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    Spectrophotometer
    311.
    发明专利
    Spectrophotometer 审中-公开

    公开(公告)号：JP2004309146A

    公开(公告)日：2004-11-04

    申请号：JP2003098804

    申请日：2003-04-02

    Applicant: Olympus Corp ,  オリンパス株式会社

    Inventor： SHIMIZU ETSURO ,  KOMINE HITOSHI

    IPC: G01J3/20 ,  G01J3/02 ,  G01J3/28 ,  G02B5/18 ,  H01L31/02

    CPC classification number: G01J3/2803 ,  G01J3/02 ,  G01J3/0256 ,  G01J3/0259

    Abstract: PROBLEM TO BE SOLVED: To provide a highly reliable, low-cost spectrophotometer for performing a high-performance and high-stability measurement while maintaining high positional accuracy on optical components and compactness.
    SOLUTION: This spectrophotometer is equipped with a light guide 2, a light inlet slit 3 for inletting inlet light into the light guide, a diffraction grating 4 for dispersing the inlet light inlet into the light guide, and a photodiode array 6 for detecting the inlet light dispersed by the diffraction grating. The spectrophotometer is structured by integrally forming the light guide, the inlet slit, and the light guide, with a light guide substrate 1, and mounting a photoelectric transducer substrate 7 with the photodiode array mounted on a mount part 5 provided on the guide substrate.
    COPYRIGHT: (C)2005,JPO&NCIPI

    AN INTERFEROMETER WITH ABSORBING LAYER
    315.
    发明公开
    AN INTERFEROMETER WITH ABSORBING LAYER 审中-实审

    公开(公告)号：EP4375629A1

    公开(公告)日：2024-05-29

    申请号：EP22214975.9

    申请日：2022-12-20

    Applicant: Murata Manufacturing Co., Ltd.

    Inventor： KAAJAKARI, Ville

    IPC: G01J3/26 ,  G01J3/02 ,  G01J3/453 ,  G02B26/00 ,  G01N21/3504

    CPC classification number: G01J3/26 ,  G02B26/001 ,  G01N21/3504 ,  G01J3/4535 ,  G01J3/0256 ,  G02B26/007

    Abstract: The disclosure relates to a micromechanical Fabry-Perot interferometer, wherein the interferometer comprises an at least partly transparent substrate; an illuminated area where the light is passed through the substrate; a reflector on the top surface of the substrate in the illuminated area; an absorbing reflector layer above the reflector in the illuminated area, which absorbs at least some wavelengths of the infrared light; an arrangement for determining the temperature of the absorbing reflector layer; and at least one actuator to adjust the gap between the reflector and the absorbing reflector layer. An advantage of the interferometer of the disclosure is that absorbing reflector layer absorbs the infrared light, and no separate infrared sensor is required. Additionally multiple wavelengths can be detected due to adjustable gap between the reflector and the absorbing reflector layer.

    A PORTABLE ANALYZER USING OPTICAL EMISSION SPECTOSCOPY
    317.
    发明公开
    A PORTABLE ANALYZER USING OPTICAL EMISSION SPECTOSCOPY 审中-公开

    公开(公告)号：EP3372966A1

    公开(公告)日：2018-09-12

    申请号：EP17160322.8

    申请日：2017-03-10

    Applicant: Hitachi High-Tech Analytical Science Limited

    Inventor： PYLKKÄNEN, Tuomas ,  RÄIKKÖNEN, Esa

    IPC: G01J3/443 ,  G01J3/02 ,  G01J3/18 ,  G01J3/28 ,  G01J3/36

    CPC classification number: G01J3/0208 ,  G01J3/0256 ,  G01J3/18 ,  G01J3/2803 ,  G01J3/36 ,  G01J3/443 ,  G01N21/718

    Abstract: An optical spectrometer arrangement (200) is provided. According to an example, the optical spectrometer arrangement comprises a linear array detector (210a) for receiving light at a predefined range of wavelengths, a point detector (210b) for receiving light at a predefined wavelength that is outside said predefined range of wavelengths, and an arrangement of a collimating optical element (104), a diffracting optical element (106) , and a focusing optical element (108) that are arranged to provide at least a first optical path that guides incoming light at said predefined range of wavelengths to the linear array detector via the collimating optical element, the diffracting optical element and the focusing optical element, and a second optical path that guides incoming light at said predefined wavelength to the point detector via the collimating optical element, the diffracting optical element and one of the collimating optical element and the focusing optical element.

    SPECTROMETER, AND SPECTROMETER PRODUCTION METHOD
    318.
    发明公开
    SPECTROMETER, AND SPECTROMETER PRODUCTION METHOD 审中-公开

    公开(公告)号：EP3351912A1

    公开(公告)日：2018-07-25

    申请号：EP18159898.8

    申请日：2015-02-03

    Applicant: Hamamatsu Photonics K.K.

    Inventor： Yokino, Takafumi ,  Shibayama, Katsumi

    IPC: G01J3/02 ,  G01J3/18 ,  G01J3/36 ,  G01J3/04

    CPC classification number: G01J3/0256 ,  G01J3/021 ,  G01J3/0286 ,  G01J3/0289 ,  G01J3/0291 ,  G01J3/04 ,  G01J3/18 ,  G01J3/36

    Abstract: A spectrometer comprises a light detection element provided with a light passing part (21) and a light detection part (22); a support (30) fixed to the light detection element such that a space (S) is formed between the light passing part and the support; a first reflection part (11) provided in the support and configured to reflect light passing through the light passing part in the space; a dispersive part (42) provided in the light detection element and configured to disperse and reflect the light reflected by the first reflection part in the space; and a second reflection part (41) provided in the support and configured to reflect the light dispersed and reflected by the dispersive part to the light detection part in the space.

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