Abstract:
The present invention relates to a process of preparing a nanogap electrode and a nanogap device using the same, and a preparing process according to the present invention is characterized in that reduced metal is grown by reduction reaction from a metal ion in solution on the surface of a metal pattern with a predetermined shape. A method of preparing a nanogap electrode according to the present invention has an advantage that nanogap electrodes having a gap distance of 1-100 nm, which are difficult to prepare by a conventional method, can be easily prepared in a reproducible and uniform manner.
Abstract:
The present invention is related to a complex calibration test that can enhance the precision of the Brinell hardness tested value by simultaneously performing complex calibration of many factors and a method using such device. The present invention is comprised of a measurement unit including a force sensor, a length sensor, a measurement terminal, and a connection terminal; and a processing unit including a timer, a calibration part for converting each of the tested load, forced depth, time values, and a control part for computing the calibrated Brinell hardness. It is preferable that the above control part is further comprised of a separate memory.
Abstract:
According to the present invention, the most challenging issues in this work have been to find systematic ways of enabling maintenance engineers to decide an adequate time for the replacement of vacuum pumps on the basis of their current performance assessment result. Further, the comparison of the currently evaluated diagnostics analysis results and the initial (or reference) data set is shown to enable maintenance engineers to decide the replacement of the considered vacuum pump according to the evaluated pump performance indicators. This quantitative diagnostic analysis result is expected not only to enable maintenance engineers to decide an adequate time for the replacement of vacuum pumps on the basis of their current performance assessment results but also to improve the reliability and confidence of the predictive maintenance of low vacuum pumps.
Abstract:
A magnetic field measuring apparatus according to an example embodiment includes: an external container; an internal container storing a liquid refrigerant, disposed inside the external container, and including a neck portion having a first diameter and a body portion having a second diameter greater than the first diameter, wherein a space between the internal container and the external container is maintained in a vacuum state; a SQUID sensor module mounting plate disposed below the internal container; a plurality of SQUID sensor modules mounted below the SQUID sensor module mounting plate; and a 4K heat shielding portion formed of a conductive mesh disposed to surround the SQUID sensor module mounting plate and the plurality of SQUID sensor modules.
Abstract:
A dual-helmet magnetoencephalography measuring apparatus according to an example embodiment includes: an internal container storing a liquid refrigerant; an external container disposed to surround the internal container and including a first external helmet and a second external helmet disposed to be spaced apart from each other; a first sensor-mounted helmet disposed between the external container and the internal container to surround the first external helmet; a second sensor-mounted helmet disposed between the external container and the internal container to surround the second external helmet; a plurality of first SQUID sensor modules disposed on the first sensor-mounted helmet; and a plurality of second SQUID sensor modules disposed on the second sensor-mounted helmet. The internal container and the external container are tilted in a vertical direction.
Abstract:
An apparatus for measuring a neutron ambient dose equivalent includes: a thermal neutron detector; a first neutron moderator shell which encloses the thermal neutron detector; an epithermal neutron shielding material shell which encloses the first neutron moderator shell; a second neutron moderator shell which encloses an epithermal neutron shielding material shell; and an air layer which forms an open aperture along a circumference of the second neutron moderator shell, extends from the open aperture, penetrates through the epithermal neutron shielding material shell, and extends to an inside of the epithermal neutron shielding material shell.
Abstract:
Provided is a dual optical-comb femtosecond optical fiber laser that includes an optical fiber resonator maintained at a polarization state, a wavelength division multiplexing coupler (WDM coupler) mounted on the optical fiber resonator to provide pump light to the optical fiber resonator, a pump light source adapted to output the pump light, a gain medium doping optical fiber, mode-locking means mounted on the optical fiber resonator to induce mode-locking, an isolator mounted on the optical fiber resonator to make light traveling into the optical fiber resonator travel in one direction, and a birefringent element mounted on the optical fiber resonator to provide different refractive indices according to a polarization state of the light traveling into the optical fiber resonator.
Abstract:
The present invention relates to a polymer composite and its preparation method, and more particularly to a polymer composite comprising at least part of a region treated with at least either one of magnetic field and electrical field, and a method for preparing the polymer composite. The polymer composite to realize pressure response in accordance with one example of the present invention comprises: a non-conductive polymer; a first region being mixed with the non-conductive polymer and comprising a first conductive filler treated with at least either one of magnetic field and electrical field; and a second region being mixed with the non-conductive polymer and comprising a second conductive filler not treated with at least either one of magnetic field and electrical field.
Abstract:
Provided are a transparent substrate monitoring apparatus and a transparent substrate monitoring method. The transparent substrate monitoring apparatus includes a light emitting unit emitting light; a double slit disposed on a plane defined in a first direction and a second direction intersecting a propagation direction of incident light and includes a first slit and a second slit spaced apart from each other in the first direction to allow the light to pass therethrough; an optical detection unit measuring an intensity profile or position of an interference pattern formed on a screen plane; and a signal processing unit receiving a signal from the optical detection unit to calculate an optical phase difference or an optical path difference.
Abstract:
An object of the present invention is to provide an ultrathin wafer micro-machining method and apparatus by a laser rail-roading technique capable of minimizing deformation of a machining object by directly or indirectly irradiating two or more laser beams to an upper portion of an ultrathin wafer of a thin film laminated on a wafer, and cutting or patterning the machining object through a shock wave generated by laser itself.