公开(公告)号：EP2748587A4

公开(公告)日：2015-05-27

申请号：EP12826303

申请日：2012-08-27

Applicant: GEN HOSPITAL CORP ,  UAB RESEARCH FOUNDATION

Inventor： ROWE STEVEN M ,  TEARNEY GUILLERMO J ,  BOUMA BRETT EUGENE ,  LIU LINBO ,  SORSCHER ERIC J ,  CHU KENGYEH KEN ,  DIEPHUIS BRADFORD JAMES ,  WILSTERMAN JR ERIC JAMES ,  DIERKSEN GREGORY ANDREW

IPC: G01N21/63 ,  A61B6/03 ,  G01B9/02 ,  G01N15/14 ,  G01N21/45 ,  G01N21/47 ,  G01N21/64 ,  G01N21/65 ,  G01N33/18 ,  G01N33/483

CPC classification number: G01N21/17 ,  G01B9/02044 ,  G01B9/0205 ,  G01B9/02091 ,  G01J3/45 ,  G01J9/02 ,  G01N15/0205 ,  G01N15/14 ,  G01N21/35 ,  G01N21/45 ,  G01N21/4788 ,  G01N21/4795 ,  G01N21/6458 ,  G01N21/6486 ,  G01N29/00 ,  G01N2021/653 ,  G01N2021/655

公开(公告)号：EP2813828A1

公开(公告)日：2014-12-17

申请号：EP14171217.4

申请日：2014-06-04

Applicant: Airbus Defence and Space SAS ,  Centre National d'Etudes Spatiales (C.N.E.S.)

Inventor： Pasternak, Frédéric

IPC: G01J3/453

CPC classification number: G01B9/02049 ,  G01B9/02015 ,  G01J3/45 ,  G01J3/4535 ,  G01J3/4537

Abstract: Un interféromètre à transformation de Fourier et à compensation d'auto-apodisation comprend au moins une paire de prismes mobiles (2 1 , 3 1 , 2 2 , 3 2 ) formant une lame dont l'épaisseur varie en même temps qu'une différence de longueur de chemin optique est elle-même variée. Les prismes sont déplacés à l'aide d'un système mobile à un seul degré de liberté, comprenant deux branches supports (10, 11) et au moins deux leviers (12, 13) articulés en rotation. L'interféromètre est adapté pour être installé à bord d'un satellite, pour analyser spectralement un rayonnement provenant de la surface de la Terre.

公开(公告)号：EP2807467A1

公开(公告)日：2014-12-03

申请号：EP13703720.6

申请日：2013-01-15

Applicant: Femtolasers Produktions GmbH

Inventor： TEMPEA, Gabriel-Florin

IPC: G01N21/41 ,  G01N21/45 ,  G01M11/00 ,  G01J3/453 ,  G02B1/11 ,  G02B5/08

CPC classification number: G01J3/45 ,  E01H5/045 ,  G01J3/4531 ,  G01J2003/283 ,  G01J2003/451 ,  G01J2003/4538 ,  G01M11/005 ,  G01N21/25 ,  G01N21/45 ,  G01N2021/4126 ,  G01N2201/126 ,  G02B1/115 ,  G02B5/0825

Abstract: Method and device for optical inspection of a sample using spectral interferometry, wherein a beam (2'') emitted by a radiation source (1) is directed onto the sample (5) and a reference beam (2') is directed onto a reference sample (4), and the spectral interference of both beams after being reflected on the samples or after passing the samples is recorded by means of a spectrograph (6); the interferogram I (ω) thus obtained is numerically derived with respect to the angular frequency ω. For the function I ` (ω) thus obtained the zeros ω
i are calculated numerically as solutions to the equation I ` (ω) = 0 and the frequency-dependent group delay τ (ω) is then calculated from the zeros ω
i according to the equation τ (ω
n ) = π / (ω
i+1 -ω
i ), wherein i = 1, 2... and ω
n = (ω
i+1 + ω
i ) /2.

