Abstract:
PROBLEM TO BE SOLVED: To enhance the operational speed of a semiconductor device by reducing a clock skew easily and by raising the frequency of a clock signal without causing the increase in power consumption. SOLUTION: Two or more functional blocks are formed on an SOI wafer 101. Two or more functional blocks have a photodiode (PD) 102, respectively. All of the two or more functional blocks are covered with a light guiding plate 107. From a light signal generator 108, the light signal is generated corresponding to a clock signal. This light signal enters into the light guiding plate 107. This light signal enters into the PD 102 of the two or more functional blocks via the light guiding plate 107. A light signal is changed into an electrical signal by the PD 102 so as to acquire a clock signal in the two or more functional blocks, respectively. Only the light signal of a predetermined wave length can be entered selectively into the PD 102 of each functional block by arranging a wavelength demultiplexing filter 105 corresponding to the PD 102. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To supply completely synchronized clock signals to a plurality of points. SOLUTION: A light signal in a sinusoidal waveform having a frequency corresponding to a clock signal is supplied from a light signal generating unit 106 to one end of the core 104 of an optical waveguide. The core 104 passes a point of each functional block fabricated on a SOI wafer 101. A mirror 107 is disposed on the other end of the core 104. A traveling wave component and a reflected wave component are present in the core 104 to produce a stationary wave in the core 104. At each position corresponding to an amplitude peak of the stationary wave, the level of the light signal synchronously changes with others in a sine waveform having a frequency corresponding to the clock signal. A PD (photodiode) 102 of the respective functional block is formed at the position corresponding to the amplitude peak of the stationary wave. Thus, a completely synchronized clock signal can be obtained through the PD 102 in each functional block. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide an optical waveguide device having little loss of optical coupling, its fabrication method and an optical information processing apparatus. SOLUTION: In the optical waveguide device 1, a first semiconductor layer 2, an insulation layer 3 and a second semiconductor layer 4 are laminated in order and an optical waveguide layer 5 is formed on the first semiconductor layer 2. Therein, at least the thickness of the optical waveguide layer 5 on the light incident side edge part 6 is larger than that on the light emission side edge part 7. The optical information processing apparatus 8 comprises the optical waveguide device 1, a light incident means 9 which makes light incident to the optical waveguide layer 5 of the optical waveguide device 1 and a light receiving means 10 which receives emission light from the optical waveguide layer 5. In the fabrication method of the optical waveguide device 1, the optical waveguide layer 5 having at least the thickness of the optical waveguide layer 5 on the light incident side edge part 6 larger than that on the light emission side edge part 7 is formed through a process of introducing an impurity element such as germanium to the first semiconductor layer 2. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide an optical waveguide device that can perform photodetection while efficiently propagating light inside an optical waveguide and that can be easily manufactured. SOLUTION: The optical waveguide device 23a is provided with an optical waveguide 21a such as an SiO 2 film for guiding light from a light incident section to a light emitting section, a light receiving part 2 such as a photo diode installed in contact with the outer face of this optical waveguide 21a, and a light reflection part 5 with a 45° mirror surface installed inside the optical waveguide 21a. A signal light 11, for which a vertical incident light beam 11 is guided after being reflected by a mirror 9, is converted 90° in the optical path by the light reflection part 5 and made incident to the light receiving part 2 for monitoring, while the remaining signal light is emitted from the optical waveguide 21a. