中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

71 records (took 0.056 seconds)

    HYPERSPECTRAL IMAGING SYSTEMS AND METHODS FOR IMAGING A REMOTE OBJECT
    41.
    发明申请
    HYPERSPECTRAL IMAGING SYSTEMS AND METHODS FOR IMAGING A REMOTE OBJECT 审中-公开
    用于成像远程对象的高精度成像系统和方法

    公开(公告)号：WO2014143232A1

    公开(公告)日：2014-09-18

    申请号：PCT/US2013072811

    申请日：2013-12-03

    Applicant: CORNING INC ,  COMSTOCK LOVELL ELGIN II ,  WIGGINS RICHARD LYNTON ,  WOODARD KENNETH SMITH

    Inventor： COMSTOCK LOVELL ELGIN II ,  WIGGINS RICHARD LYNTON ,  WOODARD KENNETH SMITH

    IPC: G01J3/02 ,  G01J3/04 ,  G01J3/28

    CPC classification number: G01J3/2823 ,  G01J3/0208 ,  G01J3/0229 ,  G01J3/0256 ,  G01J3/04 ,  G01J3/2803 ,  G01J3/36 ,  G01J2003/042 ,  G01J2003/045 ,  G01J2003/2813 ,  G01J2003/2826 ,  H04N5/347 ,  H04N9/04

    Abstract: A hyperspectral imaging system (100b) and a method are disclosed herein for providing a hyperspectral image of an area of a remote object (e.g., scene of interest 104). In one aspect, the hyperspectral imaging system includes at least one optic (106), a rotatable disk (302) which has multiple straight slits (304) formed therein, a spectrometer (110), a two-dimensional image sensor (112), and a controller (114). In another aspect, the hyperspectral imaging system includes at least one optic, a rotatable disk (which has at least one spiral slit formed therein), a spectrometer, a two-dimensional image sensor, and a controller. In yet another aspect, the hyperspectral imaging system includes at least one optic, a rotatable drum (which has a plurality of slits formed on the outer surface thereof and a fold mirror located therein), a spectrometer, a two-dimensional image sensor, and a controller.

    Abstract translation: 本文公开了一种高光谱成像系统（100b）和方法，用于提供远程对象的区域（例如，感兴趣的场景104）的高光谱图像。 一方面，高光谱成像系统包括至少一个光学器件（106），具有形成在其中的多个直缝隙（304）的旋转盘（302），光谱仪（110），二维图像传感器（112） 和控制器（114）。 在另一方面，高光谱成像系统包括至少一个光学元件，可旋转盘（其中形成有至少一个螺旋形狭缝），光谱仪，二维图像传感器和控制器。 在另一方面，高光谱成像系统包括至少一个光学元件，可旋转鼓（其外表面上形成有多个狭缝和位于其中的折叠镜），光谱仪，二维图像传感器和 一个控制器

    Spectrometer and method of detecting an electromagnetic (EM) wave spectrum
    42.
    发明授权
    Spectrometer and method of detecting an electromagnetic (EM) wave spectrum 有权

    公开(公告)号：US12098950B2

    公开(公告)日：2024-09-24

    申请号：US17634451

    申请日：2020-08-11

    Applicant: National University of Singapore

    Inventor： Guangya James Zhou

    IPC: G01J3/02 ,  G01J3/04

    CPC classification number: G01J3/0272 ,  G01J3/0208 ,  G01J3/0216 ,  G01J3/0229 ,  G01J3/04 ,  G01J2003/045

