Abstract:
In accordance with one specific embodiment of the present invention, the ion optics for use with an ion source have a plurality of electrically conductive grids that are mutually spaced apart and have mutually aligned respective pluralities of apertures through which ions may be accelerated and wherein each grid has an integral peripheral portion. A plurality of moment means are applied to a circumferentially distributed plurality of locations on the peripheral portion of each grid, which is initially flat, thereby establishing an annular segment of a cone as the approximate shape for that peripheral portion and a segment of a sphere as the approximate dished shape for the grid as a whole. The plurality of grids have conformal shapes in that the direction of deformation and the approximate spherical radii are the same. This elastic deformation during installation avoids any need for any permanent or inelastic deformation during fabrication, as well as controlling the excessive thermal displacements and accompanying performance changes to which flat grids are prone.
Abstract:
A Faraday system for measuring ion beam current in an ion implanter or other ion beam treatment system includes a Faraday cup body defining a chamber which has an entrance aperture for receiving an ion beam, a suppression electrode positioned in proximity to the entrance aperture to produce electric fields for inhibiting escape of electrons from the chamber, and a magnet assembly positioned to produce magnetic fields for inhibiting escape of electrons from the chamber. The chamber may have a relatively small ratio of chamber depth to entrance aperture width.
Abstract:
The invention refers to the field of electron beam lithography, in particular to a method for directing an electron beam (6) onto a target position (Z) on the surface of a substrate, the substrate first being placed onto a movable stage (2) and the stage (2) then being displaced stepwise, in the X and/or Y coordinates of a Cartesian grid, until the target position (Z) is located at a spacing from the impact point (P) of the undeflected electron beam (6) which is smaller than the smallest step distance of the stage displacement system, and then the electron beam (6) is directed onto the target position (Z) by deflection. This results in a considerable increase in positioning accuracy in electron beam lithography. Positioning accuracies on the order of 0.1 nm to 0.05 are achievable. The method is suitable in particular for writing grating patterns in which the spacing between the individual grating lines must be maintained with high accuracy.
Abstract:
The present invention is directed toward an apparatus and methods for detection and identification of target radionuclides and threatening radionuclides that may be present in a sample volume. One aspect of the invention discloses a digital computational apparatus that determines similarity or identity to a target radionuclide or a threatening radionuclide. In another aspect, the invention discloses a high throughput apparatus for detection of a target radionuclide in a sample volume, or for identifying a target radionuclide present in a sample volume, or both, that includes a detecting means, an analyzing means, and an identifying means. In a further aspect the invention discloses a high throughput apparatus for communicating the presence of a target radionuclide in a sample volume, the identity of a target radionuclide in a sample volume, or both to appropriate personnel. In yet another aspect, the invention provides a high throughput apparatus for warning of the presence and/or the identity of a threatening radionuclide in a sample volume to appropriate personnel. The invention furthermore provides methods for accomplishing the above-disclosed detection, identification, communication and warning.
Abstract:
An electron beam source comprises a source surface illuminated with a photon beam of adjustable intensity. The photon beam assists emission of electrons from the source surface due to a photo effect. An electric extraction field further assists in electron emission. Further, a heater is provided for further assisting in electron emission by a thermionic effect. An electron beam current is measured, and the intensity of the photon beam is adjusted based on the measured electron beam current.
Abstract:
A bismuth-213 generator comprising an insoluble composition having the general formula Zr(Phosponate)x(HPO4)2nullx.nH2O, wherein x is between 0 and 2; and n is the number of waters of hydration; and wherein cations of radioactive isotopes selected from radium, actinium and combinations thereof are immobilized on the composition. The value of x may be between about 0.2 and about 1. The phosphonate may be n-phosphonomethyl-miniodiacetic acid (PMIDA), wherein x may be between about 0.1 and about 1.9. The phosphonate may be one or more phosphonate having the formula: H2O3Pnull(CH2)a-Nnull((CH2)bCO2H)null((CH2)cCO2H), wherein a, b, and c are numbers from 1 to 3 that may or may not be equal. The value of x may also be between about 0.1 and 1.9.
Abstract translation:铋-213发生器,其包含具有通式Zr(Phosponate)x(HPO 4)2-x.nH 2 O的不溶性组合物,其中x在0和2之间; n是水合水的数量; 并且其中选自镭,锕及其组合的放射性同位素的阳离子固定在组合物上。 x的值可以在约0.2和约1之间。膦酸酯可以是正膦酰基甲基 - 次碘酸(PMIDA),其中x可以在约0.1和约1.9之间。 膦酸酯可以是一种或多种具有下式的膦酸酯:H 2 O 3 P - (CH 2)a N - ((CH 2)b CO 2 H) - ((CH 2)c CO 2 H),其中a,b和c是1至3的数,其可以或可以 不平等 x的值也可以在约0.1和1.9之间。
Abstract:
An electron beam system is based on a plasma generator in a plasma ion source with an accelerator column. The electrons are extracted from a plasma cathode in a plasma ion source, e.g. a multicusp plasma ion source. The beam can be scanned in both the x and y directions, and the system can be operated with multiple beamlets. A compact focused ion or electron beam system has a plasma ion source and an all-electrostatic beam acceleration and focusing column. The ion source is a small chamber with the plasma produced by radio-frequency (RF) induction discharge. The RF antenna is wound outside the chamber and connected to an RF supply. Ions or electrons can be extracted from the source. A multi-beam system has several sources of different species and an electron beam source.
Abstract:
The present invention relates to an ionization source having a chamber for ionizing a sample. The ionization chamber has surfaces to reduce the overall interaction with reactive samples. The inner surface walls of the ionization chamber or the ionization chamber may be formed from an inert super alloy. For instance, Inconelnull 625, Inconelnull 601 or Hastelloynull) may comprise the ionization chamber or the surface walls of the ionization chamber. The invention also includes a method for reducing the interaction of a reactive analyte with an ion source.
Abstract:
A field-ionization source, comprising array of emitter electrodes (31) and counter electrodes (32) positioned at a distance from the base (P1) of the emitter electrodes. The emitter electrodes, ending in emitter tips (61), extend from their bases towards corresponding openings (62) of the counter electrodes and are adapted to be connected to a positive electric high voltage with respect to the counter electrodes. At the emitter tips (61), gas species provided from a source substance are field-ionized by means of the high voltage and ions thus produced are accelerated through the openings (61, 41). A distribution system (43, S2) is provided to distribute said source substance from a supply to the space (S1) around the emitter tips.
Abstract:
In accordance with the invention, the ion source of a time-of-flight mass spectrometer includes an electron gun having an electron source and at least one electrode for conditioning the flow of electrons, followed by at least one microchannel wafer for generating a pulsed secondary electron beam containing a greater number of electrons from a pulsed primary electron beam. The secondary electron beam enters a gas ionization area of an ion gun which produces a flow of ions which is then passed through the flight tube in order to be analyzed by an ion detector. This provides a high-performance ion source which is compact, sensitive and easy to integrate.