DOUBLE GRATING THREE DIMENSIONAL SPECTROGRAPH WITH MULTI-DIRECTIONAL DIFFRACTION
    351.
    发明申请
    DOUBLE GRATING THREE DIMENSIONAL SPECTROGRAPH WITH MULTI-DIRECTIONAL DIFFRACTION 审中-公开
    具有多方向衍射的三维三维光谱法

    公开(公告)号:WO2005106411B1

    公开(公告)日:2005-12-29

    申请号:PCT/US2005013910

    申请日:2005-04-22

    CPC classification number: G01J3/18 G01J3/02 G01J3/0229 G01J3/04

    Abstract: A spectrograph with a first concave spectrographic diffraction grating is positioned to receive light from an input light source. The first concave spectrographic diffraction grating is configured to provide a diffracted light output dispersing the components of the input light source in a first dispersion direction with a first angular orientation with respect to the plane of the grating. The dispersion forms the input light into an intermediate spectrum. The intermediate spectrum is formed in a focal surface by the once diffracted light. A slit is substantially positioned on the focal surface. A second concave diffraction grating is positioned to receive once diffracted light from the slit and configured to provide a twice diffracted light output, the second concave diffraction grating dispersing the components of the input light source in a second diffraction direction with a second angular orientation with respect to the plane of the grating. The second dispersion angular orientation is different from the first dispersion angular orientation. The second dispersion forms the input light into an output spectrum.

    Abstract translation: 具有第一凹面光谱衍射光栅的光谱仪定位成接收来自输入光源的光。 第一凹面光谱衍射光栅被配置为提供衍射光输出,其以相对于光栅平面的第一角度取向在第一色散方向上分散输入光源的分量。 分散体将输入光形成中间光谱。 通过一次衍射光在中心光谱中形成中间光谱。 狭缝基本上位于焦点表面上。 第二凹面衍射光栅被定位成接收来自狭缝的一次衍射光并且被配置为提供两次衍射光输出,第二凹面衍射光栅将输入光源的分量在第二衍射方向上以第二角度取向相对于 到光栅的平面。 第二色散角取向与第一色散角取向不同。 第二个色散将输入光形成输出光谱。

    ANORDNUNG UND EIN VERFAHREN ZUR ERKENNUNG VON SCHICHTEN, DIE AUF OBERFLÄCHEN VON BAUTEILEN ANGEORDNET SIND, UND BESTIMMUNG DEREN EIGENSCHAFTEN
    352.
    发明申请
    ANORDNUNG UND EIN VERFAHREN ZUR ERKENNUNG VON SCHICHTEN, DIE AUF OBERFLÄCHEN VON BAUTEILEN ANGEORDNET SIND, UND BESTIMMUNG DEREN EIGENSCHAFTEN 审中-公开
    为了检测成分的涂层表面上的系统和方法排列,确定其性质

    公开(公告)号:WO2004106853A1

    公开(公告)日:2004-12-09

    申请号:PCT/EP2004/005446

    申请日:2004-05-21

    Abstract: Die Erfindung betrifft eine Anordnung zur Erkennung von Schichten (3; 14), die auf Oberflächen von Bauteilen bzw. Gegenständen (2) angeordnet sind, und Bestimmung der chemischen Eigenschaften und der Oberflächenbeschaffenheit dieser Schichten (3; 14). Sie umfasst eine Lichtquelle (4) zur Beleuchtung der zu untersuchenden Schicht (3; 14) auf der Bauteiloberfläche und Mittel zur Abbildung der Lichtquelle (4) über die zu untersuchende Oberfläche (3') der Schicht (3; 14) auf einen Eintrittsspalt (7). Der Eintrittsspalt (7) wird wellenlängenabhängig durch ein Gitter (10) auf eine zweidimensionale Detektoreinheit (8) abgebildet. Eine Auswerteeinheit (11), die mit der Detektoreinheit (8) elektrisch verbunden ist, dient zur Auswertung und Verarbeitung der von den belichteten Detektorelementen (9) der Detektoreinheit (8) gelieferten Signale.

