METHOD AND MEASURING SYSTEM FOR SCANNING A REGION OF INTEREST
    31.
    发明申请
    METHOD AND MEASURING SYSTEM FOR SCANNING A REGION OF INTEREST 审中-公开
    扫描区域的方法和测量系统

    公开(公告)号:WO2010055362A3

    公开(公告)日:2010-07-08

    申请号:PCT/HU2009000095

    申请日:2009-11-17

    Abstract: The invention relates to a method for scanning a region of interest, such as a portion of a neural process, via a laser scanning microscope having focusing means for focusing a laser beam and having electro-mechano-optic deflecting means for deflecting the laser beam, the method comprising: providing a primary scanning trajectory (92a) for the at least one region of interest; providing a plurality of spaced apart (89) auxiliary scanning trajectories (92b) running along the primary scanning trajectory within the region of interest; providing a scanning sequence for scanning the scanning trajectories (192); providing cross-over (94) trajectories between the scanning trajectories of two consecutive scanning trajectories in the scanning sequence. The invention further relates to a measuring system for implementing the method according to the invention.

    Abstract translation: 本发明涉及一种用于通过激光扫描显微镜扫描诸如神经过程的一部分的感兴趣区域的方法,所述激光扫描显微镜具有用于聚焦激光束并具有用于偏转激光束的电机械光学偏转装置的聚焦装置, 所述方法包括:为所述至少一个感兴趣区域提供主扫描轨迹(92a); 提供沿所述感兴趣区域内的主扫描轨迹延伸的多个间隔开的(89)辅助扫描轨迹(92b) 提供用于扫描扫描轨迹(192)的扫描序列; 在扫描序列中的两个连续扫描轨迹的扫描轨迹之间提供交叉(94)轨迹。 本发明还涉及一种用于实现根据本发明的方法的测量系统。

    LASER SCANNING MICROSCOPE
    36.
    发明申请
    LASER SCANNING MICROSCOPE 审中-公开
    激光扫描显微镜

    公开(公告)号:WO2010055363A1

    公开(公告)日:2010-05-20

    申请号:PCT/HU2009/000096

    申请日:2009-11-17

    CPC classification number: G02B21/002

    Abstract: The present invention relates to a laser scanning microscope (10) for scanning a sample, the microscope having focusing means (15) having a focal plane (29) and comprising at least one optical element for focusing a laser beam (13), drive means (18) for displacing the at least one optical element of the focusing means (15), at least one detector means (24') for detecting light (13') reflected from the sample or back fluoresced light (13') emitted by the sample, characterised by the detector means (24') being connected to the drive means (18) such that the drive means (18) may simultaneously displace the detector means (24') with the at least one optical element of the focusing means (15). The present invention further relates to a method of performing 3D scanning with the inventive laser scanning microscope.

    Abstract translation: 本发明涉及一种用于扫描样品的激光扫描显微镜(10),该显微镜具有聚焦装置(15),该聚焦装置具有焦平面(29),并包括用于聚焦激光束(13)的至少一个光学元件,驱动装置 (18),用于移动所述聚焦装置(15)的所述至少一个光学元件;至少一个检测器装置(24'),用于检测从所述样品反射的光或反射的荧光的光(13'), 样品,其特征在于检测器装置(24')连接到驱动装置(18),使得驱动装置(18)可以同时用聚焦装置的至少一个光学元件(24')移动检测器装置 15)。 本发明还涉及使用本发明的激光扫描显微镜执行3D扫描的方法。

    METHOD AND MEASURING SYSTEM FOR SCANNING MULTIPLE REGIONS OF INTEREST
    37.
    发明申请
    METHOD AND MEASURING SYSTEM FOR SCANNING MULTIPLE REGIONS OF INTEREST 审中-公开
    用于扫描多个利益区域的方法和测量系统

