Apparatus for automated real-time material identification
    43.
    发明申请
    Apparatus for automated real-time material identification 审中-公开
    自动实时材料识别装置

    公开(公告)号:US20060262304A1

    公开(公告)日:2006-11-23

    申请号:US11409857

    申请日:2006-04-24

    Applicant: Keith Carron

    Inventor: Keith Carron

    Abstract: An apparatus is described for the real-time identification of one or more selected components of a target material. In one embodiment, an infrared spectrometer and a separate Raman spectrometer are coupled to exchange respective spectral information of the target material preferably normalized and presented in a single graph. In an alternative embodiment, both an infrared spectrometer and a Raman spectrometer are included in a single instrument and a common infrared light source is used by both spectrometers. In another embodiment, a vibrational spectrometer and a stoichiometric spectrometer are combined in a single instrument and are coupled to exchange respective spectral information of the target material and to compare the spectral information against a library of spectra to generate a real-time signal if a selected component is present in the target material.

    Abstract translation: 描述了用于实时识别目标材料的一个或多个选定部件的装置。 在一个实施例中,红外光谱仪和单独的拉曼光谱仪被耦合以交换目标材料的各个光谱信息,优选地被归一化并呈现在单个图中。 在替代实施例中,红外光谱仪和拉曼光谱仪均包括在单个仪器中,并且两个光谱仪都使用通用的红外光源。 在另一个实施例中,将振动光谱仪和化学计量光谱仪组合在单个仪器中,并耦合以交换目标材料的相应光谱信息,并将光谱信息与光谱库进行比较以产生实时信号,如果选定 组分存在于目标材料中。

    Method and apparatus for spectrochemical analysis
    44.
    发明授权
    Method and apparatus for spectrochemical analysis 有权
    光谱化学分析的方法和装置

    公开(公告)号:US06813019B2

    公开(公告)日:2004-11-02

    申请号:US09958458

    申请日:2001-10-05

    Abstract: A method and apparatus for the spectrochemical analysis of a sample in which a solid state array detector (82) is used to detect radiation (62) of spectrochemical interest. The invention involves the use of a shutter (72) adjacent the entrance aperture (70) of a polychromator (74-80) to expose the detector (82) to the radiation (62) for varying lengths of time whereby for short duration exposure times charge accumulation in elements (i.e. pixels) of the detector (82) due to high intensity components of the radiation is limited and for longer exposure times charge accumulation in elements (pixels) of the detector (82) due to feeble intesity components of radiation (62) is increased. This ensures that each reading of the detector (82) includes at least one exposure in which the amount of charge accumulated at each wavelength of interest is neither too little or too great. The problems of feeble radiation components not being accurately measurable and of high intensity radiation components exceeding the charge carrying capacity of elements (pixels) of the detector (82) are thereby able to be avoided. An attenuator (90) may be placed between the radiation source (60) and the detector (82) to permit longer exposure times to be used for very high intensity radiation.

    Abstract translation: 用于对样品进行光谱化学分析的方法和装置,其中固态阵列检测器(82)用于检测分光光度的辐射(62)。 本发明涉及使用与多色调剂(74-80)的入口孔(70)相邻的快门(72)将检测器(82)暴露于辐射(62)以改变长度的时间,从而短时间曝光时间 由于辐射的高强度分量,检测器(82)的元件(即,像素)中的电荷累积受到限制,并且由于辐射的微弱的肥胖分量,对于更长的曝光时间来检测器(82)的元件(像素)中的电荷累积 62)增加。 这确保了检测器(82)的每次读取包括至少一次曝光,其中在每个感兴趣波长处累积的电荷量既不太小也不太大。 因此能够避免无法精确测量的微弱辐射成分和超过检测器(82)的元件(像素)的电荷承载能力的高强度辐射成分的问题。 衰减器(90)可以放置在辐射源(60)和检测器(82)之间,以允许更长的曝光时间用于非常高强度的辐射。

    High resolution non-scanning spectrometer
    45.
    发明授权
    High resolution non-scanning spectrometer 有权
    高分辨率非扫描光谱仪

