Abstract:
An apparatus, a microscope having an apparatus, and a method for calibration of a photosensor chip (19) are disclosed. The apparatus has a photosensor chip (19) which has a multiplicity of light-sensitive elements. A reference light source (30) is provided and directs the light at at least one part of the photosensor chip (19). In addition, an open-loop or closed-loop control unit (19a) is provided and determines and corrects variances between the individual light-sensitive elements.
Abstract:
In an embodiment according to the present invention, a coronagraph for detecting reflective bodies external to a light source is provided. A first mirror for directing a beam of light onto an occulting mask is adjusted based on a data from a fiber optic sensor or a second sensor. An occulting mask for separating the beam into a first and second portion directs the first portion onto a fiber optic sensor and the second portion onto a Lyot stop. The occulting mask is adjustable based on data from the second sensor. The Lyot stop separates the second portion of the beam into a third and fourth portion. The Lyot stop also directs the third portion of the beam onto the second sensor and the fourth portion of the beam onto a camera for detecting one or more reflective bodies external to a light source.
Abstract:
Sistema y método para la medida y monitorización de la contaminación lumínica del cielo nocturno y configurado para cuantificar con exactitud e instantáneamente los niveles de contaminación lumínica a través del brillo artificial del fondo de cielo usando un sistema que comprende una cámara digital así como una pluralidad de filtros interferenciales. El patrón de medida será la radiación emitida por cualquier lámpara de calibración de flujo conocido en el interior de una esfera integradora. La cara interna de una esfera integradora es lambertiana, esto garantiza que la luz reflejada por la misma es dispersada uniformemente en todas direcciones y que no se pierde nada de la radiación luminosa emitida por la lámpara al ser su factor de reflexión muy cercano al 100%.
Abstract:
An apparatus for optically measuring samples, including a radiation source configured to form an excitation beam in an excitation channel, a detector configured to detect an emission beam in an emission channel and a filter configured to be located, in an excitation position, in the excitation channel, and in an emission position, in the emission channel. The apparatus further includes a first filter storage comprising a first setof filter storage positions, a second filter storage comprising a second set of filter storage positions,and a filter transfer mechanism configured to move the filter between the excitation position, the emission position, the first set of filter storage positions and the second set of filter storage positions.
Abstract:
Various embodiments include systems and methods to provide selectable variable gain to signals in measurements using incident radiation. The selectable variable gain may be used to normalize signals modulated in measurements using incident radiation. The selectable variable gain may be attained using a number of different techniques or various combinations of these techniques. These techniques may include modulating a modulator having modulating elements in which at least one modulating element acts on incident radiation differently from another modulating element of the modulator, modulating the use of electronic components in electronic circuitry of a detector, modulating a source of radiation or combinations thereof. Additional apparatus, systems, and methods are disclosed.
Abstract:
An apparatus for measuring an optical component (160, 170, 190) of the apparatus, the apparatus comprising a radiation source (130) configured to form a measuring beam in a measuring channel (140), wherein the measured optical component configured to be in a first position outside the measuring channel and in a second position in the measuring channel; a first detector (110) configured to receive beams in the measuring channel; a second detector (150) configured to receive beams in the measuring channel; at least one processor; and at least one memory including computer program code. The at least one memory and the computer program code are configured to, with the at least one processor, cause the apparatus at least to select at least one of the first detector and the second detector to receive beams in the measuring channel, the measuring channel (140) being integrated to a photometer or a fluorescence channel of the apparatus; receive a first beam, using the selected detector, in the measuring channel, wherein the measured optical component is in the first position; receive a second beam, using the selected detector, in the measuring channel, wherein the measured optical component is in the second position; and determine the characteristics of the optical component based on the first beam and the second beam.
Abstract:
The disclosure is directed to a system and method for determining at least one characteristic of an illumination beam emanating from an illumination source. A substrate having a plurality of apertures may be actuated through an illumination beam so that apertures at different spatial offsets are scanned through the illumination beam at one or more levels of focus. Portions of illumination directed through scanned apertures may be received by at least one detector. At least one characteristic of the illumination beam may be extracted from data points associated with intensity levels associated with detected portions of illumination. Furthermore, multiple determinations of a beam characteristic made over a period of time may be utilized to calibrate the illumination source.
Abstract:
Provided is an optical wavelength power meter for simultaneously measuring an optical wavelength and optical power in an optical communication system or a mobile communication system. The optical wavelength power meter includes an optical input unit, an optical unit, a display unit, and a measurement circuit unit. The optical input unit receives a light with multi-wavelength from a measurement target. The optical unit filters a light with multi-wavelength input from the optical input unit into a light with a single-wavelength band in response to a control signal. The display unit displays the measured optical wavelength and optical power. The measurement circuit unit controls the optical unit, receives a light with each single-wavelength band filtered at the optical unit to calculate optical power for each wavelength band, and displays the optical power on the display unit. Therefore, the optical wavelength power meter can be conveniently used for measuring an optical wavelength and power in the installation and maintenence of an optical communication system, greatly reducing the operation time needed for optical measurement and remarkably improving the operation environment. In addition, the optical wavelength power meter requires a small number of optical components and is inexpensive. Furthermore, the optical wavelength power meter is adequate to the miniaturization because of the simplified structure, and has the good extensibility of an optical wavelength band and the good extensibility of multi-channel due to high density of wavelength multiplexing.
Abstract:
Electronic devices may be provided with light sensors. Light sensors may be proximity sensors or ambient light sensors. Proximity sensors may include a light-emitting component and a light-sensitive component. The electronic device may include an enclosure formed from housing structures and some or all of a display for the device. The enclosure may include openings such as openings formed from clusters of smaller openings. Each light sensor may receive light through one of the clusters of openings. The light sensor may receive the light directly through the openings or may receive light that passes through the openings and is guided to the light sensor by light guiding structures. The light guiding structures may include fiber optic structures or light-reflecting structures. Fiber optic structures may fill or partially fill the openings. Light reflecting structures may be machined cavities in an internal support structure.
Abstract:
An apparatus for optically measuring samples, including a radiation source configured to form an excitation beam in an excitation channel, a detector configured to detect an emission beam in an emission channel and a filter configured to be located, in an excitation position, in the excitation channel, and in an emission position, in the emission channel. The apparatus further includes a first filter storage comprising a first set of filter storage positions, a second filter storage comprising a second set of filter storage positions, and a filter transfer mechanism configured to move the filter between the excitation position, the emission position, the first set of filter storage positions and the second set of filter storage positions.