公开(公告)号：EP2580561A2

公开(公告)日：2013-04-17

申请号：EP11738513.8

申请日：2011-06-13

Applicant: Block Engineering, LLC

Inventor： KOTIDIS, Petros ,  DEUTSCH, Erik ,  ZHU, Ninghui ,  ERLICH, Adam ,  CAVICCHIO, Dan ,  COATES, John ,  HEANUE, John

IPC: G01J3/433

CPC classification number: G01N21/39 ,  B82Y20/00 ,  G01J3/108 ,  G01J3/26 ,  G01J3/4338 ,  G01J3/45 ,  G01N21/272 ,  G01N21/35 ,  G01N21/3504 ,  G01N21/3563 ,  G01N21/3577 ,  G01N2021/1793 ,  G01N2021/399 ,  G01N2201/0221 ,  G01N2201/0612 ,  G01N2201/068 ,  G01N2201/08 ,  G02B21/0028 ,  G02B21/008 ,  G02B21/06 ,  H01S5/0071 ,  H01S5/141 ,  H01S5/3401 ,  H01S5/3402 ,  H01S5/4012 ,  H01S5/4031

Abstract: A spectroscopy system comprising at least two laser modules, each of the laser modules including a laser cavity, a quantum cascade gain chip for amplifying light within the laser cavity, and a tuning element for controlling a wavelength of light generated by the modules. Combining optics are used to combine the light generated by the at least two laser modules into a single beam and a sample detector detects the single beam returning from a sample.

公开(公告)号：EP2565621A1

公开(公告)日：2013-03-06

申请号：EP11756416.1

申请日：2011-03-17

Applicant: National University Corporation Nagaoka University

Inventor： SHIODA Tatsutoshi

IPC: G01N21/17 ,  G01B9/02 ,  G01B11/24

CPC classification number: G01J3/45 ,  G01B9/02083 ,  G01B9/0209 ,  G01J3/4535 ,  G01N21/17

Abstract: Every depth of the measurement object measures energy structural information, refractive index, transmittance, reflectance other than property information of (as for the resolution several microns), e.g., space information at the same time.
A spectrum measurement device receives a reference wave propagating in a reference path and a measurement wave propagating in a measurement path having a start point same as a start point of the reference path, and derives a spectrum of the measurement wave.
The space information of the measuring object, energy structural information, refractive index, transmittance, a reflective index using spectrum measurement device are derived.

Abstract translation: 所述测量对象的每个深度测量能量的结构信息，折射率，透射率，反射率比的属性信息等（作为分辨率几微米），在在Sametime，E. G.，空间信息。 频谱测定装置接收一个参考路径的参考波传播和在具有开始点相同的参考路径的开始点的测量路径的测量波传播，并导出所述测量波的频谱。 测量对象，能量的结构信息，折射率，透射率，反射率使用光谱测量装置的空间信息导出。

公开(公告)号：EP2324342A1

公开(公告)日：2011-05-25

申请号：EP09810106.6

申请日：2009-08-31

Applicant: Fujirebio Inc.

Inventor： HIMMELHAUS, Michael

IPC: G01N21/45

CPC classification number: G01N21/7746 ,  G01J3/02 ,  G01J3/0205 ,  G01J3/45 ,  G01N21/45 ,  G01N2021/7779

Abstract: A system for analyzing optical cavity modes of at least one microcavity or at least one cluster of microcavities, comprises, an apparatus for sensing a change in the condition of or for analyzing the optical cavity modes by utilizing an optical interference of the optical cavity modes.