    Abstract: A spectrometer for detecting an electromagnetic (EM) wave spectrum having one or more wavelength components within a spectral band of interest, and a method of detecting an electromagnetic (EM) wave spectrum having one or more wavelength components within a spectral band of interest. The method uses an entrance aperture; a dispersion and imaging optics containing at least one dispersion element; an exit aperture; a collection optics; and at least one single-pixel detector, each single-pixel detector sensitive to one or more of the wavelength components; and the method comprises the steps of spatially encoding at least one entrance slit of the entrance aperture along a direction substantially transverse to a direction of dispersion of the dispersion and imaging optics; creating, using the dispersion and imaging optics, dispersed images of the entrance aperture on a plane of the exit aperture, such that respective images at the different wavelength components are offset by different amounts of displacements along the direction of dispersion; spatially encoding a plurality of exit slits of the exit aperture along the direction substantially transverse to the direction of dispersion, wherein the exit aperture comprises a plurality of exit slits arranged in the direction of dispersion; gathering, using the collection optics, a total EM wave energy that enters the entrance aperture and exits the exit aperture to one of the at least one single-pixel detectors; changing at least one of an encoding pattern of the at least one entrance slits and an encoding pattern of the plurality of exit slits for a number of times; and measuring the output of the at least one detector for respective ones of the number of times for reconstructing the EM wave spectrum.

    ICP EMISSION SPECTROPHOTOMETER
    43.
    发明申请
    ICP EMISSION SPECTROPHOTOMETER 审中-公开

    公开(公告)号：US20180275069A1

    公开(公告)日：2018-09-27

    申请号：US15926097

    申请日：2018-03-20

    Applicant: Hitachi High-Tech Science Corporation

    Inventor： Yutaka Ikku

    IPC: G01N21/73 ,  G01J3/18 ,  G01J3/28 ,  G01J3/443

    CPC classification number: G01N21/73 ,  G01J3/0235 ,  G01J3/04 ,  G01J3/18 ,  G01J3/2823 ,  G01J3/443 ,  G01J2003/045 ,  G01N21/68

    Abstract: An ICP emission spectrophotometer includes an inductively coupled plasma device, a spectroscope, and a computer. The spectroscope includes an incidence window, an incidence side slit, a diffraction grating, an emission window, an emission side slit, and a detector. Measurement conditions including diffraction condition and a measurement result are displayed on a display device. In a case where there are a plurality of diffraction conditions each including a combination of a diffraction grating and a diffraction order for measuring desired diffracted light, comparison information including at least an intensity and a resolution of emitted light in the diffraction condition is displayed on the display device. A measurer selects diffraction conditions in which resolution is higher from among the diffraction conditions, and selects a diffraction condition in which an intensity is obtained from among the selected diffraction conditions.

    Hyperspectral imaging systems and methods for imaging a remote object
    46.
    发明授权
    Hyperspectral imaging systems and methods for imaging a remote object 有权
    用于成像远程物体的高光谱成像系统和方法

    公开(公告)号：US09200958B2

    公开(公告)日：2015-12-01

    申请号：US13798816

    申请日：2013-03-13

    Applicant: CORNING INCORPORATED

    Inventor： Lovell Elgin Comstock ,  Richard Lynton Wiggins ,  Kenneth Smith Woodard

    IPC: G01J3/28 ,  G01J3/04 ,  H04N9/04 ,  H04N5/347 ,  G01J3/02 ,  G01J3/36

    CPC classification number: G01J3/2823 ,  G01J3/0208 ,  G01J3/0229 ,  G01J3/0256 ,  G01J3/04 ,  G01J3/2803 ,  G01J3/36 ,  G01J2003/042 ,  G01J2003/045 ,  G01J2003/2813 ,  G01J2003/2826 ,  H04N5/347 ,  H04N9/04

    Abstract: A hyperspectral imaging system and a method are described herein for providing a hyperspectral image of an area of a remote object (e.g., scene of interest). In one aspect, the hyperspectral imaging system includes at least one optic, a rotatable disk (which has at least one spiral slit formed therein), a spectrometer, a two-dimensional image sensor, and a controller. In another aspect, the hyperspectral imaging system includes at least one optic, a rotatable disk (which has multiple straight slits formed therein), a spectrometer, a two-dimensional image sensor, and a controller. In yet another aspect, the hyperspectral imaging system includes at least one optic, a rotatable drum (which has a plurality of slits formed on the outer surface thereof and a fold mirror located therein), a spectrometer, a two-dimensional image sensor, and a controller.

