Multimodal position transformation dual-helmet MEG apparatus

    公开(公告)号:US12245858B2

    公开(公告)日:2025-03-11

    申请号:US17853827

    申请日:2022-06-29

    Abstract: A dual-helmet magnetoencephalography measuring apparatus according to an example embodiment includes: an internal container storing a liquid refrigerant; an external container disposed to surround the internal container and including a first external helmet and a second external helmet disposed to be spaced apart from each other; a first sensor-mounted helmet disposed between the external container and the internal container to surround the first external helmet; a second sensor-mounted helmet disposed between the external container and the internal container to surround the second external helmet; a plurality of first SQUID sensor modules disposed on the first sensor-mounted helmet; and a plurality of second SQUID sensor modules disposed on the second sensor-mounted helmet. The internal container and the external container are tilted in a vertical direction.

    CHARGED PARTICLE BEAM APPARATUS
    323.
    发明申请

    公开(公告)号:US20250046564A1

    公开(公告)日:2025-02-06

    申请号:US18519810

    申请日:2023-11-27

    Abstract: A charged particle beam apparatus includes: a stage on which a sample is placed; a first charged particle beam unit comprising a charged particle source, a detector, and a first objective lens configured to irradiate a sample with a charged particle beam of charged particles generated by the charged particle source and induce secondary electrons generated from the sample to the detector; and a second charged particle beam unit comprising a second objective lens. An incoming electric field is generated between the first objective lens and the sample to pull the secondary electrons into the first objective lens. An induced electric field is generated between the second objective lens and the sample to guide the secondary electrons to travel to the detector.

    Method and apparatus for measuring magnetic field and temperature using diamond nitrogen vacancy sensor

    公开(公告)号:US12130341B2

    公开(公告)日:2024-10-29

    申请号:US17991087

    申请日:2022-11-21

    CPC classification number: G01R33/032 G01R33/0017 G01R33/0082

    Abstract: Disclosed is a method and apparatus for measuring magnetic field and/or temperature using a diamond nitrogen-vacancy center sensor, and a measuring apparatus based on a diamond nitrogen-vacancy center (DNV) sensor may include: a diamond nitrogen-vacancy center sensor; a frequency synthesizer for generating a first reference signal and a second reference signal; a first microwave generator for generating a first microwave that is frequency modulated according to the first reference signal and causes a first spin transition in the diamond nitrogen-vacancy center sensor; a second microwave generator for generating a second microwave that is frequency modulated according to the second reference signal and causes a second spin transition in the diamond nitrogen-vacancy center sensor; a laser irradiator for applying a laser to excite the spin state of the diamond nitrogen-vacancy center sensor; a power amplifier for combining and amplifying the first microwave and the second microwave to apply to the diamond nitrogen-vacancy center sensor; a detector for detecting a fluorescence signal output from the diamond nitrogen-vacancy center sensor; a reference detector for measuring power of the laser; a differential circuit for outputting the difference between an output signal of the detector and an output signal of the reference detector; a first lock-in amplifier for outputting a result of comparing an output of the differential circuit with the first reference signal, and a second lock-in amplifier for outputting a result of comparing an output of the differential circuit with the second reference signal. Using the apparatus, it is possible to remove an influence of the temperature when measuring the magnetic field, and remove an influence of a change in the magnetic field when measuring the temperature, thereby enabling more precise measurement.

    SYSTEM, DEVICE, AND METHOD FOR MONITORING ABNORMAL STATE OF PIPE

    公开(公告)号:US20230366516A1

    公开(公告)日:2023-11-16

    申请号:US18246137

    申请日:2021-08-26

    CPC classification number: F17D5/06

    Abstract: The present application relates to a system, device, and method for monitoring an abnormal state of pipe, which monitors whether a pipe is abnormal. In the present application, a pipe state signal input from each signal acquisition part is divided into a plurality of time periods, and then it is determined whether an abnormal state signal exists in the pipe state signal in each of the time periods. Therefore, the present application enables determination with higher accuracy of whether the pipe is abnormal, compared to the case of determining whether an abnormal state signal exists in a pipe state signal which has not been divided into a plurality of time periods.

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