公开(公告)号：US20170115205A1

公开(公告)日：2017-04-27

申请号：US15402162

申请日：2017-01-09

Applicant: H2OPTX INC.

Inventor： RUDOLF J. HOFMEISTER ,  DONALD A. ICE ,  SCOTT W. TANDY

IPC: G01N21/01 ,  G01J3/42 ,  G01J3/02 ,  G01N21/25

CPC classification number: G01J3/42 ,  B01D46/0002 ,  B01D46/42 ,  G01J3/00 ,  G01J3/0202 ,  G01J3/0205 ,  G01J3/0237 ,  G01J3/0267 ,  G01J3/0286 ,  G01J3/0291 ,  G01J3/06 ,  G01J3/10 ,  G01J3/2823 ,  G01J3/44 ,  G01N1/06 ,  G01N21/01 ,  G01N21/25 ,  G01N21/253 ,  G01N21/33 ,  G01N21/3504 ,  G01N21/3577 ,  G01N21/65 ,  G01N23/00 ,  G01N33/15 ,  G01N35/10 ,  G01N2021/0106 ,  G01N2201/0231

Abstract: An example embodiment may include a hyperspectral analyzation subassembly configured to obtain information for a sample. The hyperspectral analyzation subassembly may include one or more transmitters configured to generate electromagnetic radiation electromagnetically coupled to the sample, one or more sensors configured to detect electromagnetic radiation electromagnetically coupled to the sample, and an electromagnetically transmissive window. At least one of the sensors may be configured to detect electromagnetic radiation from the sample via the window. The hyperspectral analyzation subassembly may include an analyzation actuation subassembly configured to actuate at least a portion of the hyperspectral analyzation subassembly in one or more directions of movement with respect to the sample.

公开(公告)号：US09618452B2

公开(公告)日：2017-04-11

申请号：US14741629

申请日：2015-06-17

Applicant: National Central University

Inventor： Szu-Yu Chen ,  Poyu Su ,  Chiao-Sheng Lu ,  Yu John Hsu

IPC: G01N21/64 ,  G01J3/02 ,  G01J3/10 ,  G01J3/12 ,  G01J3/28

CPC classification number: G01N21/6458 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0229 ,  G01J3/0267 ,  G01J3/04 ,  G01J3/06 ,  G01J3/10 ,  G01J3/12 ,  G01J3/2803 ,  G01J3/2823 ,  G01J3/4406 ,  G01J2003/2813 ,  G01J2003/282 ,  G01N2021/6421 ,  G01N2021/6423 ,  G01N2021/6476 ,  G01N2021/6478

Abstract: A fluorescence hyperspectral microscopy system featuring structured illumination and parallel recording includes a light projection sub-system, a detection sub-system, and an electrical controller. The light projection sub-system includes a digital light processing (DLP) module for generating linear excitation light, a first lens set, an optical path allocation element, and an objective lens. The detection sub-system includes a second lens set, a frequency-dividing reflection element, a two-dimensional light detector, and a light collection element. With the detection sub-system performing detection in conjunction with the light projection sub-system, and the electrical controller controlling the DLP module, a two-dimensional moving platform, and the two-dimensional light detector, the fluorescence hyperspectral microscopy system provides increased resolution and can obtain accurate information in spatial and spectral dimensions and hence a four-dimensional hyperspectral image of the object under detection.

公开(公告)号：US09574938B2

公开(公告)日：2017-02-21

申请号：US13996491

申请日：2011-12-22

Applicant: Alexander F. Zazovsky ,  Mark Milkovisch ,  Toru Terabayashi

Inventor： Alexander F. Zazovsky ,  Mark Milkovisch ,  Toru Terabayashi

IPC: E21B49/10 ,  G01J3/02 ,  E21B49/00 ,  E21B49/08

CPC classification number: G01J3/0267 ,  E21B49/008 ,  E21B49/10 ,  E21B2049/085 ,  G01N33/2823

Abstract: An optical fluid analyzer tool may have an evaluation flowline which receives a flow of fluid from a geotechnical formation and may have a cleanup flowline which receives another flow of fluid from the geotechnical formation. A flow routing system may be connected to the evaluation flowline and may be connected to the cleanup flowline. The flow routing system may establish isolated flow or commingled flow for the evaluation flowline and may establish isolated flow or commingled flow for the cleanup flowline. A sample chamber may be connected to the evaluation flowline and may be connected to the cleanup flowline. A first pump module may draw the fluid from the geotechnical formation, and an optical fluid analyzer connected to the cleanup flowline and the evaluation flowline may analyze the fluid.