    公开(公告)号:WO2010055361A1

    公开(公告)日:2010-05-20

    申请号:PCT/HU2009/000094

    申请日:2009-11-17

    CPC classification number: G02B21/0036 G02B21/365 G02B26/101 G02B26/105

    Abstract: The invention relates to a method for carrying out measurements on at least one region of interest within a sample via a laser scanning microscope having focusing means for focusing a laser beam and having electro-mechano- optic deflector for deflecting the laser beam, the method comprising: providing a scanning trajectory for the at least one region of interest; providing a sequence of measurements and the corresponding scanning trajectories; providing cross-over trajectories between the scanning trajectories of two consecutive measurements; deflecting the laser beam via the electro-mechano-optic means for moving a focus spot of the focused laser beam along a scanning trajectory at an average scanning speed; and deflecting the laser beam via the electro-mechano-optic means for moving the focus spot of the laser beam along a cross-over trajectory at a cross-over speed having a maximum, the maximum of the cross-over speed being higher than the average scanning speed. The invention further relates to a measuring system for implementing the method according to the invention

    Abstract translation: 本发明涉及一种通过具有用于聚焦激光束并具有用于偏转激光束的电机械偏转器的聚焦装置的激光扫描显微镜对样品内的至少一个感兴趣区域进行测量的方法,该方法包括 :为所述至少一个感兴趣区域提供扫描轨迹; 提供测量序列和相应的扫描轨迹; 在两个连续测量的扫描轨迹之间提供交叉轨迹; 通过电机械光学装置偏转激光束,用于以平均扫描速度沿着扫描轨迹移动聚焦激光束的聚焦点; 并且经由电机械光学装置偏转激光束,用于沿着具有最大值的交叉速度沿着交叉轨迹移动激光束的聚焦点,交叉速度的最大值高于 平均扫描速度。 本发明还涉及一种用于实现根据本发明的方法的测量系统

    METHOD FOR SCANNING ALONG A 3-DIMENSIONAL LINE AND METHOD FOR SCANNING A REGION OF INTEREST BY SCANNING A PLURALITY OF 3-DIMENSIONAL LINES
    38.
    发明申请
    METHOD FOR SCANNING ALONG A 3-DIMENSIONAL LINE AND METHOD FOR SCANNING A REGION OF INTEREST BY SCANNING A PLURALITY OF 3-DIMENSIONAL LINES 审中-公开
    扫描三维线的方法和通过扫描多条三维线扫描一个感兴趣区域的方法

    公开(公告)号:WO2018042214A2

    公开(公告)日:2018-03-08

    申请号:PCT/HU2017/050035

    申请日:2017-08-31

    Applicant: FEMTONICS KFT

    Abstract: The invention relates to a method for scanning along a substantially straight line (3D line) lying at an arbitrary direction in a 3D space with a given speed using a 3D laser scanning microscope having a first pair of acousto-optic deflectors deflecting a laser beam in the x-z plane (x axis deflectors) and a second pair of acousto-optic deflectors deflecting the laser beam in the y-z plane (y axis deflectors) for focusing the laser beam in 3D. The invention further relates to a method for scanning a region of interest with a 3D laser scanning microscope having acousto-optic deflectors for focusing a laser beam within a 3D space defined by an optical axis (Z) of the microscope and X, Y axes that are perpendicular to the optical axis and to each other.

    Abstract translation: 本发明涉及一种用3D激光扫描显微镜沿3D空间中任意方向的基本上直线(3D线)以给定速度进行扫描的方法,3D显微镜具有第一对声波 -optic偏转器偏转在xz平面中的激光束(x轴的偏转器)和第二对声光偏转器偏转在yz平面中用于聚焦激光束在三维激光束(y轴的偏转器)。 本发明还涉及一种用3D激光扫描显微镜扫描感兴趣区域的方法,所述3D激光扫描显微镜具有声光偏转器,用于将激光束聚焦在由显微镜的光轴(Z)和X,Y轴限定的3D空间内, 垂直于光轴和彼此。

    COMBINED IMAGING SYSTEM AND MRI COMPATIBLE LASER SCANNING MICROSCOPE
    39.
    发明申请
    COMBINED IMAGING SYSTEM AND MRI COMPATIBLE LASER SCANNING MICROSCOPE 审中-公开
    组合成像系统和MRI兼容的激光扫描显微镜

