Abstract:
A method of fabricating an amorphous silicon thin film is provided to reduce the number of a poly silicon polymerization processes by using a Wurtz-type reductive coupling. A silicon monomer is mixed in the organic solvent and a dissipative system is formed. A metallic catalyst is dispersed in the dissipative system and the polysilanes polymer is formed. The polysilanes polymer is filtered, and a poly silicon is separated. The poly silicon is dissolved in the organic solvent and the polysilanes liquid is formed. The polysilanes liquid is deposited on the substrate, and the deposited polysilanes liquid is irradiated with UV rays and an amorphous silicon thin film is formed.
Abstract:
PURPOSE: A composition for an oxide semiconductor, a preparation method of the same, a forming method of an oxide semiconductor thin film, a forming method of an electrical device, and an electrical device formed thereby are provided to simplify operational processes by improving the electric characteristic of a thin film using an existing photolithography process. CONSTITUTION: A composition for an oxide semiconductor includes an oxide semiconductor precursor and a photosensitive material. 0.1-1 mol of the photosensitive material is included in 1 mol of the oxide semiconductor precursor. A forming method of an oxide semiconductor thin film includes the following steps: the composition for the oxide semiconductor is coated on a substrate to form an oxide semiconductor thin film; the oxide semiconductor thin film is patterned; and the substrate is heat treated at 100-350 deg C. [Reference numerals] (AA) Preparing oxide semiconductor precursor; (BB) Preparing photosensitive material; (CC) Mixing
Abstract:
PURPOSE: A method for manufacturing a semiconductor thin film is provided to reduce a process cost and time by forming a semiconductor thin film on a substrate without a vacuum deposition device of high cost through a solution process. CONSTITUTION: A liquid state semiconductor layer(120) is formed on a top part of a substrate(110). A heat is selectively applied to a fixed region of a top part of the liquid state semiconductor layer. A semiconductor thin film(140) is formed by drying the liquid state semiconductor layer about a region in which a heat is applied. The liquid state semiconductor layer remaining to a different region except for the region in which the semiconductor thin film is formed is removed by organic solvent. The liquid state semiconductor layer is formed through a spin coating after photo-polymerizing a solution precursor on a top part of the substrate.
Abstract:
A method of fabricating an amorphous silicon thin film is provided to reduce the number of a poly silicon polymerization processes by using a Wurtz-type reductive coupling. A silicon monomer is mixed in the organic solvent and a dissipative system is formed. A metallic catalyst is dispersed in the dissipative system and the polysilanes polymer is formed. The polysilanes polymer is filtered, and a poly silicon is separated. The poly silicon is dissolved in the organic solvent and the polysilanes liquid is formed. The polysilanes liquid is deposited on the substrate, and the deposited polysilanes liquid is irradiated with UV rays and an amorphous silicon thin film is formed.