    公开(公告)号:US06362879B1

    公开(公告)日:2002-03-26

    申请号:US09512939

    申请日:2000-02-25

    CPC classification number: G01J3/1809 G01J3/2803 G01J2003/2866

    Abstract: An optical spectrometer includes an echelle array disposed in the path of a light signal so as to diffract the incident light signal. The light signal falls within a predetermined wavelength band centered about a central wavelength. The echelle array has a plurality of diffraction scattering sites periodically spaced apart by a distance of at least about five times the central wavelength. The spectrometer further includes a photodetector array positioned to receive a far-field diffraction pattern produced by the diffracted light from the echelle array and to output electrical signals representing the spatial pattern and relative intensity of the far-field diffraction pattern. Additionally, the spectrometer includes a processing circuit coupled to the photodetector array for processing the electrical signals to determine the power spectrum of the light signal. The processor circuit calibrates by measuring far-field diffraction patterns and determining SIRs for light at a plurality of different known wavelengths. When the light signal is projected onto the echelle array, the processing circuit determines the power spectrum by deconvolving the SIRs obtained during calibration from the far-field diffraction pattern measured for the light signal.

    Abstract translation: 光谱仪包括设置在光信号的路径中的梯形阵列,以便衍射入射光信号。 光信号落在以中心波长为中心的预定波长带内。 台阶阵列具有周期性间隔开至少约五倍于中心波长的距离的多个衍射散射点。 光谱仪还包括光电检测器阵列,其定位成接收由来自电梯组阵列的衍射光产生的远场衍射图并输出表示远场衍射图案的空间图案和相对强度的电信号。 此外,光谱仪包括耦合到光电检测器阵列的处理电路,用于处理电信号以确定光信号的功率谱。 处理器电路通过测量远场衍射图案来校准,并且确定多个不同已知波长的光的SIR。 当光信号被投影到电视节目阵列上时,处理电路通过从对于光信号测量的远场衍射图案中去除在校准期间获得的SIR来确定功率谱。

    Optics system for emission spectrometer
    47.
    发明授权
    Optics system for emission spectrometer 失效
    发射光谱仪光学系统

    公开(公告)号:US4636074A

    公开(公告)日:1987-01-13

    申请号:US679080

    申请日:1984-12-06

    Abstract: An optical arrangement for use in spectrometry uses a masking device which eliminates unwanted spectral regions prior to optically resolving the unmasked information. The optical arrangement comprises an entrance slit to select incidence spectral energy from an energized source and a concave grating of relatively low dispersion to image the spectrum of the entrance slit onto a stationary mask which simultaneously selects spectral regions of the dispersed incident spectral energy. The selected spectral regions are collimated and recombined and directed onto an Echelle grating to disperse with high resolution the selected spectral regions. A concave mirror focuses the dispersed selected spectral regions into a focal plane of highly resolved spectral energy which can be detected to determine the spectral information coming from the source. The optical arrangement is particularly well suited for use with narrow spectral bandwidth spectral information distributed over a large spectral range. In spectroscopy, desired information very often occupies a tiny fraction of the total spectral information presented to a spectrometer. With this optical arrangement, spectral information can be selected from a much broader band spectral information and collected with high resolution on a small curvilinear portion of the output focal plane. The arrangement is particularly useful for absorption, light scattering or emission spectroscopy. It provides a stable mechanical design making it less sensitive to vibration. Manufacturing mechanical tolerances are also less restrictive.

    Abstract translation: 用于光谱测定的光学装置使用掩蔽装置,其在光学解析未屏蔽的信息之前消除不需要的光谱区域。 光学装置包括入射狭缝,用于选择来自通电源的入射光谱能量和相对低色散的凹形光栅,以将入射狭缝的光谱成像到固定掩模上,同时选择分散的入射光谱能量的光谱区域。 所选择的光谱区域被准直并重组并引导到Echelle光栅上,以高分辨率分散所选择的光谱区域。 凹面镜将分散的所选光谱区域聚焦成高分辨光谱能量的焦平面,其可被检测以确定来自光源的光谱信息。 光学布置特别适用于分布在大光谱范围上的窄光谱带宽光谱信息。 在光谱学中,所需的信息通常占据提供给光谱仪的总光谱信息的一小部分。 利用这种光学布置,可以从更广泛的频谱光谱信息中选择光谱信息,并且在输出焦平面的小曲线部分上以高分辨率收集光谱信息。 该装置对于吸收,光散射或发射光谱特别有用。 它提供了稳定的机械设计,使其对振动的敏感性降低。 制造机械公差的限制也较少。

