-
公开(公告)号:DE602004008465D1
公开(公告)日:2007-10-04
申请号:DE602004008465
申请日:2004-06-08
Applicant: QIMONDA AG , IBM
Inventor: DEBROSSE JOHN , LAMMERS STEFAN , VIEHMANN HANS-HEINRICH
-
公开(公告)号:DE60305208T2
公开(公告)日:2006-12-14
申请号:DE60305208
申请日:2003-12-17
Applicant: INFINEON TECHNOLOGIES AG , IBM
Inventor: DEBROSSE JOHN , GOGL DIETMAR , REOHR ROBERT
Abstract: A symmetrical high-speed current sense amplifier having complementary reference cells and configurable load devices that eliminates architecture-related capacitive mismatch contributions. The current sense amplifier is adapted for use in a symmetric sensing architecture and includes a configurable load device. The current sense amplifier includes a voltage comparator, a first clamping device coupled between a first input of the voltage comparator and a first input signal, the first clamping device being coupled to a reference voltage. A second clamping device is coupled between the second input of the voltage comparator and a second input signal, the second clamping device being coupled to the reference voltage. The load device may comprise a current mirror that is coupled between the first and second input of the voltage comparator. The current mirror may be configurable by select transistors. Alternatively, the load device may be a hard-wired current mirror, and a multiplexer may be used to select whether the first input signal or the second input signal is connected to a first or second side of the current mirror. Configurable dummy loads may be added at appropriate nodes to optimize the capacitive load and increase the speed of the amplifier. Equalization devices may be coupled between the first and second inputs of the voltage comparator, and between the first input signal and the second input signal.
-
公开(公告)号:DE102006001117A1
公开(公告)日:2006-08-17
申请号:DE102006001117
申请日:2006-01-09
Applicant: INFINEON TECHNOLOGIES AG , IBM
Inventor: DEBROSSE JOHN , GOGL DIETMAR , LAMMERS STEFAN , VIEHMANN HANS-HEINRICH
Abstract: A calibrated magnetic random access memory (MRAM) current sense amplifier includes a first plurality of trim transistors selectively configured in parallel with a first load device, the first load device associated with a data side of the sense amplifier. A second plurality of trim transistors is selectively configured in parallel with a second load device, the second load device associated with a reference side of the sense amplifier. The first and said second plurality of trim transistors are individually activated so as to compensate for device mismatch with respect to the data and reference sides of the sense amplifier.
-
公开(公告)号:DE69718609D1
公开(公告)日:2003-02-27
申请号:DE69718609
申请日:1997-11-25
Applicant: IBM
Inventor: DEBROSSE JOHN , KIRIHATA TOSHIAKI , WONG HING
IPC: G11C11/401 , G11C29/00 , G11C29/04 , H01L21/8242 , H01L27/108 , G06F11/20
Abstract: Row redundancy control circuits which effectively reduce design space are arranged parallel to word direction and are arranged at the bottom of the redundancy block. This architecture change makes it possible to effectively lay out the redundancy control block by introducing (1) split-global-bus shared with local row redundancy wires, (2) half-length-one-way row redundancy-wordline-enable-signal wires which allows space saving, and (3) distributed wordline enable decoders designed to take advantage of the saved space. An illegal normal/redundancy access problem caused by the address versus timing skew has also been solved. The timing necessary for this detection is given locally by using its adjacent redundancy match detection. This allows the circuit to operate completely as an address driven circuit, resulting in fast and reliable redundancy match detection. In addition, a sample wordline enable signal (SWLE) is generated by using row redundancy match detection. One two-input OR gate allows the time at which SWLE sets sample wordline (SWL) to be the same as the time at which wordline enable (WLE) signal sets wordline (WL). The time at which SWLE sets SWL remains consistent regardless of mode, eliminating the existing reliability concern. This two-input OR gate combined with row redundancy match detection works as an ideal sample wordline enable generator.
-
-
-