Abstract translation: 光学流体分析器工具可以具有评估流线，其接收来自岩土结构的流体流，并且可以具有从岩土结构接收另一流体流的净化流线。 流量路由系统可以连接到评估流程线，并且可以连接到清理流程线。 流动路线系统可以为评估流线建立隔离流或混合流，并且可以为清理流线建立隔离流或混合流。 样品室可以连接到评估流线并且可以连接到净化流线。 第一泵模块可以从岩土结构中抽取流体，并且连接到净化流线和评估流线的光学流体分析仪可以分析流体。

公开(公告)号：US09453764B2

公开(公告)日：2016-09-27

申请号：US14805221

申请日：2015-07-21

Applicant: H2Optx Inc.

Inventor： Rudolf J. Hofmeister ,  Donald A. Ice ,  Scott W. Tandy

IPC: G01N21/25 ,  G01J3/42 ,  G01J3/44 ,  G01J3/06 ,  G01J3/10 ,  B01D46/00 ,  B01D46/42 ,  G01N1/06 ,  G01N33/15 ,  G01N21/01 ,  G01N23/00 ,  G01N35/10 ,  G01N21/3504 ,  G01J3/00 ,  G01N21/33 ,  G01N21/3577 ,  G01N21/65

CPC classification number: G01J3/42 ,  B01D46/0002 ,  B01D46/42 ,  G01J3/00 ,  G01J3/0267 ,  G01J3/0291 ,  G01J3/06 ,  G01J3/10 ,  G01J3/44 ,  G01N1/06 ,  G01N21/01 ,  G01N21/25 ,  G01N21/253 ,  G01N21/33 ,  G01N21/3504 ,  G01N21/3577 ,  G01N21/65 ,  G01N23/00 ,  G01N33/15 ,  G01N35/10 ,  G01N2021/0106 ,  G01N2201/0231

Abstract: The present disclosure generally relates to systems, devices and methods for analyzing and processing samples or analytes. In one example configuration, a method of analyzing an analyte includes shaving a first layer of a plurality of layers of an analyte to expose a first surface of an analyte. The method includes positioning the first surface of the analyte over a window of a hyperspectral analyzation subassembly. The method further includes scanning the first surface of the analyte by the hyperspectral analyzation subassembly to obtain information regarding the analyte proximate the first surface. Other systems, devices and methods are disclosed herein.

Abstract translation: 本公开一般涉及用于分析和处理样品或分析物的系统，装置和方法。 在一个示例性配置中，分析分析物的方法包括剃刮分析物的多个层的第一层以暴露分析物的第一表面。 该方法包括将分析物的第一表面定位在高光谱分析子组件的窗口上。 该方法还包括通过高光谱分析子组件扫描分析物的第一表面以获得关于第一表面附近的分析物的信息。 本文公开了其它系统，装置和方法。

公开(公告)号：US20150044098A1

公开(公告)日：2015-02-12

申请号：US14374518

申请日：2013-01-30

Applicant: SCANADU INCORPORATED

Inventor： Anthony Smart ,  Brandon Woolsey ,  Aaron Alexander Rowe ,  Ivo Clarysse ,  Walter De Brouwer

IPC: G01J3/28 ,  H04N5/225 ,  G01J3/02 ,  H04N5/30

CPC classification number: G01J3/2823 ,  A61B5/0013 ,  A61B5/0064 ,  A61B5/0084 ,  G01J3/0267 ,  G01J2003/2826 ,  G01N33/483

Abstract: A hyperspectral imaging system, including: at least one hyperspectral imaging unit, including: at least one lens configured to direct light scattered by, reflected by, or transmitted through a target medium to at least one hyperspectral filter arrangement configured to separate the light into discrete spectral bands; an imaging sensor to: receive the discrete spectral bands from the at least one hyperspectral filter arrangement; detect light by a plurality of pixels for each of the spectral bands; and generate electrical signals based at least in part on at least a portion of the light; and at least one image processor in communication with the at least one imaging sensor and configured to generate hyperspectral image data associated with the target medium; and at least one processor configured to determine biological data based at least partially on at least a portion of the hyperspectral image data.

Abstract translation: 一种高光谱成像系统，包括：至少一个高光谱成像单元，包括：至少一个透镜，被配置为将由目标介质散射，反射或通过目标介质传播的光引导至至少一个超光谱滤光器装置，其被配置为将光分离成离散的 光谱带; 成像传感器，用于：从所述至少一个超光谱滤波器装置接收离散的光谱带; 通过用于每个频谱带的多个像素来检测光; 并且至少部分地基于至少一部分光产生电信号; 以及至少一个与所述至少一个成像传感器通信的图像处理器，并被配置为生成与所述目标介质相关联的高光谱图像数据; 以及至少一个处理器，被配置为至少部分地基于所述高光谱图像数据的至少一部分来确定生物数据。

公开(公告)号：US08912497B2

公开(公告)日：2014-12-16

申请号：US14041145

申请日：2013-09-30

Applicant: Murata Manufacturing Co., Ltd.