公开(公告)号：EP2676109A1

公开(公告)日：2013-12-25

申请号：EP12747871.7

申请日：2012-02-14

Applicant: Luxmux Technology Corporation

Inventor： DATTNER, Yonathan ,  YADID-PECHT, Orly

IPC: G01J3/12 ,  G01J3/433 ,  G01J3/44 ,  G02B27/10 ,  G02B6/12 ,  H01L31/16

CPC classification number: G01J3/45 ,  C08L79/08 ,  G01J3/0259 ,  G01J3/44 ,  G01J3/4531 ,  G02B6/125 ,  G02B6/13 ,  G02B6/29344 ,  G02B6/2935

Abstract: A Fourier Transform Infrared (FTIR) Spectrometer integrated in a CMOS technology on a Silicon-on-Insulator (SOI) wafer is disclosed. The present invention is fully integrated into a compact, miniaturized, low cost, CMOS fabrication compatible chip. The present invention may be operated in various infrared regions ranging from 1.1 mum to 15 mum or it can cover the full spectrum from 1.1 mum to 15 mum all at once. The CMOS-FTIR spectrometer disclosed herein has high spectral resolution, no movable parts, no lenses, is compact, not prone to damage in harsh external conditions and can be fabricated with a standard CMOS technology, allowing the mass production of FTIR spectrometers. The fully integrated CMOS-FTIR spectrometer is suitable for battery operation; any and all functionality can be integrated on a chip with standard CMOS technology. The disclosed invention for the FTIR spectrometer may also be adapted for a CMOS-Raman spectrometer.

公开(公告)号：EP2631627A1

公开(公告)日：2013-08-28

申请号：EP11834338.3

申请日：2011-10-18

Applicant: Fujikura Co., Ltd.

Inventor： OGAWA Kensuke

IPC: G01M11/02

CPC classification number: G01J3/45 ,  G01M11/331 ,  G01M11/335 ,  G01M11/336

Abstract: A chromatic dispersion measurement device may include a light branching unit that divides a incident measured light signal into a first measured light signal and a second measured light signal and causes a frequency difference between the first measured light signal and the second measured light signal when the signals are output, an optical phase shifter provided in either one of the first branch path and the second branch path having a polarization maintaining characteristic and periodically changing a phase α i of the measured light signal, an optical combination unit that combines the first measured light signal and the second measured light signal and outputs an interference element of an i-th optical component obtained by interference of the first measured light signal and the second measured light signal when the phase difference is the phase α i , as a combined measured light signal, a light frequency sweep unit that performs sweep of a frequency in a frequency range for passing the combined measured light signal performs frequency decomposition to extract a spectral component in the frequency range and outputs the result of the frequency decomposition as a measured component light signal, a light detection unit that converts the measured component light signal as an interference signal, and a control unit that performs a process of sequentially acquiring the interference signal corresponding to the i-th optical component in synchronization with a change in a phase of the optical phase shifter.

Abstract translation: 色散测量装置可以包括光分支单元确实把一个入射光测量的光信号分成第一测量的光信号和第二测量的光信号，并且使所述第一测量的光信号和所述第二测量的光信号。当信号之间的频率差 输出到在所述第一分支通路中的一个和具有偏振保持特性，并周期性地改变相位±i中的测量的光信号的光学合成单元所做的第二分支路提供的光学移相器，将第一测量的光信号 和所述第二测量的光信号，并输出由所述第一测量的光信号和所述第二测量的光信号的干涉而获得的第i个光学部件的干涉元件当相位差是相位±I，作为组合的测得的光信号， 光频率扫描单元做了频率的执行扫描在适合的频率范围 荷兰国际集团的组合测量的光信号进行频率分解以提取在频率范围内的频谱分量和频率分解作为测定成分光信号的结果输出，光检测单元所做的测量的成分光信号转换为干扰信号，和 控制单元没有执行获取顺序地干扰信号对应于第i个光学部件同步地在光移相器的相位的变化的处理。

公开(公告)号：EP1658516B1

公开(公告)日：2012-11-21

申请号：EP04776567.2

申请日：2004-06-14

Applicant: Cymer, Inc.

Inventor： RAFAC, Robert, J.

