Abstract:
A Raman spectrum inspection apparatus and a security monitoring method for a Raman spectrum inspection apparatus are provided. The Raman spectrum inspection apparatus includes: a laser device configured to emit an exciting light; an optical device configured to guide the exciting light to an object to be detected and collect a light signal from the object; a spectrometer configured to split the collected light signal to generate a Raman spectrum of the object; and a security detector configured to detect an infrared light emitted from the object.
Abstract:
Microfluidic devices for analyzing droplets are disclosed. A described microfluidic device includes a substrate and a microfluidic channel formed on the substrate. The microfluidic channel includes passages where each passage has a mask pattern configured to modulate a signal of a droplet passing through that passage, such that droplets passing through the passages produce signals. The microfluidic device also includes a detector configured to detect the signals. Methods of analyzing droplets with a microfluidic device having a microfluidic channel formed on a substrate are disclosed. A described method includes passing droplets through the passages, modulating signals from the droplets using mask patterns, formed on the passages; and detecting the signals.
Abstract:
A system and a method for optimizing an iris setting, used in combination with a lamp, for each excitation wavelength for each carousel run in an apparatus for identifying and measuring bacteria in biological samples. The system includes a feedback control loop positioned between a filter wheel and an optical cup for measuring the intensity level of the excitation wavelength, and feeding this information to an iris having an iris setting control device such that the iris setting may be adjusted based upon the measured intensity level to control and optimize the level of light fed to the filter wheel from the lamp. The iris setting can be adjusted so that the level of light fed to the filter wheel remains constant during the lifetime of the lamp and to ensure that the level of light fed to the sample remains below the level at which photo-bleaching occurs.
Abstract:
A confocal inspection system can optically characterize a sample. An objective lens, which can be a single lens or a combination of separate illumination and collection lenses, can have a pupil. The objective lens can deliver incident light to the sample through an annular illumination region of the pupil, and can collect scattered light returning from the sample to form collected light. Confocal optics can be positioned to receive the collected light. A detector can be configured with the confocal optics so that the detector generates signals from light received from a specified depth at or below a surface of the sample and rejects signals from light received from depths away from the specified depth. An optical element, such as a mask, a reconfigurable panel, or the detector, can define the annular collection region to be non-overlapping with the annular illumination region in the pupil.
Abstract:
La présente invention concerne un spectromètre (100) pour l'analyse du spectre d'un faisceau lumineux amont (1) comportant une fente d'entrée (101), des moyens de collimation (110) adaptés à générer, à partir du faisceau lumineux amont, un faisceau lumineux collimaté (10), caractérisé en ce qu'il comprend également : - un réseau de diffraction à séparation de polarisation (120) adapté à diffracter pour chaque longueur d'onde (l1, l2) du spectre du faisceau lumineux amont le faisceau lumineux collimaté en un premier faisceau lumineux diffracté (11, 12) et en un deuxième faisceau lumineux diffracté (21, 22), - des moyens optiques de recombinaison (130) comprenant une surface plane de réflexion optique (130) perpendiculaire au réseau adaptée à dévier au moins le deuxième faisceau lumineux diffracté, et - des moyens de focalisation (140) adaptés pour focaliser, à chaque longueur d'onde, le premier faisceau lumineux diffracté et le deuxième faisceau lumineux diffracté sur une même surface de focalisation (141).
Abstract:
The invention relates to a sample analysis apparatus. The apparatus comprises: a radiation system to irradiate the sample in a vial and an analyser with a camera to analyse the radiation received from the sample in the vial. The apparatus is provided with a holder to releasable hold the vial and with an optical path for the radiation system to irradiate the sample and for the camera to make images of the sample. The radiation system can be used for front lighting of the sample in the vial or for back lighting of the sample in the vial. The camera may be provided with a telecentric lens.
Abstract:
In one aspect of the present disclosure, an illumination system for a sample includes a sample plane in which a sample to be illuminated can be arranged, an illumination device arranged to illuminate a sample in the sample plane, the illumination device being arranged in a Koehler configuration, the illumination device comprising a light source, optics arranged to guide light from the light source to the sample plane, a homogenizer disposed between the light source and the optics having an input face for receiving light from the light source and an output face for outputting light towards the optics, the homogenizer being configured to provide a spatially and angularly homogeneous output light distribution.
Abstract:
A polarized light imaging apparatus for separating light from a superficial single-scattering layer of a sample and its deeper diffuse layer as a function of space is disclosed. The apparatus has a light source for producing light beams; an illumination optic coupled to the light source for guiding the light beams towards the sample; a linear polarizer coupled to the illumination optic; a non-total internal reflection (TIR) birefringent polarizing prism (BPP) communicatively coupled to the sample to maximize a refraction difference between ordinary waves and extraordinary waves of light returning from the sample; and a detection optic unit coupled to the non-TIR BPP for guiding the light waves returning from the sample towards a single polarization sensitive sensor element.