    Abstract translation: 本发明涉及一种用于检测层的装置(3; 14),其被设置在表面或物体(2),和化学性能的测定和这些层(3; 14)的表面状态。 它包括一个光源(4),用于照射被检查层(3; 14)在构件表面上,以及用于将所述层(3; 14)(4)在所述检查表面(3“)成像光源到一个入口狭缝( 7)。 入口狭缝(7)是成像的二维检测器单元(8)上依赖于波长的由网格(10)。 评估单元(11),其被电连接到检测器单元(8),用于提供到检测器单元(8)的暴露的检测器元件(9)的评价和处理的信号。

    OPTICAL SLIT
    353.
    发明申请
    OPTICAL SLIT 审中-公开
    光学碎片

    公开(公告)号:WO2002088644A1

    公开(公告)日:2002-11-07

    申请号:PCT/GB2002/001933

    申请日:2002-04-26

    CPC classification number: G01J3/04

    Abstract: An optical slit comprises a plate with an elongate aperture, with at least one line of weakness extending from each end of the aperture towards an edge of the plate. The optical slit is secured on a supporting surface and separated into two parts along the lines of weakness. A toolpiece is used to transfer the plate to the supporting surface, the plate being releasably secured to a planar surface of the toolpiece which defines the position and planarity of the plate. The toolpiece continues to define the position and planarity of the plate whilst it is secured in place using gap-filling adhesive. The supporting surface may comprise two parts.

    Abstract translation: 光学狭缝包括具有细长孔的板,至少一条弱线从孔的每一端延伸到板的边缘。 光学狭缝被固定在支撑表面上,沿着弱线分成两部分。 使用工具将板传送到支撑表面,该板被可释放地固定到工具的平坦表面,该平面表示板的位置和平面度。 当使用间隙填充粘合剂固定到位时,工具继续限定板的位置和平面度。 支撑表面可以包括两部分。

    幅可変光学スリット機構
    354.
    发明申请
    幅可変光学スリット機構 审中-公开
    可变宽度光学缝隙机制

    公开(公告)号:WO2002066941A1

    公开(公告)日:2002-08-29

    申请号:PCT/JP2002/001431

    申请日:2002-02-19

    Inventor: 星野 栄

    CPC classification number: G01J3/04 G02B5/005

    Abstract: A variable width optical slit mechanism in which the slit width can be controlled with high accuracy over a wide temperature range. A pair of conductive carriages are supported on a conductive guide rail to move freely in noncontact state with the guide rail using an insulating roller or a pair of conductive carriages are supported on an insulating guide rail to move freely on the guide rail using a conductive roller and the pair of carriages are fixed, respectively, with a pair of conductive slit forming members. The pair of carriages are imparted with a resilient force in the direction approaching each other and the pair of slit forming members are normally brought into contact with each other so that the slit width becomes zero. At the time of forming a slip, the pair of carriages are moved in directions away from each other while resisting against the resilient force.

    Abstract translation: 可变宽度的光学狭缝机构,其可以在宽的温度范围内以高精度控制狭缝宽度。 一对导电支架支撑在导电导轨上,使用绝缘辊与导轨以非接触状态自由移动,或者一对导电支架支撑在绝缘导轨上,使用导电辊在导轨上自由移动 并且一对滑架分别与一对导电狭缝形成构件固定。 一对滑架在彼此靠近的方向上具有弹性力,并且一对狭缝形成构件通常彼此接触,使得狭缝宽度变为零。 在形成滑动时,一对滑架在抵抗弹性力的同时彼此远离的方向移动。

    OPTICAL SYSTEM AND METHOD FOR OPTICALLY ANALYZING LIGHT FROM A SAMPLE
    356.
    发明申请
    OPTICAL SYSTEM AND METHOD FOR OPTICALLY ANALYZING LIGHT FROM A SAMPLE 审中-公开
    光学系统和方法用于从样品中光分析光

    公开(公告)号:WO01086240A3

    公开(公告)日:2002-03-21

    申请号:PCT/US2001/014515

    申请日:2001-05-04

    Abstract: An optical system for analyzing light from a plurality of samples is provided. The optical system includes a plurality of holders adapted to have samples located therein, a collection lens, a transmission grating, and a reimaging lens. The collection lens is configured to receive and substantially collimate light from the samples. The transmission grating is configured to spectrally disperse the substantially collimated light from the collection lens. The reimaging lens is configured to receive the light from the light dispersing element and direct the light onto a light detection device. A method of optically analyzing at least one sample is also provided.