IPC: G01B9/02 ,  G01J1/42

CPC classification number: G01J3/02 ,  G01J3/0205 ,  G01J3/027 ,  G01J3/28 ,  G01J3/45

公开(公告)号：EP2324342A4

公开(公告)日：2012-10-31

申请号：EP09810106

申请日：2009-08-31

Applicant: FUJIREBIO KK

Inventor： HIMMELHAUS MICHAEL

IPC: G01N21/45

CPC classification number: G01N21/7746 ,  G01J3/02 ,  G01J3/0205 ,  G01J3/45 ,  G01N21/45 ,  G01N2021/7779

公开(公告)号：EP2479546A1

公开(公告)日：2012-07-25

申请号：EP12151624.9

申请日：2012-01-18

Applicant: Howard Hughes Medical Institute

Inventor： Meng, Cui

IPC: G01J9/00 ,  G02B21/36 ,  G02B26/06

CPC classification number: G01B9/02091 ,  A61B5/0062 ,  A61B5/0066 ,  G01J3/45 ,  G01J9/02 ,  G01J9/04 ,  G02B26/06 ,  G02B27/0031

Abstract: An apparatus includes a transverse scanning optical system in the path of a first light beam traveling along a first optic axis; a wavefront correction system in the path of a second light beam traveling along a second optic axis, the wavefront correction system including a wavefront correction device having a spatial phase profile on its surface; a beam combiner that receives the first light beam and the second light beam and outputs an interference beam having a beat frequency equal to a difference frequency between the first light beam and second light beam; and a detection system placed relative to a random scattering medium, which is in the path of the interference beam. The detection system detects measurement light produced by the random scattering medium while the interference beam strikes the random scattering medium.

Abstract translation: 一种装置包括在沿着第一光轴行进的第一光束的路径中的横向扫描光学系统; 在沿第二光轴行进的第二光束的路径中的波前校正系统，所述波前校正系统包括在其表面上具有空间相位轮廓的波前校正装置; 接收第一光束和第二光束的光束组合器，并且输出具有等于第一光束和第二光束之间的差分频率的拍频的干涉光束; 以及相对于在干涉光束的路径中的随机散射介质放置的检测系统。 检测系统检测由随机散射介质产生的测量光，同时干涉光束照射随机散射介质。

公开(公告)号：EP2473824A1

公开(公告)日：2012-07-11

申请号：EP10747222.7

申请日：2010-08-30

Applicant: Centre National d'Etudes Spatiales ,  Thales

Inventor： BUIL, Christian ,  BUFFET, Laurence ,  BELON, Bruno ,  DEGRELLE, Cyril ,  BUISSET, Christophe ,  SIMEONI, Denis

IPC: G01J3/02 ,  G01J3/45 ,  G01J3/453

CPC classification number: G01J3/45 ,  G01J3/02 ,  G01J3/0205 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0297 ,  G01J3/4532 ,  G01J3/4535

Abstract: The invention relates to a field-compensated interferometer (1) including an optical assembly (2) for directing incident light beams (4) having a field angle θ relative to an optical axis of the interferometer (1), into arms (5, 6) of the interferometer, and a beam splitter (12), the arms (5, 6) including at least one mechanically movable optical device (15, 16) for generating a variable optical path difference between beams generated by the separation of each incident beam (4) using said beam splitter (12), said interferometer (1) being characterized in that it includes at least one field compensation optical element (E) arranged in one or the other of the image focal planes of the optical assembly (2), said image focal planes being combined relative to the beam splitter (12), said element (E) including at least one surface (9) that is curved so as to generate a path difference between the incident beams having a non-zero field angle and the incident beams having a zero field angle, the generated path difference making it possible to compensate for the self-apodization resulting from the field angle.

公开(公告)号：EP1488216B1

公开(公告)日：2011-02-16

申请号：EP03712371.8

申请日：2003-03-19

Applicant: QinetiQ Limited

Inventor： Hayward, Stephen David, QinetiQ Malvern ,  Cox, Timothy Ingram, QinetiQ Malvern ,  Anderson, Marie Harper, QinetiQ Malvern

IPC: G01N21/45 ,  G01N21/43

CPC classification number: G01N21/45 ,  G01J3/45

Abstract: A method for detecting perturbation of a physical system from a reference state associated with a reference parameter (ω0) to a perturbed state associated with a perturbed parameter (ω) includes firstly deriving the reference parameter (ω0). A reference vector (F ) is then derived which describes the system's state at the reference parameter (ω0.)A measurement-related vector (Z) associated with a perturbed state of the system is then subtracted from the reference vector (F ) to provide an error vector (E). The error vector members are summed and normalised by division by a summation of elements of a vector (F’) representing a derivative (f'(ω0,δω)e) of a reference function (f(ω0,δω)e) itself represented by the reference vector (F), the derivative (f'(ω0,δω)e) being evaluated at the reference parameter (ω0). This provides a result equal to the difference ( ω - ω0 ) between the perturbed parameter (ω) and the reference parameter (ω0)