Ion trap
    33.
    发明公开
    Ion trap 审中-公开
    Ionenfalle

    公开(公告)号:EP2099058A2

    公开(公告)日:2009-09-09

    申请号:EP09000834.3

    申请日:2002-06-17

    CPC classification number: H01J3/40 H01J49/027 H01J49/406 H01J49/4245

    Abstract: A charged particle trap for trapping of a plurality of charged particles. The trap includes first and second electrode mirrors (2,3) having a common optical axis (4), the mirrors being arranged in alignment at two extremities thereof. The mirrors are capable, when voltage is applied thereto, of creating respective electric fields defined by key field parameters. The electric fields are configured to reflect charged particles causing their oscillation between the mirrors. The plurality of charged particles is introduced into the trap, along the optical axis, as a beam (10) having pre-determined key beam parameters. The key field parameters for at least one of the mirrors are chosen such as to induce bunching among charged particles in the beam.

    Abstract translation: 用于捕获多个带电粒子的带电粒子阱。 该陷阱包括具有公共光轴(4)的第一和第二电极镜(2,3),该反射镜在其两端配置成对准。 当施加电压时,反射镜能够产生由关键场参数定义的各个电场。 电场被配置为反射带电粒子,导致它们在反射镜之间振荡。 多个带电粒子沿着光轴被引入到陷阱中,作为具有预定的键束参数的光束(10)。 选择至少一个反射镜的关键场参数,以便在光束中的带电粒子之间诱导聚束。

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