    Abstract translation: 本文描述了一种高光谱成像系统和方法，用于提供远程对象区域（例如，感兴趣的场景）的高光谱图像。 一方面，高光谱成像系统包括至少一个光学元件，可旋转盘（其中形成有至少一个螺旋形狭缝），光谱仪，二维图像传感器和控制器。 在另一方面，高光谱成像系统包括至少一个光学元件，可旋转盘（其中形成有多个直缝），光谱仪，二维图像传感器和控制器。 在另一方面，高光谱成像系统包括至少一个光学元件，可旋转鼓（其外表面上形成有多个狭缝和位于其中的折叠镜），光谱仪，二维图像传感器和 一个控制器

    CONTROL APPARATUS AND CONTROL METHOD
    47.
    发明申请
    CONTROL APPARATUS AND CONTROL METHOD 有权
    控制装置和控制方法

    公开(公告)号：US20150144766A1

    公开(公告)日：2015-05-28

    申请号：US14468900

    申请日：2014-08-26

    Applicant: NEC Corporation

    Inventor： Hideya TOMITA

    IPC: G01J3/04

    CPC classification number: G01J3/04 ,  G01J3/18 ,  G01J2003/042 ,  G01J2003/045

    Abstract: A control apparatus includes a slit plate including a plurality of rectangular slits with different widths. The control apparatus also includes an acquisition unit which acquires an incident spectrum from the rectangular slit. The apparatus also includes a slit selecting unit which acquires a half value wavelength of the incident spectrum on the basis of the incident spectrum, and performs a selection of one of the plurality of rectangular slits on the basis of the half value wavelength.

    Abstract translation: 控制装置包括具有不同宽度的多个矩形狭缝的狭缝板。 控制装置还包括从矩形狭缝获取入射光谱的获取单元。 该设备还包括：狭缝选择单元，其基于入射光谱获取入射光谱的半值波长，并且基于半值波长执行多个矩形狭缝之一的选择。

    Integrated 3-channel gas detection and measurement spectrometer
    48.
    发明授权
    Integrated 3-channel gas detection and measurement spectrometer 有权
    集成3通道气体检测和测量光谱仪

    公开(公告)号：US08334975B1

    公开(公告)日：2012-12-18

    申请号：US13245199

    申请日：2011-09-26

    Applicant: Lacy G. Cook

    Inventor： Lacy G. Cook

    IPC: G01J3/28

    CPC classification number: G01J3/0294 ,  G01J2003/045 ,  G01J2003/047

    Abstract: A three-channel spectrometer including: a beamsplitter element that receives an incident radiation and transmits a first portion, a second portion, and a third portion of the incident radiation, a first slit that receives the first portion and transmits a first slit output radiation of a first wavelength range; a second slit that receives the second portion and transmits a second slit output radiation of a second wavelength range; a third slit that receives the third portion of the incident radiation and transmits a third slit output radiation of a third wavelength range; a common optical form that receives and collimates the first, second, and third slit output radiation; and a dispersive element that receives and reflects the collimated first, second, and third slit output radiation from the optical form.

    Abstract translation: 一种三通道光谱仪，包括：分束器元件，其接收入射辐射并透射入射辐射的第一部分，第二部分和第三部分;第一狭缝，其接收第一部分并透射第一狭缝输出辐射 第一波长范围; 接收第二部分并透射第二波长范围的第二狭缝输出辐射的第二狭缝; 第三狭缝，其接收入射辐射的第三部分并透射第三波长范围的第三狭缝输出辐射; 接收和准直第一，第二和第三狭缝输出辐射的公共光学形式; 以及从光学形式接收并反射准直的第一，第二和第三狭缝输出辐射的色散元件。

Patent Agency Ranking