Inventor： Takashi Kondo ,  Seiji Kamba

IPC: G01N21/01 ,  G01J3/02 ,  G01N21/35 ,  G01J3/42

CPC classification number: G01J3/0267 ,  G01J3/42 ,  G01N21/3586 ,  Y10T29/49

Abstract: A measurement structure including an aperture array structure made of a metal and having a plurality of aperture portions, and a support base supporting the aperture array structure. The measurement structure is used in a measuring method by applying an electromagnetic wave to the measurement structure on which a specimen is held, detecting frequency characteristics of the electromagnetic wave transmitted through the measurement structure or reflected by the measurement structure, and measuring characteristics of the specimen. At least a first part of a surface of the aperture array structure proximal to the support base is joined to the support base, and at least a second part of the surface of the aperture array structure defines at least part of the plurality of aperture portions, the second part of the surface being proximal to the support base and not in contact with the support base.

Abstract translation: 一种测量结构，包括由金属制成并具有多个开口部分的孔径阵列结构以及支撑孔径阵列结构的支撑基座。 测量结构用于测量方法中，通过对被测体的测量结构施加电磁波，检测通过测量结构透射的电磁波的频率特性或由测量结构反射的测量结构，以及测量样本的特性 。 至少靠近支撑基座的孔阵列结构的表面的第一部分接合到支撑基底，并且孔阵列结构的表面的至少第二部分限定多个孔部分的至少一部分， 表面的第二部分靠近支撑基座并且不与支撑基座接触。

公开(公告)号：US20140192351A1

公开(公告)日：2014-07-10

申请号：US13848240

申请日：2013-03-21

Applicant: TAIWAN POWER TESTING TECHNOLOGY CO., LTD.

Inventor： Yu-Chiang LIN

IPC: G01J1/42

CPC classification number: G01J1/42 ,  G01J1/04 ,  G01J1/4257 ,  G01J3/0202 ,  G01J3/0267 ,  G01J3/506 ,  G01J2001/4247

Abstract: Disclosed is an inspecting equipment for inspecting a light emission characteristic of a display screen includes: a carrying device provided for carrying the display screen, a cover device and a data analyzing device. The cover device has a detecting surface provided with a plurality of luminance detectors, and covers an emitting surface of the display screen to form a darkroom between the cover device and the detecting surface. A plurality of corresponding luminance information is generated by the luminance detectors provided for detecting a plurality of measuring zones of the emitting surface. The data analyzing device receives the luminance information and analyzes the light emission characteristic of the display screen according to the luminance information. And, it is thus able to rapidly inspect the light emission characteristic of the display screen during manufacture process, and is easy to be applied to a present producing line.

Abstract translation: 公开了一种用于检查显示屏的发光特性的检查设备，包括：用于承载显示屏的承载装置，盖装置和数据分析装置。 盖装置具有设置有多个亮度检测器的检测表面，并且覆盖显示屏的发射表面，以在盖装置和检测表面之间形成暗室。 由用于检测发射表面的多个测量区域的亮度检测器产生多个对应的亮度信息。 数据分析装置接收亮度信息，并根据亮度信息分析显示画面的发光特性。 而且，能够在制造过程中快速检查显示屏的发光特性，容易应用于现有的生产线。

公开(公告)号：US20140021353A1

公开(公告)日：2014-01-23

申请号：US14041145

申请日：2013-09-30

Applicant: MURATA MANUFACTURING CO., LTD.

Inventor： Takashi Kondo ,  Seiji Kamba

IPC: G01J3/02 ,  G01J3/42

CPC classification number: G01J3/0267 ,  G01J3/42 ,  G01N21/3586 ,  Y10T29/49

Abstract: A measurement structure including an aperture array structure made of a metal and having a plurality of aperture portions, and a support base supporting the aperture array structure. The measurement structure is used in a measuring method by applying an electromagnetic wave to the measurement structure on which a specimen is held, detecting frequency characteristics of the electromagnetic wave transmitted through the measurement structure or reflected by the measurement structure, and measuring characteristics of the specimen. At least a first part of a surface of the aperture array structure proximal to the support base is joined to the support base, and at least a second part of the surface of the aperture array structure defines at least part of the plurality of aperture portions, the second part of the surface being proximal to the support base and not in contact with the support base.

