Sample collection device and manufacturing method thereof

    公开(公告)号:US10379075B2

    公开(公告)日:2019-08-13

    申请号:US15173731

    申请日:2016-06-06

    Abstract: A sample collection device includes two substrates and a spacer. The two substrates are disposed oppositely. Each substrate has a first surface, a second surface opposing to the first surface, a first recess and at least one second recess. The two substrates are arranged with the first surfaces facing each other, and the first and second recesses are respectively located on each first surface. The first recesses of the substrates jointly form a first channel, and the second recesses of the substrates jointly form a second channel connected to the outside of the sample collection device. The first channel and the second channel are interconnected. The spacer is disposed between the two first surfaces for bonding and fixing the two substrates. A sample containing space is formed between the two substrates and the spacer. The sample containing space includes the first chancel and the second channel. In addition, a manufacturing method of the sample collection device is also provided.

    Manufacturing method of embedded sample block and sample sheet

    公开(公告)号:US09835530B1

    公开(公告)日:2017-12-05

    申请号:US15331917

    申请日:2016-10-24

    Inventor: Hung-Jen Chen

    CPC classification number: G01N1/36 G01N2001/364 G01N2001/366 H01J37/26

    Abstract: A manufacturing method of an embedded sample block includes providing a carrier. The carrier has a sample accommodating area and a marking area. The sample accommodating area has a first groove and the marking area has second grooves. A sample is disposed in the first groove and a molding plate standing around the carrier is formed. The molding plate surrounds the sample accommodating area and the marking area and forms an opening exposing the sample, the first groove and the second grove. A molding material is formed inside the opening, such that the molding material covers the sample and is filled into the first and second grooves. The molding material is solidified and the molding plate is removed to obtain the embedded sample block. In addition, a sample sheet sliced from the embedded sample block is also mentioned.

    DIMENSION CALCULATION METHOD FOR A SEMICONDUCTOR DEVICE
    35.
    发明申请
    DIMENSION CALCULATION METHOD FOR A SEMICONDUCTOR DEVICE 有权
    一种半导体器件的尺寸计算方法

    公开(公告)号:US20150228065A1

    公开(公告)日:2015-08-13

    申请号:US14175278

    申请日:2014-02-07

    Inventor: Sajal BIRING

    Abstract: An automatic calculation method for thickness calculation of a deposition layer in a Fin-type field-effect transistor (FinFET) is disclosed through mapping edge lines onto an Excel spreadsheet. The similar method is also applied to the thickness calculation of superlattice or multiple quantum well for a light emitting diode (LED). The edge lines are obtained and transformed from an electronic image taken by Transmission Electron Microscopy (TEM), Focus Ion Beam (FIB), Atomic Force Microscopy (AFM), or X-Ray Diffraction (XRD) of the device.

    Abstract translation: 通过将边缘线映射到Excel电子表格上,公开了Fin型场效应晶体管(FinFET)中的沉积层的厚度计算的自动计算方法。 类似的方法也适用于发光二极管(LED)的超晶格或多量子阱的厚度计算。 从透射电子显微镜(TEM),聚焦离子束(FIB),原子力显微镜(AFM)或X射线衍射(XRD)获得的电子图像获得边缘线并进行变换。

    樣品固定治具及其操作方法
    37.
    发明专利
    樣品固定治具及其操作方法 审中-公开
    样品固定治具及其操作方法

    公开(公告)号:TW201732257A

    公开(公告)日:2017-09-16

    申请号:TW105106089

    申请日:2016-03-01

    Abstract: 一種樣品固定治具,其適於載入第一樣品至穿透式電子顯微鏡的腔體內。樣品固定治具包括本體、樣品預置裝置以及樣品傳送裝置。本體適於與腔體結合而形成密閉空間於腔體內。本體具有適於插入腔體的插入部以及保持於腔體外的外接部。樣品預置裝置配置於本體內,用以承載第一樣品。樣品傳送裝置配置於本體內,並且樣品傳送裝置耦接於樣品預置裝置,用以將樣品預置裝置上的第一樣品依序傳送到密閉空間的觀察區,並將觀察後的第一樣品由觀察區依序傳送回樣品預置裝置。此外,一種樣品固定治具的操作方法亦被提及。