公开(公告)号：EP2264416A1

公开(公告)日：2010-12-22

申请号：EP10166380.5

申请日：2010-06-17

Applicant: Thales ,  Centre National d'Etudes Spatiales

Inventor： SIMEMONI, Denis ,  CHETRITE, Bruno ,  PIGOUCHE, Olivier ,  BUIL, Christian

IPC: G01J3/45 ,  G01J3/453

CPC classification number: G01J3/45 ,  G01J3/453

Abstract: L'invention porte sur un système d'interférométrie statique comprenant deux miroirs réalisés respectivement par assemblage vertical (EH) et horizontal (EV) d'un ensemble de lames parallèles de largeur constante, décalées le long de l'axe optique de manière à former des échelettes de différence de marche variable, lesdits deux miroirs à échelettes (EH, EV) étant disposés orthogonalement de manière à former, par superposition optique, un ensemble de facettes carrées provoquant des différences de marche différentes pour le signal incident, et un dispositif de détection (DET) de l'ensemble des différences de marche de l'interférogramme résultant. Le système comprend, en outre, des moyens de variation continue (LC) de la différence de marche durant l'acquisition de données par le dispositif de détection (DET), et des moyens d'échantillonnage (S, ACQL) pour échantillonner la différence de marche continue acquise en respectant le critère de Nyquist.

Abstract translation: 该系统具有通过组装沿光轴移动的板形成的垂直折叠镜（EV）和水平梯形镜（EH），以形成具有可变路径差的格子。 反射镜通过光学叠加正交放置以形成方形面，以引起入射信号的不同路径差异。 检测装置检测所得干涉图的路径差异。 补偿板（LC）允许路径差的连续变化，并且采样单元（S，ACQL）通过奈奎斯特准则对所获得的连续路径差进行采样。 还包括使用两个反射镜的静态干涉测量方法的独立权利要求。

公开(公告)号：EP1913332B1

公开(公告)日：2010-10-13

申请号：EP06813365.1

申请日：2006-08-09

Applicant: THE GENERAL HOSPITAL CORPORATION

Inventor： VAKOC, Benjamin, J. ,  YUN, Seok-Hyun ,  TEARNEY, Guillermo, J. ,  BOUMA, Brett, Eugene

IPC: G01B9/02 ,  G01N21/47

CPC classification number: G01B9/02044 ,  A61B5/0059 ,  A61B5/0066 ,  G01B9/02004 ,  G01B9/02072 ,  G01B9/02081 ,  G01B9/02091 ,  G01B2290/45 ,  G01B2290/70 ,  G01J3/45 ,  G01J2009/0265 ,  G01N21/21 ,  G01N21/274 ,  G01N21/4795

Abstract: Apparatus, method and storage medium which can provide at least one first electro-magnetic radiation to a sample 130 and at least one second electro-magnetic radiation to a reference, such that the first and/or second electro-magnetic radiations have a spectrum which changes over time. In addition, a first polarization component of at least one third radiation 405 associated with the first radiation can be combined with a second polarization component of at least one fourth radiation 400 associated with the second radiation with one another. The first and second polarizations may be specifically controlled to be at least approximately orthogonal to one another. Apparatus and method are used for quadrature detection of swept source Fourier domain optical coherence tomography.

公开(公告)号：EP2078939A1

公开(公告)日：2009-07-15

申请号：EP08100369.1

申请日：2008-01-11

Applicant: FOSS Analytical A/S

Inventor： Andersen, Hans Villemoes

IPC: G01J3/45 ,  G01J3/453 ,  G01B9/02

CPC classification number: G01J3/45 ,  G01B9/02071 ,  G01B2290/60 ,  G01J3/4535

Abstract: An interferometer (70) for observing a source of observed radiation (10) employing a source of reference radiation (12) characterised in that the interferometer (70) is configured to provide a ratio between the retardation of reference radiation and the retardation of observed radiation which is higher than 1.

Abstract translation: 一种用于使用参考辐射源（12）观察观测辐射源（10）的干涉仪（70），其特征在于，所述干涉仪（70）被配置为提供参考辐射的延迟与观察到的辐射的延迟之间的比率 高于1。

公开(公告)号：EP1888999A2

公开(公告)日：2008-02-20

申请号：EP06784475.3

申请日：2006-05-23

Applicant: Southwest Sciences Incorporated

Inventor： VAKHTIN, Andrei, B. ,  KANE, Daniel, J. ,  PETERSON, Kristen, A.