    公开(公告)号:WO2016079547A9

    公开(公告)日:2017-07-13

    申请号:PCT/HU2015000072

    申请日:2015-11-18

    Applicant: FEMTONICS KFT

    CPC classification number: G01R33/4808 G01R33/381 G02B21/002

    Abstract: The subject of the invention relates to a combined imaging system (10') that includes a laser scanning microscope (50, 50'), and a measuring device with a lower resolution than the resolution of the laser scanning microscope (50, 50') and that measures over a larger spatial scale than the spatial scale of the laser scanning microscope (50, 50'). The subject of the invention also relates to an MRI compatible laser scanning microscope which comprises: deflecting means (24') for deflecting a laser beam (13), objective (28'), adjustable objective arm (38), distance adapter (39) and at least one detector (30'). The essence of the MRI compatible laser scanning microscope is that at least the objective (28'), the adjustable objective arm (38), the distance adapter (39) and the at least one detector (30') are made from non-magnetisable materials and the deflecting means (24') is magnetically shielded.

    Abstract translation: 本发明的主题涉及包括激光扫描显微镜(50,50')和分辨率低于激光扫描显微镜(50,50')的分辨率的测量装置的组合成像系统(10'), 并且在比激光扫描显微镜(50,50')的空间尺度更大的空间尺度上进行测量。 本发明的主题还涉及MRI兼容的激光扫描显微镜,其包括:用于偏转激光束(13)的偏转装置(24'),物镜(28'),可调物镜臂(38),距离适配器(39) 和至少一个检测器(30')。 MRI兼容激光扫描显微镜的本质在于至少物镜(28'),可调物镜臂(38),距离适配器(39)和至少一个检测器(30')由不可磁化的 材料和偏转装置(24')被磁屏蔽。

    COMBINED IMAGING SYSTEM AND MRI COMPATIBLE LASER SCANNING MICROSCOPE
    40.
    发明申请
    COMBINED IMAGING SYSTEM AND MRI COMPATIBLE LASER SCANNING MICROSCOPE 审中-公开
    组合成像系统和MRI兼容激光扫描显微镜

    公开(公告)号:WO2016079547A1

    公开(公告)日:2016-05-26

    申请号:PCT/HU2015/000072

    申请日:2015-11-18

    Applicant: FEMTONICS KFT.

    CPC classification number: G01R33/4808 G01R33/381 G02B21/002

    Abstract: The subject of the invention relates to a combined imaging system (10') that includes a laser scanning microscope (50, 50'), and a measuring device with a lower resolution than the resolution of the laser scanning microscope (50, 50') and that measures over a larger spatial scale than the spatial scale of the laser scanning microscope (50, 50'). The subject of the invention also relates to an MRI compatible laser scanning microscope which comprises: deflecting means (24') for deflecting a laser beam (13), objective (28'), adjustable objective arm (38), distance adapter (39) and at least one detector (30'). The essence of the MRI compatible laser scanning microscope is that at least the objective (28'), the adjustable objective arm (38), the distance adapter (39) and the at least one detector (30') are made from non-magnetisable materials and the deflecting means (24') is magnetically shielded.

    Abstract translation: 本发明的主题涉及一种包括激光扫描显微镜(50,50')的组合成像系统(10')和具有比激光扫描显微镜(50,50')的分辨率低的分辨率的测量装置, 并且在比激光扫描显微镜(50,50')的空间尺度更大的空间尺度上进行测量。 本发明的主题还涉及一种MRI兼容的激光扫描显微镜,其包括:偏转装置(24'),用于偏转激光束(13),物镜(28'),可调节目标臂(38),距离适配器(39) 和至少一个检测器(30')。 MRI兼容激光扫描显微镜的本质是至少物镜(28'),可调节目标臂(38),距离适配器(39)和至少一个检测器(30')由不可磁化的 材料和偏转装置(24')被磁屏蔽。

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