MITIGATING DEFECTS USING POLYGON ABLATION PATTERN

    公开(公告)号:US20230068903A1

    公开(公告)日:2023-03-02

    申请号:US17760289

    申请日:2021-02-05

    Applicant: View, Inc.

    Abstract: Methods of determining a polygon ablation pattern for use in mitigating one or more defects in an optical device are described. A method comprises identifying spatial coordinates of one or more defects areas in a first image of the optical device taken when tinted, defining a region of interest around at least one defect area of the one or more defect areas, and determining a polygon boundary around the at least one defect area in the region of interest to define the polygon ablation pattern.

    THIN-FILM DEVICES AND FABRICATION
    25.
    发明申请

    公开(公告)号:US20210191212A1

    公开(公告)日:2021-06-24

    申请号:US17195521

    申请日:2021-03-08

    Applicant: View, Inc.

    Abstract: Thin-film devices, for example electrochromic devices for windows, and methods of manufacturing are described. Particular focus is given to methods of patterning optical devices. Various edge deletion and isolation scribes are performed, for example, to ensure the optical device has appropriate isolation from any edge defects. Methods described herein apply to any thin-film device having one or more material layers sandwiched between two thin film electrical conductor layers. The described methods create novel optical device configurations.

    Thin-film devices and fabrication
    27.
    发明授权

    公开(公告)号:US10606142B2

    公开(公告)日:2020-03-31

    申请号:US15109624

    申请日:2014-12-31

    Abstract: Thin-film devices, for example electrochromic devices for windows, and methods of manufacturing are described. Particular focus is given to methods of patterning optical devices. Various edge deletion and isolation scribes are performed, for example, to ensure the optical device has appropriate isolation from any edge defects. Methods described herein apply to any thin-film device having one or more material layers sandwiched between two thin film electrical conductor layers. The described methods create novel optical device configurations.

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