IPC: G01B9/02

CPC classification number: G01J3/45 ,  G01B9/02004 ,  G01B9/0201 ,  G01B9/02044 ,  G01B9/02081 ,  G01B9/02091 ,  G01B2290/45

Abstract: An apparatus and method for differential spectral interferometry comprising providing an interferometer comprising a light source; employing an element to provide a dithered relative phase shift between target and reference arms of the interferometer, detecting output from the interferometer, demodulating signals received from the detector at different multiples of the dither frequencies, generating more than one real-valued interferograms from demodulated signals, and using the real- valued interferograms to obtain the complex spectral interferogram.

公开(公告)号：EP1825312A1

公开(公告)日：2007-08-29

申请号：EP05826577.8

申请日：2005-12-15

Applicant: Université Joseph Fourier ,  Institut National Polytechnique de Grenoble

Inventor： LE COARER, Etienne ,  BENECH, Pierre

IPC: G02B6/42 ,  G01J3/26

CPC classification number: G01J3/45 ,  G01J3/0205

Abstract: The invention concerns the field of electronic detectors. It concerns an interferential spectroscopy detector characterized in that it comprises a waveguide having an input side and a mirror on the opposite side, and means for detecting electromagnetic rays delivering an electric signal as a function of the local intensity of the electromagnetic wave, said detection being produced between the input side and the mirror.

公开(公告)号：EP1493019B1

公开(公告)日：2006-08-16

申请号：EP03720420.3

申请日：2003-04-03

Applicant: Johann Wolfgang Goethe-Universität Frankfurt am Main

Inventor： MÄNTELE, Werner ,  KLEIN, Oliver ,  ZSCHERP, Christian ,  BARTH, Dr. Andreas ,  VON LILIENFELD-TOAL, Hermann ,  VON PROLLIUS, Hellmuth ,  VON GERMAR, Frithjof ,  OFFERMANNS, Heribert

IPC: G01N21/55 ,  G01N21/35

CPC classification number: G01N21/552 ,  G01J3/45 ,  G01J2003/425 ,  G01N21/3577 ,  G01N21/85

Abstract: The invention relates to an infrared measuring device, especially for the spectrometry of aqueous systems. Said device comprises at least one measuring unit, especially a measuring cell, also comprising at least one ATR-body and at least one infrared light source. The measuring unit contains at least one ATR-body which comprises at least two planar, substantially parallel limiting surfaces and which is transparent with respect to measuring radiation and which has an index of refraction which is greater than that of the medium which is arranged next to at least one limiting surface and which is to be examined, especially larger or equal to 1.5. The IR-measuring radiation on at least one of the planar, parallel limiting surfaces of the ATR-body can be totally reflected in an attenuated manner by at least six times.

公开(公告)号：EP1649243A2

公开(公告)日：2006-04-26

申请号：EP04776917.9

申请日：2004-06-14

Applicant: Cymer, Inc.

Inventor： RAFAC, Robert, J.

IPC: G01B9/02

CPC classification number: G01J3/02 ,  G01J1/4257 ,  G01J3/027 ,  G01J3/28 ,  G01J3/45 ,  G01J9/00 ,  H01S3/1305 ,  H01S3/225

Abstract: An apparatus (10) and method for controlling a laser System (12) is disclosed with a spectrometer (24, 30) having an optical bandwidth measuring unit (24) such as an etalon. The optical bandwidth measuring unit (24) outputs a measured parameter (32) and a reported parameter (36) is calculated by: Reported Parameter ('RP') = A * (Measured Parameter ('MP')) + C where A and C are determined based upon calibration of the optical bandwidth measuring unit (24) MP response for light of known valued of RP