    APPARATUS, METHOD AND SYSTEM FOR SPECTROMETRY WITH A DISPLACEABLE WAVEGUIDE STRUCTURE
    48.
    发明申请
    APPARATUS, METHOD AND SYSTEM FOR SPECTROMETRY WITH A DISPLACEABLE WAVEGUIDE STRUCTURE 审中-公开
    用于具有可摆放波导结构的光谱测量的装置,方法和系统

    公开(公告)号:WO2015199861A1

    公开(公告)日:2015-12-30

    申请号:PCT/US2015/032451

    申请日:2015-05-26

    Abstract: Techniques and mechanisms for a monolithic photonic integrated circuit (PIC) to provide spectrometry functionality. In an embodiment, the PIC comprises a photonic device, a first waveguide and a second waveguide, wherein one of the first waveguide and the second waveguide includes a released portion which is free to move relative to a substrate of the PIC. During a metering cycle to evaluate a material under test, control logic operates an actuator to successively configure a plurality of positions of the released portion relative to the photonic device. In another embodiment, light from the first waveguide is variously diffracted by a grating of the photonic device during the metering cycle, where portions of the light are directed into the second waveguide. Different wavelengths of light diffracted into the second waveguide may be successively detected, for different positions of the released portion, to determine spectrometric measurements over a range of wavelength.

    Abstract translation: 单片光子集成电路(PIC)提供光谱功能的技术和机制。 在一个实施例中,PIC包括光子器件,第一波导和第二波导,其中第一波导和第二波导中的一个包括相对于PIC的衬底自由移动的释放部分。 在用于评估被测材料的计量循环期间,控制逻辑操作致动器以相对于光子器件连续配置释放部分的多个位置。 在另一个实施例中,来自第一波导的光在计量周期期间由光子器件的光栅进行各种衍射,其中光的一部分被引导到第二波导中。 对于释放部分的不同位置,可以连续地检测衍射到第二波导中的不同波长的光,以确定波长范围上的光谱测量。

    SPEKTROMETERANORDNUNG
    50.
    发明申请
    SPEKTROMETERANORDNUNG 审中-公开
    谱仪安排

    公开(公告)号:WO2008155169A1

    公开(公告)日:2008-12-24

    申请号:PCT/EP2008/055755

    申请日:2008-05-09

    Abstract: Eine Spektrometer-Anordnung (10) mit einem Spektrometer zur Erzeugung eines Spektrums von Strahlung aus einer Strahlungsquelle auf einem Detektor (34), enthaltend eine abbildende, optische Littrow-Anordnung (18, 20) zur Abbildung der in die Spektrometer-Anordnung eintretenden Strahlung (16) in eine Bildebene, eine erste Dispersionsanordnung (28, 30) zur spektralen Zerlegung eines ersten Wellenlängenbereichs der in die Spektrometer-Anordnung eintretenden Strahlung, eine zweite Dispersionsanordnung (58, 60) zur spektralen Zerlegung eines zweiten Wellenlängenbereichs der in die Spektrometer-Anordnung eintretenden Strahlung, und einen gemeinsamen in der Bildebene der abbildenden Optik angeordneten Detektor (34), ist dadurch gekennzeichnet, dass die abbildende optische Anordnung (18, 20) ein zwischen zwei Stellungen (20, 50) bewegliches Element (20) umfasst, wobei die in die Spektrometer-Anordnung eintretende Strahlung in der ersten Stellung über die erste Dispersionsanordnung und in der zweiten Stellung über die zweite Dispersionsanordnung geleitet wird.

    Abstract translation: 光谱仪组件(10)配有光谱分析仪,以产生来自辐射源的辐射的光谱包含的成像光学利特罗-装置(18,20)(用于空气的成像检测器(34)进入该光谱仪装置上的辐射 中图像平面传入16),第一分散装置(28,30),用于第一波长范围内进入光谱仪装置的辐射,第二分散装置(58,60),用于在第二波长范围中的光谱仪装置的频谱分解的空气的频谱分解 辐射,和一个共同布置在成像光学检测器(34)的像面,其特征在于所述成像光学装置(18,20)包括两个位置(20,50)可动元件(20)之间,在所述 经由所述第一分散液中的光谱仪装置入射的辐射在所述第一位置中的布置和 经由第二分散装置第二位置被路由。

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