    Abstract in simplified Chinese: 一种样品固定治具,其适于加载第一样品至穿透式电子显微镜的腔体内。样品固定治具包括本体、样品预置设备以及样品发送设备。本体适于与腔体结合而形成密闭空间于腔体内。本体具有适于插入腔体的插入部以及保持于腔体外的外置部。样品预置设备配置于本体内,用以承载第一样品。样品发送设备配置于本体内,并且样品发送设备耦接于样品预置设备,用以将样品预置设备上的第一样品依序发送到密闭空间的观察区,并将观察后的第一样品由观察区依序发送回样品预置设备。此外,一种样品固定治具的操作方法亦被提及。

    樣品製備系統及製備方法
    39.
    发明专利
    樣品製備系統及製備方法 审中-公开
    样品制备系统及制备方法

    公开(公告)号:TW201814269A

    公开(公告)日:2018-04-16

    申请号:TW105132189

    申请日:2016-10-05

    Abstract: 一種樣品製備系統包括切片模組、第一水槽、定序模組以及取放模組。切片模組用於對樣品塊進行連續切片,以產生多個樣品試片。第一水槽用來接收樣品試片,且樣品試片適於漂浮於第一水槽中的流體上,並隨流體的流動而移動。定序模組配置於第一水槽的一側,以依序分離樣品試片。取放模組耦接第一水槽,以依序自第一水槽中獲取樣品試片,並將其放置於相應的樣品載座上。此外,一種樣品製備方法亦被提及。

    Abstract in simplified Chinese: 一种样品制备系统包括切片模块、第一水槽、定序模块以及取放模块。切片模块用于对样品块进行连续切片,以产生多个样品试片。第一水槽用来接收样品试片,且样品试片适于漂浮于第一水槽中的流体上,并随流体的流动而移动。定序模块配置于第一水槽的一侧,以依序分离样品试片。取放模块耦接第一水槽,以依序自第一水槽中获采样品试片,并将其放置于相应的样品载座上。此外,一种样品制备方法亦被提及。

    包埋樣品塊的製造方法及樣品試片
    40.
    发明专利
    包埋樣品塊的製造方法及樣品試片 审中-公开
    包埋样品块的制造方法及样品试片

    公开(公告)号:TW201809629A

    公开(公告)日:2018-03-16

    申请号:TW105129166

    申请日:2016-09-08

    CPC classification number: G01N1/36 G01N2001/364 G01N2001/366 H01J37/26

    Abstract: 一種包埋樣品塊的製造方法包括提供載板。載板具有樣品容置區及標記區,並且樣品容置區具有第一凹槽,而標記區具有第二凹槽。配置樣品於第一凹槽中。形成模板,其立於載板外圍。模板圍繞樣品容置區及標記區,並形成暴露樣品、第一凹槽及第二凹槽的開口。形成模封材於開口中,使其包覆樣品並且填充於第一凹槽及第二凹槽中。固化模封材,並且移除模板,以得到包埋樣品塊。此外,一種以包埋樣品塊切片形成的樣品試片亦被提及。

    Abstract in simplified Chinese: 一种包埋样品块的制造方法包括提供载板。载板具有样品容置区及标记区,并且样品容置区具有第一凹槽,而标记区具有第二凹槽。配置样品于第一凹槽中。形成模板,其立于载板外围。模板围绕样品容置区及标记区,并形成暴露样品、第一凹槽及第二凹槽的开口。形成模封材于开口中,使其包覆样品并且填充于第一凹槽及第二凹槽中。固化模封材,并且移除模板,以得到包埋样品块。此外,一种以包埋样品块切片形成的样品试片亦被提及。

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