Abstract:
A nonvolatile phase change memory device (1) including a memory array (2) formed by memory cells (3) arranged in rows and columns, word lines (4) connected to first terminals of memory cells (3) arranged on the same row, and bit lines (5) connected to second terminals of memory cells (3) arranged on the same column, a row decoder (6) coupled to the memory array (2) to bias the word lines (4), a column decoder (7) coupled to the memory array (2) to bias the bit lines (5), and a biasing circuit (8) coupled to the row decoder (6) and to the column decoder (7) to supply a first biasing voltage ( V A ) and a second biasing voltage ( V SS ) to the terminals of an addressed memory cell (3), wherein the first biasing voltage ( V A ) is a positive biasing voltage and the second biasing voltage ( V SS ) is a negative biasing voltage.
Abstract:
A memory device (20) of a phase change type, wherein a memory cell (2) has a memory element (3) of calcogenic material switcheable between at least two phases associated with two different states of the memory cell. A write stage (24) is connected to the memory cell and has a capacitive circuit (35) configured to generate a discharge current used as write current having no constant portion and causing the memory cell (2) to change state.