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    24.
    发明专利
    未知

    公开(公告)号：DE102007053199A1

    公开(公告)日：2009-05-14

    申请号：DE102007053199

    申请日：2007-11-06

    Applicant: LEICA MICROSYSTEMS

    Inventor： SEYFRIED VOLKER

    IPC: G02F1/11 ,  G01B9/02 ,  G01B11/24 ,  G02B21/00 ,  G02F1/33

    Abstract: An apparatus for controlling an acousto-optical component influencing at least one of illumination light and detection light in a microscope is described. The apparatus comprises a radio-frequency generator for supplying the acousto-optical component with a radio frequency. The radio-frequency generator is configured to compensate deviations in the characteristics of the light due to temperature fluctuations in the acousto-optical component by adapting the radio frequency. The apparatus can be operated by generating a control signal for controlling the radio frequency of the radio-frequency generator; measuring the temperature of the acousto-optical component; adapting the control signal depending on the measured temperature; and sending the adapted control signal into the radio-frequency generator for compensating deviations in the characteristics of the light due to temperature fluctuations and can be used in optical coherence tomography, particularly white light interferometry, optical tweezers in lithography, and distance measurement.

    27.
    发明专利
    未知

    公开(公告)号：DE102006009830A1

    公开(公告)日：2007-09-06

    申请号：DE102006009830

    申请日：2006-03-01

    Applicant: LEICA MICROSYSTEMS

    Inventor： GUGEL HILMAR ,  DYBA MARCUS ,  SEYFRIED VOLKER

    IPC: G01N21/64 ,  G02B21/00

    Abstract: A method for high spatial resolution examination of a sample, the sample to be examined including a substance that can be repeatedly converted from a first state into a second state, the first and the second states differing from one another in at least one optical property. The method includes: a) bringing the substance into the first state by means of a switching signal in a sample region to be recorded, b)inducing the second state by means of an optical signal, spatially delimited subregions being specifically excluded within the sample region to be recorded, c) reading out the remaining first states, and d) steps a) to c) are repeated, the optical signal being displaced upon each repetition in order to scan the sample, wherein the individual steps a) to d) are carried out in a sequence adapted to the respective measuring situation.

    30.
    发明专利
    未知

    公开(公告)号：DE10357584A1

    公开(公告)日：2005-07-07

    申请号：DE10357584

    申请日：2003-12-08

    Applicant: LEICA MICROSYSTEMS

    Inventor： SEYFRIED VOLKER ,  STORZ RAFAEL

    IPC: G02B21/06 ,  G01J3/44 ,  G02B21/00 ,  G02B21/16

    Abstract: Separating different emission wavelengths in a scanning microscope, is new. Separating different emission wavelengths in a scanning microscope comprises: (a) scanning a specimen with an illuminating light beam by passing the illuminating light beam over the specimen using a beam deflector; (b) selectively applying each of excitation wavelengths (1, 2, 3) to the illuminating light beam during the scanning according to a pre-definable illumination scheme; (c) detecting emission light coming from the specimen using detector(s), where the detector is read out upon each selective applying of a respective excitation wavelength to provide respective corresponding detected signals; and (d) associating the detected signals with the respective excitation wavelength using the illumination scheme. The emission light includes emission wavelengths corresponding to the excitation wavelengths. An independent claim is also included for an apparatus for separating different emission wavelengths in a scanning microscope, comprising: (a) light source(s) configured to generate an illuminating light beam; (b) a beam deflector configured to scan a specimen with the illuminating light beam by passing the illuminating light beam over the specimen; (c) a light control device configured to selectively apply each of excitation wavelengths to the illuminating light beam during a scanning according to a pre-definable illumination scheme; (d) detector(s) configured to pick up emission light coming from the specimen; and (e) a processing device configured to associate the detected signals with the respective excitation wavelengths using the illumination scheme.

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