上对感兴趣的这种窄带进行成像。 该鉴别器包括光学器件（22,18），用于引导一定质量的入射辐射能并且涉及通过透射感兴趣波长的介质分离的第一（26a）和第二（26b）波长选择反射器的宽波长范围。 根据本发明的波长选择反射器处于非平行配置并且以双通几何布置布置，其中从第二波长选择反射器（26b）反射的特定波长的能量通过第一波长选择反射器（26a） ），其中来自第一和第二波长反射器的能量此后被引导到相应的检测器（32a和32b）上。 可以使用涉及与第一和第二反射器分组的第三波长选择性反射器（26c）的实施例，其中从第三波长选择性反射器反射的不同波长的能量通过第二和第一波长选择反射器返回， 之后的波长落在阵列的三个单独的检测器（32a，32频带32c）上。

公开(公告)号：US20180356284A1

公开(公告)日：2018-12-13

申请号：US15981927

申请日：2018-05-17

Applicant: Keyence Corporation

Inventor： Hideto Takei ,  Tomikazu Sakaguchi

IPC: G01J3/02 ,  G01J3/28 ,  G01J3/10 ,  G01J3/14

CPC classification number: G01J3/0208 ,  G01B11/026 ,  G01J3/024 ,  G01J3/0243 ,  G01J3/10 ,  G01J3/14 ,  G01J3/2823

Abstract: To provide a confocal displacement sensor that can prevent deterioration in measurement accuracy due to a spherical aberration of an optical member. The confocal displacement sensor includes a light source for light projection configured to generate light having a plurality of wavelengths, a pinhole configured to emit detection light by allowing the light emitted from the light source for light projection to pass, an optical member configured to generate an axial chromatic aberration in the detection light emitted via the pinhole and converge the detection light toward the measurement object, a measurement control section configured to calculate displacement of the measurement object on the basis of, in the detection light irradiated on the measurement object via the optical member, detection light passed through the pinhole by being reflected while focusing on the measurement object, and a head housing configured to house the pinhole and the optical member. The optical member includes a first diffraction lens configured to diffract the detection light and a first refraction lens configured to refract the detection light. The first refraction lens is disposed with a non-diffraction surface exposed from the head housing.