    Abstract translation: 提供了一种用于分析来自多个样品的光的光学系统。 光学系统包括多个保持器,其适于使样本位于其中,收集透镜,透射光栅和再成像透镜。 收集透镜被配置为接收并基本上准直来自样品的光。 透射光栅被配置为光谱地分散来自收集透镜的基本上准直的光。 该成像透镜被配置为接收来自光分散元件的光并将光引导到光检测装置上。 还提供了一种光学分析至少一个样品的方法。

    APPARATUS AND METHOD FOR MEASURING OPTICAL CHARACTERISTICS OF AN OBJECT OR MATERIAL
    357.
    发明申请
    APPARATUS AND METHOD FOR MEASURING OPTICAL CHARACTERISTICS OF AN OBJECT OR MATERIAL 审中-公开
    用于测量物体或材料的光学特性的装置和方法

    公开(公告)号:WO01046659A1

    公开(公告)日:2001-06-28

    申请号:PCT/US2000/035274

    申请日:2000-12-26

    Abstract: Low cost and form factor spectrometers are disclosed. A spectrometer comprises a substrate, a plurality of optical sensors (979), a plurality of spectral filters (977), an optical manifold (976) and one or more processing elements (980). The plurality of spectral filters (977) and the one or more processing elements (980) are mounted on the substrate. The spectral filters (977) are fixedly positioned over at least a group of the optical sensors (979) and fixedly positioned with respect to the substrate. An optical manifold (976) is fixedly positioned over the spectral filters (977). The optical manifold (976) has a plurality of exit ports and an entrance port, wherein light entering the entrance port is transmitted to an interior portion of the optical manifold (976) and a portion of the light is transmitted from the exit ports through some of the spectral filters (977). The spectrometers are disclosed embedded in printing and scanning devices, computer companion devices, scope-type devices and the like.

    Abstract translation: 公开了低成本和形状因子光谱仪。 光谱仪包括基板,多个光学传感器(979),多个光谱滤光器(977),光学歧管(976)和一个或多个处理元件(980)。 多个光谱滤光器(977)和一个或多个处理元件(980)安装在基板上。 光谱滤光器(977)固定地定位在至少一组光学传感器(979)上并相对于基板固定地定位。 光学歧管(976)固定地定位在光谱滤光器(977)上方。 光学歧管(976)具有多个出口和入口,其中进入入口的光被传送到光学歧管(976)的内部,并且一部分光从出口通过一些 的光谱滤波器(977)。 公开了将光谱仪嵌入在打印和扫描设备,计算机辅助设备,示波器类型设备等中。

    CONTROLLABLE MICRO-SLIT LINE
    358.
    发明申请
    CONTROLLABLE MICRO-SLIT LINE 审中-公开
    可控微间隙LINE

    公开(公告)号:WO99051953A1

    公开(公告)日:1999-10-14

    申请号:PCT/EP1999/002294

    申请日:1999-03-26

    CPC classification number: G01J3/04 G01J2003/2866

    Abstract: The invention relates to a controllable micro-slit line for spectrometers. A first membrane (1) is provided with n identical slits (11), whereby n > 2 and is associated with a second membrane (2) which is placed at a preferably short distance therefrom and which is divided in the direction of displacement into n areas (b1-n) each with n sub-areas (bx1-xn) where x = 1àn. At least one sub-area (bx1-xn) of each area (b1-n) is configured as a non-transparent segment and the remaining sub-areas are embodied in the form of recesses in the membrane (2). The total number of areas (b1-n) is the same as the number of slits (11) in the first membrane (1). The first and second membrane (1; 2) can be moved in such a way using means of displacement so that each slit (1) in the first membrane (1) is optically sealed at least once by one segment of the second membrane (2).

    Abstract translation: 本发明涉及一种用于分光计可控微缝隙线。 本发明的目的是提供这样一个微缝隙线路的是,实现在第一隔膜(1)被提供,其包括n个相同的柱(11),其中n> 2,第二电解质膜(2)在可能的低 与距离(S),其与正子范围(BX1-XN),分相关联,其中x = 1 ... N,在位移到n的范围(B1-n)的方向,其中至少一个子区域(BX1-X7) 每个区域(B1-N),为不透明的纸幅(ST),并且剩余的子范围中的膜(2)的凹部的形成,其特征在于,区域(B1-n)的总数是相同的柱(11)的数量在 第一隔膜(1)被固定,并且所述第一及第二电解质膜(1; 2)通过调节装置的装置可以以这样的方式移动,并且到目前为止,每个间隙(11),其在所述第一隔膜(1)并入,至少一次的光 由第二膜(2)的网(ST)关闭它 驱动器。

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