Abstract translation: 一种测量结构，包括由金属制成并具有多个开口部分的孔径阵列结构以及支撑孔径阵列结构的支撑基座。 测量结构用于测量方法中，通过对被测体的测量结构施加电磁波，检测通过测量结构透射的电磁波的频率特性或由测量结构反射的测量结构，以及测量样本的特性 。 至少靠近支撑基座的孔阵列结构的表面的第一部分接合到支撑基底，并且孔阵列结构的表面的至少第二部分限定多个孔部分的至少一部分， 表面的第二部分靠近支撑基座并且不与支撑基座接触。

公开(公告)号：US20130176563A1

公开(公告)日：2013-07-11

申请号：US13812801

申请日：2011-07-21

Applicant: Satoshi Ozawa ,  Takashi Anazawa ,  Rena Akahori ,  Satoshi Takahashi ,  Takeshi Ohura ,  Masashi Kiguchi

Inventor： Satoshi Ozawa ,  Takashi Anazawa ,  Rena Akahori ,  Satoshi Takahashi ,  Takeshi Ohura ,  Masashi Kiguchi

IPC: G01J3/02

CPC classification number: G01J3/0267 ,  B82Y5/00 ,  B82Y15/00 ,  C12Q1/6869 ,  G01N21/658 ,  G01N33/48721 ,  C12Q2565/631 ,  C12Q2565/632

Abstract: The present invention provides a device and method for analyzing the characteristics of a biopolymer with excellent mechanical stability, high spatial resolution and sensitivity using a simple device construction. Specifically, the Raman scattered light of a biopolymer is measured and the properties of monomer units forming the biopolymer are analyzed by using a biopolymer property analysis chip (100a) characterized by comprising: a solid substrate (110); at least one nanopore (120) disposed in the solid substrate (110); and one or more electrically conductive thin films (130a, 130b) disposed on the solid substrate (110). The biopolymer property analysis chip (100a) is characterized in that the electrically conductive thin films (130a, 130b) are disposed partially on the solid substrate (110) where the nanopore (120) is formed and a biopolymer which has penetrated into the nanopore (120) is caused to generate Raman scattered light by means of irradiation with external light.

Abstract translation: 本发明提供一种使用简单的装置结构分析具有优异机械稳定性，高空间分辨率和灵敏度的生物聚合物的特性的装置和方法。 具体地，测量生物聚合物的拉曼散射光，并通过使用生物聚合物性质分析芯片（100a）分析形成生物聚合物的单体单元的性质，其特征在于包括：固体基材（110）; 设置在所述固体基板（110）中的至少一个纳米孔（120）; 以及设置在固体基板（110）上的一个或多个导电薄膜（130a，130b）。 生物聚合物性质分析芯片（100a）的特征在于，导电薄膜（130a，130b）部分地设置在形成有纳米孔（120）的固体基板（110）上，并且已经渗透到纳米孔中的生物聚合物 120）通过外部光照射产生拉曼散射光。

公开(公告)号：US08462337B2

公开(公告)日：2013-06-11

申请号：US13141152

申请日：2009-09-08

Applicant: Motoyuki Watanabe ,  Kazuya Iguchi ,  Kengo Suzuki

Inventor： Motoyuki Watanabe ,  Kazuya Iguchi ,  Kengo Suzuki

IPC: G01J1/04 ,  G01J3/30

CPC classification number: G01N21/645 ,  G01J3/02 ,  G01J3/0262 ,  G01J3/0267 ,  G01J3/0291 ,  G01J3/4406 ,  G01J3/443 ,  G01N2201/0632 ,  G01N2201/065

Abstract: A spectroscopic measurement apparatus 1A comprises an integrating sphere 20 in which a sample S is located, a spectroscopic analyzer 30 dispersing the light to be measured from the sample S and obtaining a wavelength spectrum, and a data analyzer 50. The analyzer 50 includes an object range setting section which sets a first object range corresponding to excitation light and a second object range corresponding to light emission from the sample S in a wavelength spectrum, and a sample information analyzing section which determines a luminescence quantum yield of the sample S, determines a measurement value Φ0 of the luminescence quantum yield from results of a reference measurement and a sample measurement, and determines, by using factors β, γ regarding stray light in the reference measurement, an analysis value Φ of the luminescence quantum yield with the effect of stray light reduced by Φ=βΦ0+γ. This realizes a spectroscopic measurement apparatus, a measurement method, and a measurement program which can reduce the effect of stray light generated in a spectrometer.

Abstract translation: 分光测量装置1A包括其中位于样品S的积分球20，从样品S分散被测光并获得波长谱的光谱分析仪30和数据分析器50.分析器50包括物体 范围设定部，其设定与激发光对应的第一对象范围和与波长光谱中的来自样品S的发光对应的第二对象范围，以及确定样品S的发光量子产率的样本信息分析部， 通过参考测量和样品测量的结果测量发光量子产率的测量值Phi0，并且通过使用参考测量中关于杂散光的因子β，γ来确定具有杂散效应的发光量子产率的分析值Phi 光减少Phi = betaPhi0 +γ。 这实现了可以降低在光谱仪中产生的杂散光的影响的光谱测量装置，测量方法和测量程序。