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide an electrolytic polishing pad which enables positive and good polishing even in the case of combination of CMP and electrolytic polishing. SOLUTION: The electrolytic polishing pad 3 has a polishing surface on which a workpiece 1 is pressed and slid, and an electrode surface located on an electrode side opposite to the polishing surface, and carries out electrolytic polishing in an electrolytic solution 5 while the workpiece 1 is kept to be pressed and slid on the polishing surface. Herein the polishing surface is formed of a polyvinyl acetal material having continuous pores penetrating through the polishing surface and the electrode surface. Then a mean pore size of the continuous pores is set to a range of 50 to 150 μm, and a ratio of the pores is set to 80 % or more by volume. COPYRIGHT: (C)2004,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a process for forming a catalyst metallization layer by substitution plating without causing any pit in the copper grain boundary and without enlarging its pit when a barrier film for preventing the spread of copper is formed on the copper surface. SOLUTION: The process for fabricating a semiconductor device comprises a step for forming a barrier film 32 selectively on a second interconnect line 25 by electroless plating utilizing a catalyst metallization layer 31 after it is formed only on the second interconnect line 25 formed of copper or a copper alloy on a substrate 11 by substitution plating wherein substitution plating is carried out using a plating solution from which dissolved oxygen is removed, preferably a neutral (pH=7) plating solution or a basic (7
Abstract:
PROBLEM TO BE SOLVED: To provide a polishing method for realizing formation of groove wires of a semiconductor device with high reliability by suppressing aggregation of polishing abrasive grains, and preventing production of defects such as scratch in the case of applying chemical mechanical polishing to a body to be polished made of copper or a copper alloy. SOLUTION: The polishing method polishes the surface of the body 11 to be polished made of copper or a copper alloy. The polishing method employs chemical mechanical polishing slurry wherein grains positively charged in an acidic solution 25 are used for the polishing abrasive grains 21, the body 11 to be polished is used for an anode, and the surface is polished in a state of giving a positive potential to the surface of the body 11 to be polished. Or the polishing method employs chemical mechanical polishing slurry wherein grains negatively charged in an alkaline solution 25 are used for the polishing abrasive grains 21, the body 11 to be polished is used for a cathode, and the surface is polished in a state of giving a negative potential to the surface of the body 11 to be polished. COPYRIGHT: (C)2004,JPO
Abstract:
PROBLEM TO BE SOLVED: To improve precision of a subsequent lithography process and to form highly reliable multilayer wiring by uniforming film thickness of barrier films formed on wiring and making a surface step by the barrier films to be minimum. SOLUTION: In a semiconductor substrate, wiring 13 is formed on an insulating film 12 formed on a substrate 11 by using copper or copper alloy, and the barrier films 14 are formed by selectively performing non-electrolytic plating on a catalyst metal layer formed on wiring 13 by substitution plating. The device is provided with dummy patterns 21 which are arranged between wirings 13 and 13 so as to uniform wiring density and use copper or copper alloy, and the barrier films 14 obtained by performing non-electrolytic plating on the catalyst metal layer formed on the dummy patterns 21 by substitution plating. COPYRIGHT: (C)2004,JPO
Abstract:
PROBLEM TO BE SOLVED: To contrive the speed-up of a process by utilizing both of electricity and light as signal transmission means between electronic circuit elements. SOLUTION: The semiconductor device 1 is provided with an electronic circuit element 11 formed on a semiconductor base board 10, a light emitting device 12 as well as a photo detector 13, which are formed on the semiconductor base board 10, and a waveguide passage 14 formed on the semiconductor base board 10. Light, emitted from the light emitting device 12 based on an electric signal produced in the electronic circuit element 11, is transmitted to the photo detector 13 through the waveguide passage 14 to convert the light, received by the photo detector 13, into an electric signal. COPYRIGHT: (C)2003,JPO
Abstract:
PROBLEM TO BE SOLVED: To provide a polishing apparatus and method, which can easily flatten a rough surface of a film to be polished and can efficiently polish the film into a film having a flattened surface, while suppressing a damage to such a layer below the polished film as an interlayer insulating film. SOLUTION: At the time of polishing an object W having a film to be polished such as a wiring layer formed as embedded into a wiring groove made in an insulating film of a substrate, a processing solution EL is made to flow along at least a surfaced of the film to be polished nearly parallelly thereto (F) to polish and remove preferentially rough projections on the polishing film under influences of shearing stress of the processing solution and to flatten the polishing surface of the film. A cathode electrode member E is positioned as opposed to the polishing surface, the electrolyte EL containing a chelating agent between the polishing surface and the member E while a voltage is applied to the polishing film and the member E is made to flow in a manner mentioned above ( F) to polish and remove preferentially projections on the polishing film under influences of shearing stress of the electrolyte and to flatten the polishing surface of the film.